Mass Spectrometry Relative Sensitivity

Mass Spectrometry Relative Sensitivity, Total:33 items.

The international standard classification for "Mass Spectrometry Relative Sensitivity" includes: Chemical analysis , Photographic paper, films and cartridges .

The Chinese standard classification for "Mass Spectrometry Relative Sensitivity" includes: Basic standards and general methods , Basic standards and general methods for photosensitive material .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 10557-1989 Method for Determination of Spectral Sensitivity of Photosensitive Materials
GB/T 10557-1989 Method for determination of spectral sensitivity of photographic materials
GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials

SN/T 3650-2013 Determination of carbendazim,thiabendazole and thiophanate-methyl residues in medicinal herbs.LC-MS/MS method

ISO 12232:2019/Amd 1:2020 Photography — Digital still cameras — Determination of exposure index, ISO speed ratings, standard output sensitivity, and recommended exposure index — Amendment 1: Determination of encoding-relative
ISO 12232:2019 Photography — Digital still cameras — Determination of exposure index, ISO speed ratings, standard output sensitivity, and recommended exposure index — Amendment 1: Determination of encoding-relative
ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
ISO 18114:2021 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
ISO 3972:2011 Sensory analysis - Methodology - Method of investigating sensitivity of taste

GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials

UNI EN 1131:1997 Fruit and vegetable juices. Determination of the relative sensity.

KS D ISO 18114-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS D ISO 18114-2005(2020) Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS D ISO 18114:2005 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS M 3905-1972(2002) SENSITIVITY AND GRADE OF PHOTOGRAPHIC PAPER FOR GENERAL USE
KS Q ISO 3972:2014 Sensory analysis — Methodology — Method of investigating sensitivity of taste
KS Q ISO 3972:2003 Sensory analysis-Methodology-Method of investigating sensitivity of taste
KS D ISO 18118-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

BH GSO ISO 18114:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials

JIS K 0163:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
JIS B 0911:2000 Mechanical vibration -- Susceptibility and sensitivity of machines to unbalance
JIS C 8915:1989 Measuring methods of spectral response for crystalline solar cells

BS ISO 18114:2021 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
20/30409889 DC BS ISO 18114. Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
BS ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials

GOST R 51498-1999 Mechanical vibration. Susceptibility and sensitivity of machines to unbalance
GOST 11612.17-1981 Phetomultiplirs. Methods of measuring spectral anode sensitivity
GOST 17333-1980 Photoelectronic devices. Methods for measurement of spectral sensitivity of photocathodes

SS-ISO 10814:1997 Mechanical vibration - Susceptibility and sensitivity of machines to unbalance

AS ISO 18114:2006(R2016) Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
AS ISO 18114:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials