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Database: 365,228(8 Aug 2026)

Wavelength parameters

Wavelength parameters, Total:77 items.

The international standard classification for "Wavelength parameters" includes: Optical equipment , Optical measuring instruments , Optic amplifiers .

The Chinese standard classification for "Wavelength parameters" includes: Optical instrument in general , Optical communication equipment , Technical management .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 10050-1988 Optics and optical instruments; Reference wavelengths
  • GB/T 16850.1-2022 Optical amplifier test methods—Part 1: Power and gain parameters for single-channel optical amplifiers
  • GB/T 10050-2009 Optics and optical instruments—Reference wavelengths
  • GB/T 9376-1988 Basic performance parameters for medium wave and shortwave AM broadcasting transmitters

Professional Standard - Forestry

林业部

Group Standards of the People's Republic of China

  • T/GDC 172-2022 Lifewave health parameter detector
  • T/CVIA 86-2021 Technical specifications for wavelength conversion devices for laser display

Military Standard of the People's Republic of China-General Armament Department

  • GJB 5174-2004 Shortwave/ultrashortwave active direction finding antenna parameter series
  • GJB 9150-2017 Microwave parameter testing method for microwave power transistors

Professional Standard - Electron

  • SJ 20612-1996 Microwave circuits-Letter symbols for characteristics

National Metrological Verification Regulations of the People's Republic of China

  • JJG 2015-2013 Measuring Instruments for Pulse Waveform Parameter

未注明发布机构

Professional Standard-Ships

RU-GOST R

British Standards Institution (BSI)

  • BS EN 61290-4-1:2016 Optical amplifiers. Test methods. Gain transient parameters. Two-wavelength method
  • BS EN 61290-4-1:2011 Optical amplifiers. Test methods. Gain transient parameters. Two-wavelength method
  • BS EN ISO 7944:1998(1999) Optics and optical instruments — Reference wavelengths
  • 23/30464593 DC BS EN ISO 7944. Optics and optical instruments. Reference wavelengths
  • BS ISO 14594:2024 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • BS EN 62754:2017 Computation of waveform parameter uncertainties

GSO

  • GSO ISO 7944:2007 Optics and optical instruments - Reference wavelengths
  • OS GSO IEC 61290-4-1:2014 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
  • BH GSO ISO 14594:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • BH GSO IEC 62754:2023 Computation of waveform parameter uncertainties

Korean Agency for Technology and Standards (KATS)

  • KS B ISO 7944-2021 Optics and optical instruments-Reference wavelengths
  • KS B ISO 7944-2011(2021) Optics and optical instruments-Reference wavelengths
  • KS B ISO 7944-2011(2016) Optics and optical instruments-Reference wavelengths
  • KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 14594-2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

Association Francaise de Normalisation

SCC

International Organization for Standardization (ISO)

  • ISO/CD 7944 Optics and optical instruments — Reference wavelengths
  • ISO/DIS 7944:2023 Optics and optical instruments — Reference wavelengths
  • ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

Japanese Industrial Standards Committee (JISC)

  • JIS B 7090:1999 Optics and optical instruments -- Reference wavelengths
  • JIS C 6122-4-1:2013 Optical amplifiers.Test methods.Part 4-1: Transient parameters.Measurement of gain parameters using two-wavelength method

Danish Standards Foundation

CZ-CSN

  • CSN 36 7109-1984 Fixed broadcasting transmitters in the LW and MW bands, automated Principal parameters, generál technical requirements, methods of measurement

AENOR

German Institute for Standardization

  • DIN EN ISO 7944:1998-07 Optics and optical instruments - Reference wavelengths (ISO 7944:1998); German version EN ISO 7944:1998
  • DIN EN 61290-4-1:2017-06 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (IEC 61290-4-1:2016); German version EN 61290-4-1:2016 / Note: DIN EN 61290-4-1 (2012-04) remains valid alongside this standard until 2019-10-31.
  • DIN CEN/TS 17731:2022-05 Growing media - Determination of specific parameters; German version CEN/TS 17731:2022

Lithuanian Standards Office

IT-UNI

International Electrotechnical Commission (IEC)

  • IEC 61290-4-1:2011 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
  • IEC 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method

GOST

ES-UNE

  • UNE-EN 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (Endorsed by Asociación Española de Normalización in February of 2017.)
  • UNE-EN 62754:2017 Computation of waveform parameter uncertainties (Endorsed by Asociación Española de Normalización in October of 2017.)
  • UNE-CEN/TS 17731:2022 Growing media - Determination of specific parameters (Endorsed by Asociación Española de Normalización in May of 2022.)

European Committee for Electrotechnical Standardization(CENELEC)

  • EN 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
  • EN 61290-4-1:2011 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
  • EN 62754:2017 Computation of waveform Parameter uncertainties

European Committee for Standardization (CEN)

Standard Association of Australia (SAA)

  • ISO 14594:2024 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

KR-KS

  • KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy