Thickness of infrared reflection
Thickness of infrared reflection, Total:4 items.
The international standard classification for "Thickness of infrared reflection" includes: Testing of metals , Semiconducting materials .
The Chinese standard classification for "Thickness of infrared reflection" includes: Metal physical property test method , Semimetal and semiconductor material in general .
Group Standards of the People's Republic of China
- T/IAWBS 007-2018 Test method for thickness of 4H silicon carbide homo-epitaxial layers by infrared reflectance
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 14847-1993 Test method for thickness of lightly doped silicon eqitaxial layers on heavily doped silicon substrates by infrared reflectance
- GB/T 42905-2023 Test method for thickness of silicon carbide epitaxial layer―Infrared reflectance method
- GB/T 14847-2010 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance
Infrared reflectivity,Reflectance in the infrared spectrum,Aluminum Reflectivity Infrared,Measurement of Infrared Reflectance,Infrared reflectivity of aluminum,Reflectivity of infrared rays,Infrared reflection,Thickness of infrared reflection,Near Infrared Reflectance Spectrum of Gold,reflective infrared spectrometer,Infrared Reflectance Coefficient of Gold
