particle detection

particle detection, Total:15 items.

The international standard classification for "particle detection" includes: Nuclear energy in general , Nuclear energy engineering .

The Chinese standard classification for "particle detection" includes: Nuclear detector .

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Military Standard of the People's Republic of China-General Armament Department

• GJB 10098-2021 Specifications for mid-energy particle detectors in space
• GJB 9926-2021 Specifications for spatial multidirectional particle detectors

Group Standards of the People's Republic of China

• T/SAS 0004-2018 Bismuth germinate scintillation crystals for space particle dectection

Professional Standard - Building Materials

• JC/T 2018-2010 Thallium doped cesium iodide crystal for high-energy particles detection

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 5201-2012 Test procedures for semiconductor charged particle detectors

SCC

• IEC 60333:1983 Test procedures for semiconductor charged-particle detectors
• DIN IEC 60333:1995 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures (IEC 60333:1993)

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

• IEEE 300-1988 Standard Test Procedures for Semiconductor Charged-Particle Detectors
• IEEE 300-1982 STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS

GSO

• GSO IEC 60333:2009 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
• OS GSO IEC 60333:2009 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

Institute of Electrical and Electronics Engineers (IEEE)

• IEEE Std 300-1988(R2006) IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
• ANSI/IEEE Std 300-1982 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
• IEEE Std 300-1988 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

International Electrotechnical Commission (IEC)

• IEC 60333:1993 Nuclear instrumentation; semiconductor charged-particle detectors; test procedures

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