electronic device
electronic device, Total:45 items.
The international standard classification for "electronic device" includes: Aircraft and space vehicles in general , Other standards related to quality , Optoelectronics. Laser equipment .
The Chinese standard classification for "electronic device" includes: Technical management , Technical management , Technical Management , Electric drive control equipment , Electronic measurement and equipment in general , Basic standards and general methods , Carrier communication equipment , Optoelectronic device assembly .
Professional Standard - Electron
- SJ/T 11023-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of bismuth (spectrophotometric-atomic absorption method)
- SJ/T 11018-1996 Methods of analysis for pure silver brazing for electronic devices-Determination of sulfur (iodimetric combustion method)
- SJ/T 11026-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of iron, cadmium and zinc (spectrophotometric-atomic absorption method)
- SJ 20143-1992 Specification for tungsten wires for electron devices
- SJ/T 10747-1996 colour codes for wire leads of microwave devices
- SJ/T 10753-2015 Gold, silver and their alloy brazing for electron device
- SJ/T 11027-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of magnesium (spectrophotometric-atomic absorption method)
- SJ/T 3233-2008 Vacuum electronic apparatus electronic gun bead glass
- SJ/T 11029-1996 Methods of analysis for gold-nickel brazing for electronic devices - Determination of nickel (Volumetric - EDTA method)
- SJ/T 10753-1996 Gold,silver and their alloy brazing for electronic devices
- SJ/Z 2976-1988 Test method for physical characteristics of brazing for electronic devices--Determination of pull brazed away temperature of brazing
- SJ/T 10256-1991 BHC-1-3 type epoxy-improved molding plastics for electronic device
- SJ 20144-1992 Specification for molybdenum rods wire and sheets for electron devices
- SJ 20390-1993 Specification for glass-to-metal headers used in electron devices
- SJ/T 11013-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of cadmium (spectrophotometric-atomic absorption method)
- SJ 20151-1992 Specification for nickel strips for electron devices
- SJ/T 11025-1996 Analytical methods for silver copper brazing for electron device Determination of lead by atomic absorption spectrophotometry
- SJ/T 10755-1996 Test method for gold,silver and their alloy brazing for electronic devices-Test method for spittering
- SJ/T 11024-1996 Methods of analysis for silver-copper brazing for electronic devices-Determination of antimony (spectrophotometric-atomic absorption method)
- SJ/T 10754-1996 Test method for gold, silver and their alloy brazing for electronic devices - Test method for cleanness
- SJ/T 11028-1996 Methods of analysis for gold-copper brazing for electronic devices - Determination of copper (Volumetric - EDTA method)
- SJ/T 11020-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of copper (iodimetric method)
- SJ/T 11015-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of iron (spectrophotometric-O-phenanthroline method)
Professional Standard - Urban Construction
- GB 51343-2018 Technical standard for equipment installation of vacuum electronic device production line
Professional Standard - Press and Publication
- CY/T 275-2024 Control requirements for printing process of flexible transparent thin film electronic devices
- CY/T 248-2021 Quality requirements for electronic devices using printed flexible transparent film
Professional Standard - Machinery
- JB/T 7845-1995 Electric Control Equipment with Electronic Devices for Drilling Machine on the Ground
Beijing Provincial Standard of the People's Republic of China
- DB11/T 2176-2023 Standards for equipment and management of energy measuring instruments Electronic device manufacturing industry
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 39722-2020 Superconducting electronic devices—Generic specification for sensors and detectors
Military Standard of the People's Republic of China-General Armament Department
- GJB 7350-2011 Test method of pulse γ-ray radiation effects for military electronic devices
- GJB 33/21-2011 Semiconductor optoelectronic device.Detail specification for GD310A series photocopier
- GJB/Z 40.6-1993 Military vacuum electronic devices series spectrum vacuum optoelectronic devices
- GJB 8118-2013 Classification and code for military electronic component
Group Standards of the People's Republic of China
- T/JSSES 15-2021 N-methylpyrrolidone regeneration solution for battery manufacturing and electronic device manufacturing industry
- T/JSSES 12-2021 Isopropanol regeneration solution for battery manufacturing and electronic device manufacturing industry
Professional Standard - Tobacco
- YC/T 10.14-1993 General technical requirements for tobacco machinery Electric control equipment equipped with electronic devices
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34954.1-2017 Process management for avionics-Electronic components capability in operation-Part 1:Temperature uprating
Professional Standard - Post and Telecommunication
- YD/T 2342-2011 Reliability Test Method for Optoelectronic Devices Used in Telecommunications
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 21194-2007 Generic reliability assurance requirements for optoelectronic devices used in telecommunications equipment
- GB/T 15651.2-2003 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
Professional Standard - Aerospace
- QJ 2227-1992 Requirements for storage and overdue re-inspection of aerospace electronic components
British Standards Institution (BSI)
- BS EN IEC 62435-8:2020 Electronic components. Long-term storage of electronic semiconductor devices - Passive electronic devices
Association Francaise de Normalisation
- NF EN IEC 62435-8:2020 Electronic components - Long-term storage of semiconductor electronic devices - Part 8: passive electronic devices
International Electrotechnical Commission (IEC)
- IEC 62435-8:2020 Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
Government Electronic & Information Technology Association
- GEIA-STD-0003-2006 Long Term Storage of Electronic Devices
electronic device,Microelectronics,Optoelectronic devices,Methods of analysis for silver-copper solders for electronic devices Determination of bismuth by atomic absorption spectrophotometry,Analytical methods for gold, silver and their alloy solders for electronic devices cleanliness and spatter,Semiconductor optoelectronic devices for fiber optic systems,Blank details of power light-emitting diodes in semiconductor optoelectronic devices,Reliability test method of optoelectronic devices for communication,Microelectronic device test methods and procedures,Optoelectronic device core,Optical Optoelectronic Devices,Functionality of new electronic devices,Ultra Low Power Electronics,Electronics Packaging,Electronic Device Packaging Requirements,Microelectronic device test methods and procedures,Semiconductor discrete devices and integrated circuit optoelectronic devices,vacuum electronics