Optical Wavelength Parameters
Optical Wavelength Parameters, Total:47 items.
The international standard classification for "Optical Wavelength Parameters" includes: Optical equipment , Optical measuring instruments .
The Chinese standard classification for "Optical Wavelength Parameters" includes: Optical instrument in general .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 10050-1988 Optics and optical instruments; Reference wavelengths
- GB/T 3720-1988 Optical length measuring instruments--Basic parameters
- GB/T 10050-2009 Optics and optical instruments—Reference wavelengths
Professional Standard - Machinery
- JB/T 10574-2013 Optical Length Measuring Instruments - Basic Parameters
- JB/T 10574-2006 Optical length measuring instruments -- Basic parameters
National Metrological Verification Regulations of the People's Republic of China
- JJG(邮电) 045-1999 Optical Wavelength/Frequency Meter
RU-GOST R
- GOST R 50314-1992 Optics. Reference wavelengths
- GOST R 50785-1995 Optical filtres. Types and main parameters
Korean Agency for Technology and Standards (KATS)
- KS B ISO 7944-2021 Optics and optical instruments-Reference wavelengths
- KS B ISO 7944-2011(2021) Optics and optical instruments-Reference wavelengths
- KS B ISO 7944-2011(2016) Optics and optical instruments-Reference wavelengths
Association Francaise de Normalisation
- NF EN ISO 7944:1998 Optics and optical instruments - Reference wavelengths
- NF C93-805-4-1:2011 Optical amplifiers - Test methods - Part 4-1 : gain transient parameters - Two-wavelength method.
- NF C93-805-4-1*NF EN 61290-4-1:2017 Optical amplifiers - Test methods - Part 4-1 : gain transient parameters - Two-wavelength method
- NF EN 61290-4-1:2017 Optical amplifiers - Test methods - Part 4-1: transient gain parameters - Two-wavelength method
- NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
SCC
- DANSK DS/EN ISO 7944:1998 Optics and optical instruments - Reference wavelengths
- BS 7017:1988 Specification for reference wavelengths for optics and optical instruments
- NS-EN ISO 7944:1998 Optics and optical instruments — Reference wavelengths (ISO 7944:1998)
- DIN EN ISO 7944 E:2023 Draft Document - Optics and optical instruments - Reference wavelengths (ISO/DIS 7944:2023); German and English version prEN ISO 7944:2023
- DANSK DS/EN 61290-4-1:2017 Optical amplifiers – Test methods – Part 4-1: Gain transient parameters – Two-wavelength method
- CEI EN 61290-4-1:2017 Optical amplifiers - Test methods Part 4-1: Gain transient parameters - Two-wavelength method
International Organization for Standardization (ISO)
- ISO/CD 7944 Optics and optical instruments — Reference wavelengths
- ISO/DIS 7944:2023 Optics and optical instruments — Reference wavelengths
GSO
- GSO ISO 7944:2007 Optics and optical instruments - Reference wavelengths
- OS GSO IEC 61290-4-1:2014 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
British Standards Institution (BSI)
- BS EN ISO 7944:1998(1999) Optics and optical instruments — Reference wavelengths
- BS EN 61290-4-1:2016 Optical amplifiers. Test methods. Gain transient parameters. Two-wavelength method
- BS EN 61290-4-1:2011 Optical amplifiers. Test methods. Gain transient parameters. Two-wavelength method
- 23/30464593 DC BS EN ISO 7944. Optics and optical instruments. Reference wavelengths
- BS ISO 14594:2024 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Japanese Industrial Standards Committee (JISC)
- JIS B 7090:1999 Optics and optical instruments -- Reference wavelengths
- JIS C 6122-4-1:2013 Optical amplifiers.Test methods.Part 4-1: Transient parameters.Measurement of gain parameters using two-wavelength method
Danish Standards Foundation
- DS/EN ISO 7944:1999 Optics and optical instruments - Reference wavelengths
- DS/EN 61290-4-1:2011 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
AENOR
- UNE-EN ISO 7944:1999 OPTICS AND OPTICAL INSTRUMENTS. REFERENCE WAVELENGTHS (ISO 7944:1998)
German Institute for Standardization
- DIN EN ISO 7944:1998-07 Optics and optical instruments - Reference wavelengths (ISO 7944:1998); German version EN ISO 7944:1998
- DIN EN 61290-4-1:2017-06 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (IEC 61290-4-1:2016); German version EN 61290-4-1:2016 / Note: DIN EN 61290-4-1 (2012-04) remains valid alongside this standard until 2019-10-31.
Lithuanian Standards Office
- LST EN ISO 7944:2000 Optics and optical instruments - Reference wavelengths (ISO 7944:1998)
- LST EN ISO 7944:2000/AC:2009 Optics and optical instruments - Reference wavelengths (ISO 7944:1998/Cor 1:2009)
European Committee for Standardization (CEN)
- prEN ISO 7944 Optics and optical instruments - Reference wavelengths (ISO/DIS 7944:2023)
International Electrotechnical Commission (IEC)
- IEC 61290-4-1:2011 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
- IEC 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
European Committee for Electrotechnical Standardization(CENELEC)
- EN 61290-4-1:2011 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
- EN 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
ES-UNE
- UNE-EN 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (Endorsed by Asociación Española de Normalización in February of 2017.)
Standard Association of Australia (SAA)
- ISO 14594:2024 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
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