Non-reflective silicon wafer

Non-reflective silicon wafer, Total:80 items.

The international standard classification for "Non-reflective silicon wafer" includes: Semiconducting materials , Testing of metals , Chemical analysis .

The Chinese standard classification for "Non-reflective silicon wafer" includes: Metallographic testing method , Semimetal and semiconductor material in general , Metal physical property test method , Semimetal and semiconductor material analysis method , Basic standards and general methods .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 24578-2015 Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
GB/T 17169-1997 Test method for the surface quality of polished silicon wafers and epitaxial wafers by optical-reflection
GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
GB/T 42905-2023 Test method for thickness of silicon carbide epitaxial layer―Infrared reflectance method
GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40279-2021 Test method for thickness of films on silicon wafer surface—Optical reflection method
GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Group Standards of the People's Republic of China

T/SAS 0009-2020 lightweight silicon carbide mirror blanks
T/SAS 0008-2020 lightweight silicon carbide mirror

未注明发布机构

ASTM RR-E12-2000 2020 E0810-Test Method for Coefficient of Retroreflection of Retroreflective Sheeting Utilizing the Coplanar Geometry
ASTM RR-F01-1012 1996 F1526-Standard Test Method for Measuring Surface Metal Contamination on Silicon Wafers by Total Reflection X-Ray Fluorescence Spectroscopy

Professional Standard - Aviation

HB 7042-1994 Fire Protection Requirements for Design of Radiofrequency Anechoic Enclosure
HB 7043-1994 Fire Safty Management Outline for Radiofrequency Anechoic Enclosure

Military Standard of the People's Republic of China-General Armament Department

GJB 8495-2015 Specification for silicone modified alkyd heat reflective ship hull paint

Defense Logistics Agency

DLA SMD-5962-96653 REV D-2010 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX INVERTER, MONOLITHIC SILICON
DLA SMD-5962-95631 REV F-2007 MICROCIRCUIT, LINEAR, RADIATION HARDENED, QUAD DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON
DLA SMD-5962-95635 REV D-1999 MICROCIRCUIT, DIGITAL, 16-BIT MICROCONTROLLER, RADIATION HARDENED, MONOLITHIC SILICON
DLA SMD-5962-01521 REV A-2001 MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, 9 AMP NON-INVERTING MOSFET DRIVER, MONOLITHIC SILICON
DLA SMD-5962-08230 REV A-2009 MICROCIRCUIT, DIGITAL-LINEAR, BiCMOS, RADIATION HARDENED, NON-INVERTING QUAD DRIVER, MONOLITHIC SILICON
DLA SMD-5962-94771 REV B-2002 MICROCIRCUIT, LINEAR, 8-BIT FLASH A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-96517 REV E-2010 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, HEX INVERTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA MIL-M-38510/5 D VALID NOTICE 1-2009 Microcircuits, Digital, TTL, and-or-Invert Gates, Monolithic Silicon
DLA SMD-5962-97521 REV A-2002 MICROCIRCUIT, LINEAR, CURRENT FEEDBACK AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-97521 REV B-2011 MICROCIRCUIT, LINEAR, CURRENT FEEDBACK AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-90818 REV B-2010 MICROCIRCUIT, LINEAR, CURRENT FEED BACK AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-02545-2003 MICROCIRCUIT, LINEAR, RADIATION HARDENED, DUAL, WIDEBAND, LOW NOISE, VOLTAGE FEEDBACK OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-89620 REV E-2011 MICROCIRCUIT, LINEAR, CURRENT FEEDBACK AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-89441 REV C-2002 MICROCIRCUIT, LINEAR, ISOLATED FEEDBACK GENERATOR, MONOLITHIC SILICON
DLA SMD-5962-97605 REV B-2009 MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, HEX INVERTER, MONOLITHIC SILICON
DLA SMD-5962-96767 REV C-2005 MICROCIRCUIT, LINEAR, RADIATION HARDENED, HIGH SPEED, LOW POWER, CURRENT FEEDBACK AMPLIFIER WITH PROGRAMMABLE OUTPUT LIMITING, MONOLITHIC SILICON
DLA SMD-5962-96830 REV C-2004 MICROCIRCUIT, LINEAR, RADIATION HARDENED, LOW POWER, CURRENT FEEDBACK VIDEO OPERATIONAL AMPLIFIER WITH OUTPUT DISABLE, MONOLITHIC SILICON
DLA SMD-5962-89620 REV D-2005 MICROCIRCUIT, LINEAR, CURRENT FEEDBACK AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-91513 REV A-2009 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, AND-OR-INVERT GATES, MONOLITHIC SILICON
DLA DSCC-VID-V62/04653 REV A-2012 MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, HEX INVERTER, MONOLITHIC SILICON
DLA SMD-5962-95597 REV E-2010 MICROCIRCUIT, LINEAR, VOLTAGE FEEDBACK CLAMP AMPLIFIER, MONOLITHIC SILICON
DLA DSCC-VID-V62/07619-2013 MICROCIRCUIT, LINEAR, HEX INVERTERS, MONOLITHIC IC SILICON
DLA SMD-5962-96803 REV A-2009 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, HEX INVERTER, MONOLITHIC SILICON
DLA SMD-5962-94685 REV A-2009 MICROCIRCUIT, LINEAR, HIGH SPEED, CURRENT FEEDBACK AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-06256 REV B-2012 MICROCIRCUIT, LINEAR, 1.4 GHz, CURRENT FEEDBACK AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-96533 REV D-2013 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 4-WIDE 2-INPUT AND-OR-INVERT GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-95597 REV D-2003 MICROCIRCUIT, LINEAR, VOLTAGE FEEDBACK CLAMP AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-94667-1995 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, 1750 CHIP SET, MULTICHIP MICROCIRCUIT, SILICON
DLA SMD-5962-96803 REV B-2011 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, HEX INVERTER, MONOLITHIC SILICON

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 BLATT 6-2017 Roentgenoptische Systeme - Reflexionszonenplatten
VDI/VDE 5575 Blatt 6-2009 Roentgenoptische Systeme - Reflexionszonenplatten
VDI/VDE 5575 BLATT 6-2018 X-ray optical systems - Reflexion zone plates

Korean Agency for Technology and Standards (KATS)

KS D ISO 14706-2003(2018) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
KS D ISO 14706:2003 Surface chemical analysis－Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
KS T 3507-2019 Standard specification for retroreflective sheeting for traffic control & industrial safety
KS M ISO 6051-2003 Photography -- Processed reflection prints -- Storage practices

SCC

VDI/VDE 5575 BLATT 6:2018 X-ray optical systems — reflection zone plates
SPC GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots -- Non-contact measurement of photoconductivity decay by microwave reflectance method (TEXT OF DOCUMENT IS IN CHINESE)
MIL MIL-M-38510/40B-2005 MICROCIRCUITS, DIGITAL, TTL, HIGH SPEED, AND-OR- INVERT GATES, MONOLITHIC SILICON
MIL MIL-C-1193A-1992 COMPASSES, SHIP, NAVY, NO. 1, MAGNETIC (REFLECTOR TYPE, 7-1/2 INCH CARD) AND BINNACLE, REFLECTOR TYPE (SUPERSEDING MIL-C-1193) (NO S/S DOCUMENT)
DANSK DS/EN 17190:2018 Flexible sheets for waterproofing – Solar Reflectance Index
NS-EN 17190:2018 Flexible sheets for waterproofing — Solar Reflectance Index

KR-KS

KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer

American Society for Testing and Materials (ASTM)

ASTM E883-02 Standard Guide for Reflected-Light Photomicrography

HU-MSZT

MNOSZ 21405-1955 Impurity-free, reflective glass

Indonesia Standards

SNI 13-4708-1998 Reflectance measurement of ore minerals on polished slices in quantitative manner

International Organization for Standardization (ISO)

ISO 14706:2014 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Japanese Industrial Standards Committee (JISC)

JIS K 0148:2005 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

British Standards Institution (BSI)

BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
PD ISO/TS 20791-3:2023 Photography. Photographic reflection prints. Evaluation of glossiness
BS EN 17190:2018 Flexible sheets for waterproofing. Solar Reflectance Index

Society of Automotive Engineers (SAE)

SAE J594-1994 REFLEX REFLECTORS
SAE J594-1989 REFLEX REFLECTORS
SAE J594D-1967 REFLEX REFLECTORS
SAE J594C-1965 REFLEX REFLECTORS
SAE J594E-1970 REFLEX REFLECTORS

U.S. Military Regulations and Norms

ARMY MIL-M-46379 A-1968 MOUNT SIGHT, INFINITY REFLEX: 10511780 AND 10553489

GSO

GSO ISO 14706:2013 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

CZ-CSN

CSN 05 1155-1980 Determination of weld defects on radiographs by defectometer

ES-UNE

UNE-EN 17190:2020 Flexible sheets for waterproofing - Solar Reflectance Index

German Institute for Standardization

DIN EN 17190:2018-12 Flexible sheets for waterproofing - Solar Reflectance Index; German version EN 17190:2018

Aerospace Industries Association

AIA NAS 3450-1983 Uncased Devices (Silicon Monolithic) (Rev. 2)

Others: Non-reflective silicon wafer,Total Reflection X-ray Fluorescence Spectroscopic Test Method for Metal Contamination on Silicon Wafer Surface