Optical Raymeter
Optical Raymeter, Total:185 items.
The international standard classification for "Optical Raymeter" includes: Other standards related to optics and optical measurements , Radiation protection , IT applications in science , Chemical analysis , Optical equipment , Cement. Gypsum. Lime. Mortar , Non-destructive testing , Occupational safety. Industrial hygiene .
The Chinese standard classification for "Optical Raymeter" includes: Electron optics and other physical optics instrument , Radiological sanitation protection , Computer application , Basic standards and general methods , Optical instrument in general , Cement , Optical Measurement , X ray, magnetic powder, fluorescent light and other defectoscope .
Professional Standard - Machinery
- JB/T 11144-2011 X-ray diffractometer
- JB/T 11145-2011 X-ray fluorescence spectrometer
Professional Standard - Nuclear Industry
- EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
- EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
- GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 12085.9-1989 Optics and optical instruments--Environmental test methods--Solar radiation
- GB/T 12085.9-2010 Optics and optical instruments—Environmental test methods—Part 9:Solar radiation
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
未注明发布机构
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- DIN EN ISO 13696 E:2021-05 Test methods for radiation scattering by optical elements using optical components in optics and optical instruments (draft)
Professional Standard - Building Materials
- JC/T 1085-2008 X-ray fluorescence analyzer for cement
National Metrological Verification Regulations of the People's Republic of China
- JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers
- JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
Professional Standard - Geology
- DZ 0029-1992 HYX-3 microcomputer X-ray fluorescence instrument
国家能源局
- SY/T 7324-2016 X-ray fluorescence logging instrument calibration method
Professional Standard - Military and Civilian Products
- WJ 2335-1995 Multi-thread thread guide mold for optical instruments
Group Standards of the People's Republic of China
- T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
National Metrological Technical Specifications of the People's Republic of China
- JJF 1306-2011 Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments
- JJF 1952-2021 Calibration Specification for Sulfur X-ray Fluorescence Spectrometry Analyzers
- JJF 2024-2023 Calibration Specification for Energy Dispersive X-Ray Fluorescence Spectrometers
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
- GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
工业和信息化部/国家能源局
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
Professional Standard - Agriculture
- JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 Blatt 8-2011 Roentgenoptische Systeme - Monochromatorkristalle
- VDI/VDE 5575 BLATT 8-2018 Roentgenoptische Systeme - Monochromatorkristalle
- VDI/VDE 5575 BLATT 8-2019 Roentgenoptische Systeme - Monochromatorkristalle
- VDI/VDE 5575 Blatt 7-2007 X-Ray optical systems - Refractive X-ray optics - Definition of parameters
- VDI/VDE 5575 BLATT 9-2019 Roentgenoptische Systeme - Roentgenfilter
- VDI/VDE 5575 BLATT 9-2018 Roentgenoptische Systeme - Roentgenfilter
- VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter
- VDI/VDE 5575 BLATT 7-2018 Roentgenoptische Systeme - Refraktive Roentgenlinsen
- VDI/VDE 5575 Blatt 3-2009 X-Ray optical systems - Cappilary x-ray optics
- VDI/VDE 5575 Blatt 6-2009 Roentgenoptische Systeme - Reflexionszonenplatten
- VDI/VDE 5575 BLATT 6-2017 Roentgenoptische Systeme - Reflexionszonenplatten
- VDI/VDE 5575 BLATT 5-2018 X-ray optical systems - Transmission zone plates
- VDI/VDE 5575 Blatt 5-2009 X-Ray optical systems - Transmission zone plates
- VDI/VDE 5575 BLATT 6-2018 X-ray optical systems - Reflexion zone plates
- VDI/VDE 5575 BLATT 3-2019 Roentgenoptische Systeme - Roentgenkapillaren
- VDI/VDE 5575 Blatt 1-2007 X-Ray optical systems - Terms and definition
- VDI/VDE 5575 BLATT 1-2018 X-ray optical systems - Terms and definitions
- VDI/VDE 5575 BLATT 5-2017 Roentgenoptische Systeme - Transmissionszonenplatten
- VDI/VDE 5575 Blatt 2-2013 X-ray optical systems - Measurement methods - Measurement set-up and methods for the evaluation of X-ray optical systems
Association Francaise de Normalisation
- NF S10-133:2005 Optics and optical instruments - Diffractive optics - Vocabulary.
- NF S10-115*NF EN ISO 13696:2003 Optics and optical instruments - Test methods for radiation scattered by optical components
- NF S11-687:1997 Optics and optical instruments. Contact lenses. Determination of the spectral and luminous transmittance.
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
- NF S86-305:2014 Horology - Radioluminescent time measuring instruments
- NF S86-305:1996 Horology. Radioluminescent time measuring instruments.
- NF S10-049:2003 Optics and optical instruments - Measurement of reflectance of plane surfaces and transmittance of plane parallel elements.
Korean Agency for Technology and Standards (KATS)
- KS B ISO 13696-2006(2016) Optics and optical instruments-Test methods for radiation scattered by optical components
- KS B ISO 13696-2021 Optics and optical instruments-Test methods for radiation scattered by optical components
- KS B ISO 13696-2006(2021) Optics and optical instruments-Test methods for radiation scattered by optical components
- KS B ISO 13696:2006 Optics and optical instruments-Test methods for radiation scattered by optical components
- KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
- KS B ISO 8599:2004 Optics and optical instruments-Contact lenses-Determination of the spectral and luminous transmittance
- KS B ISO 8599:2014 Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance
- KS B ISO 8599-2019 Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance
- KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS B ISO 15368-2021 Optics and optical instruments — Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- KS D ISO 15470:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS B ISO 15368-2006(2016) Optics and optical instruments — Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- KS B ISO 9022-9:2017 Optics and optical instruments-Environmental test methods-Part 9:Solar radiation
- KS B ISO 9022-9:2002 Optics and optical instruments-Environmental test methods-Part 9:Solar radiation
- KS D ISO 14706-2003(2018) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
- KS B ISO 9022-9-2022 Optics and optical instruments-Environmental test methods-Part 9:Solar radiation
- KS B ISO 9022-9-2017(2022) Optics and optical instruments-Environmental test methods-Part 9:Solar radiation
- KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS B ISO 15368:2006 Optics and optical instruments-Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- KS B ISO 9849:2002 Optics and optical instruments-Geodetic instruments-Vocabulary
- KS B ISO 15368-2006(2021) Optics and optical instruments — Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- KS B ISO 10110-17:2006 Optics and photonics-Preparation of drawings for optical elements and systems-Part 17:Laser irradiation damage threshold
- KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61452-2017(2022) Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
- KS B ISO 11381:2003 Optics and optical instruments-Ophthalmic optics-Screw threads
British Standards Institution (BSI)
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS EN ISO 13696:2002 Optics and optical instruments. Test methods for radiation scattered by optical components
- BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 9022-9:1994 Optics and optical instruments - Environmental test methods - Solar radiation
- BS ISO 9022-9:1995 Optics and optical instruments - Environmental test methods - Solar radiation
- BS EN ISO 8599:1997 Optics and optical instruments — Contact lenses — Determination ofthe spectral and luminous transmittance
- BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- BS ISO 10110-17:2004 Optics and optical instruments - Preparation of drawings for optical elements and systems - Laser irradiation damage threshold
- BS ISO 21395-2:2022 Optics and photonics. Test method for refractive index of optical glasses - V-block refractometer method
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
- BS ISO 15368:2001 Optics and optical instruments - Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- BS EN ISO 9914:1997 Optics and optical instruments — Contact lenses — Determination of refractive index of contact lens materials
- BS ISO 9211-2:1995 Optics and optical instruments - Optical coatings - Optical properties
- BS EN ISO 8598-1:2014 Optics and optical instruments. Focimeters. General purpose instruments
- BS EN ISO 11380:1997 Optics and optical instruments - Ophthalmic optics - Formers
SCC
- DANSK DS/EN ISO 13696:2002 Optics and optical instruments – Test methods for radiation scattered by optical components
- NS-EN ISO 15902:2005 Optics and optical instruments — Diffractive optics — Vocabulary (ISO 15902:2004)
- NS-EN ISO 13696:2002 Optics and optical instruments — Test methods for radiation scattered by optical components (ISO 13696:2002)
- VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
- VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
- 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- VDI/VDE 5575 BLATT 6:2018 X-ray optical systems — reflection zone plates
- VDI/VDE 5575 BLATT 5:2018 X-ray optical systems — transmission zone plates
- NS-EN ISO 8599:1996 Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance (ISO 8599:1994)
- UNE-EN ISO 8599:1997 OPTICS AND OPTICAL INSTRUMENTS. CONTACT LENSES. DETERMINATION OF THE SPECTRAL AND LUMINOUS TRANSMITTANCE. (ISO 8599:1994).
