Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)

electronic device

electronic device, Total:45 items.

The international standard classification for "electronic device" includes: Aircraft and space vehicles in general , Other standards related to quality , Optoelectronics. Laser equipment .

The Chinese standard classification for "electronic device" includes: Technical management , Technical management , Technical Management , Electric drive control equipment , Electronic measurement and equipment in general , Basic standards and general methods , Carrier communication equipment , Optoelectronic device assembly .


Professional Standard - Electron

  • SJ/T 11023-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of bismuth (spectrophotometric-atomic absorption method)
  • SJ/T 11018-1996 Methods of analysis for pure silver brazing for electronic devices-Determination of sulfur (iodimetric combustion method)
  • SJ/T 11026-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of iron, cadmium and zinc (spectrophotometric-atomic absorption method)
  • SJ 20143-1992 Specification for tungsten wires for electron devices
  • SJ/T 10747-1996 colour codes for wire leads of microwave devices
  • SJ/T 10753-2015 Gold, silver and their alloy brazing for electron device
  • SJ/T 11027-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of magnesium (spectrophotometric-atomic absorption method)
  • SJ/T 3233-2008 Vacuum electronic apparatus electronic gun bead glass
  • SJ/T 11029-1996 Methods of analysis for gold-nickel brazing for electronic devices - Determination of nickel (Volumetric - EDTA method)
  • SJ/T 10753-1996 Gold,silver and their alloy brazing for electronic devices
  • SJ/Z 2976-1988 Test method for physical characteristics of brazing for electronic devices--Determination of pull brazed away temperature of brazing
  • SJ/T 10256-1991 BHC-1-3 type epoxy-improved molding plastics for electronic device
  • SJ 20144-1992 Specification for molybdenum rods wire and sheets for electron devices
  • SJ 20390-1993 Specification for glass-to-metal headers used in electron devices
  • SJ/T 11013-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of cadmium (spectrophotometric-atomic absorption method)
  • SJ 20151-1992 Specification for nickel strips for electron devices
  • SJ/T 11025-1996 Analytical methods for silver copper brazing for electron device Determination of lead by atomic absorption spectrophotometry
  • SJ/T 10755-1996 Test method for gold,silver and their alloy brazing for electronic devices-Test method for spittering
  • SJ/T 11024-1996 Methods of analysis for silver-copper brazing for electronic devices-Determination of antimony (spectrophotometric-atomic absorption method)
  • SJ/T 10754-1996 Test method for gold, silver and their alloy brazing for electronic devices - Test method for cleanness
  • SJ/T 11028-1996 Methods of analysis for gold-copper brazing for electronic devices - Determination of copper (Volumetric - EDTA method)
  • SJ/T 11020-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of copper (iodimetric method)
  • SJ/T 11015-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of iron (spectrophotometric-O-phenanthroline method)

Professional Standard - Urban Construction

  • GB 51343-2018 Technical standard for equipment installation of vacuum electronic device production line

Professional Standard - Press and Publication

  • CY/T 275-2024 Control requirements for printing process of flexible transparent thin film electronic devices
  • CY/T 248-2021 Quality requirements for electronic devices using printed flexible transparent film

Professional Standard - Machinery

  • JB/T 7845-1995 Electric Control Equipment with Electronic Devices for Drilling Machine on the Ground

Beijing Provincial Standard of the People's Republic of China

  • DB11/T 2176-2023 Standards for equipment and management of energy measuring instruments Electronic device manufacturing industry

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 39722-2020 Superconducting electronic devices—Generic specification for sensors and detectors

Military Standard of the People's Republic of China-General Armament Department

  • GJB 7350-2011 Test method of pulse γ-ray radiation effects for military electronic devices
  • GJB 33/21-2011 Semiconductor optoelectronic device.Detail specification for GD310A series photocopier
  • GJB/Z 40.6-1993 Military vacuum electronic devices series spectrum vacuum optoelectronic devices
  • GJB 8118-2013 Classification and code for military electronic component

Group Standards of the People's Republic of China

  • T/JSSES 15-2021 N-methylpyrrolidone regeneration solution for battery manufacturing and electronic device manufacturing industry
  • T/JSSES 12-2021 Isopropanol regeneration solution for battery manufacturing and electronic device manufacturing industry

Professional Standard - Tobacco

  • YC/T 10.14-1993 General technical requirements for tobacco machinery Electric control equipment equipped with electronic devices

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 34954.1-2017 Process management for avionics-Electronic components capability in operation-Part 1:Temperature uprating

Professional Standard - Post and Telecommunication

  • YD/T 2342-2011 Reliability Test Method for Optoelectronic Devices Used in Telecommunications

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 21194-2007 Generic reliability assurance requirements for optoelectronic devices used in telecommunications equipment
  • GB/T 15651.2-2003 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics

Professional Standard - Aerospace

  • QJ 2227-1992 Requirements for storage and overdue re-inspection of aerospace electronic components

British Standards Institution (BSI)

  • BS EN IEC 62435-8:2020 Electronic components. Long-term storage of electronic semiconductor devices - Passive electronic devices

Association Francaise de Normalisation

  • NF EN IEC 62435-8:2020 Electronic components - Long-term storage of semiconductor electronic devices - Part 8: passive electronic devices

International Electrotechnical Commission (IEC)

  • IEC 62435-8:2020 Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices

Government Electronic & Information Technology Association