- VDI/VDE 5575 BLATT 1:2018 X-ray optical systems — terms
- BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
- ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
- BS ISO 14490-5:2005+A1:2015 Optics and optical instruments. Test methods for telescopic systems-Test methods for transmittance
- BS ISO 9211-2:1994 Optics and optical instruments. Optical coatings-Optical properties
- BS ISO 14490-5:2017 Optics and optical instruments. Test methods for telescopic systems-Test methods for transmittance
- 10/30156853 DC BS EN 62495. Nuclear instrumentation. Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
Danish Standards Foundation
- DS/EN ISO 13696:2002 Optics and optical instruments - Test methods for radiation scattered by optical components
International Organization for Standardization (ISO)
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 13696:2002 Optics and optical Instruments - Test methods for radiation scattered by optical components
- ISO 8599:1994 Optics and optical instruments - Contact lenses - Determination of the spectral and luminous transmittance
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO/CD 17123-6:2023 Optics and optical instruments
- ISO 15368:2021 Optics and optical instruments — Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- ISO 9022-9:1994 Optics and optical instruments - Environmental test methods - Part 9: Solar radiation
- ISO 15368:2001 Optics and optical instruments - Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- ISO 10110-17:2004 Optics and photonics - Preparation of drawings for optical elements and systems - Part 17: Laser irradiation damage threshold
- ISO 9914:1995 Optics and optical instruments - Contact lenses - Determination of refractive index of contact lens materials
- ISO 10110-13:1997 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 13: Laser irradiation damage threshold
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
Lithuanian Standards Office
- LST EN ISO 15902:2005 Optics and optical instruments - Diffractive optics - Vocabulary (ISO 15902:2004)
European Committee for Standardization (CEN)
- EN ISO 13696:2022 Optics and photonics - Test method for total scattering by optical components (ISO 13696:2022)
- EN ISO 8599:1996 Optics and Optical Instruments - Contact Lenses - Determination of the Spectral and Luminous Transmittance ISO 8599 : 1994
- EN ISO 13696:2002 Optics and Optical Instruments - Test Methods for Radiation Scattered by Optical Components ISO 13696: 2002; Corrected 2002-09-25
- EN ISO 9914:1996 Optics and Optical Instruments - Contact Lenses - Determination of Refractive Index of Contact Lens Materials ISO 9914 : 1995
AENOR
- UNE-EN ISO 13696:2003 Optics and optical instruments - Test methods for radiation scattered by optical components (ISO 13696:2002)
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings
- VDI/VDE 5575 Blatt 7-2011 X-Ray optical systems - Refractive X-ray lenses
- VDI/VDE 5575 Blatt 9-2012 X-ray optical systems - X-ray filters
- VDI/VDE 5575 Blatt 6-2011 X-ray optical systems - Reflection zone plates
- VDI/VDE 5575 Blatt 3-2011 X-ray optical systems - Capillary X-ray lenses
- VDI/VDE 5575 Blatt 5-2011 X-ray optical systems - Transmission zone plates
- VDI/VDE 5575 Blatt 4-2011 X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 Blatt 1-2009 X-ray optical systems - Terms and definitions
- VDI/VDE 5575 Blatt 2-2015 X-ray optical systems - Measurement methods - Measurement set-up and methods for the evaluation of X-ray optical systems
RO-ASRO
- STAS 12814-1990 ALUMINIUM AND ALUMINIUM ALLOYS Analysis by optical emission spectro- metry
German Institute for Standardization
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 9022-9:2000 Optics and optical instruments - Environmental test methods - Part 9: Solar radiation (ISO 9022-9:1994)
- DIN EN ISO 13696:2002 Optics and optical instruments - Test methods for radiation scattered by optical components (ISO 13696:2002); German version EN ISO 13696:2002
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
RU-GOST R
- GOST R 50606-1993 Optics and optical instruments. Dioptrimeters
- GOST 3178-1975 Optical bench instruments. Height of arrangement of optical axis and exit pupil
- GOST 22091.6-1984 X-ray devices. Methods of measuring X-radiation exposure dose power and X-radiation exposure dose per pulse
- GOST 14828-1969 Instruments for physical-chemical quantities measurement. Radiospectrometers. Terms
- GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
- GOST 29025-1991 Non-destructive testing. X-ray television flaw detectors with X-ray electronic optical transducers electric radiographic flaw detectors. General technical requirements
GSO
- BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- GSO ISO 15368:2015 Optics and optical instruments -- Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- OS GSO ISO 15368:2015 Optics and optical instruments -- Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
- BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
Japanese Industrial Standards Committee (JISC)
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
American National Standards Institute (ANSI)
- ANSI/TAPPI T1217 sp-2012 Photometric linearity of optical properties instruments
SE-SIS
- SIS SS IEC 580:1986 X-ray equipment - Area exposure product meter
Standard Association of Australia (SAA)
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
KR-KS
- KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
- KS B ISO 9022-9-2017 Optics and optical instruments-Environmental test methods-Part 9:Solar radiation
- KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
- KS B ISO 9358-2023 Optics and optical instruments — Veiling glare of image forming systems — Definitions and methods of measurement
BR-ABNT
- ABNT NBR ISO 8598:2011 Optics and optical instruments - Lensômetros
International Electrotechnical Commission (IEC)
- IEC 61452:1995 Nuclear instrumentation - Measurement of gamma-ray emission rates of radionuclides - Calibration and use of germanium spectrometers
IN-BIS
- IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer
Optical Carbon Meter,Optical Reactor,Optical contact instrument,Optical contact instrument,Optical experiment instrument,Optical Surface Meter,Optical Raymeter,Optical Analyzer,Ray Optics,Optical parameter meter,Optical parameter meter,Ray Optics,Optical Refractometer,optical rays,Instrument Optical,Optical Instruments,optics light bulb,Optical interface instrument,Optical table instrument,Optical Surface Meter