What is the magnification of the microscope on the steel surface

What is the magnification of the microscope on the steel surface, Total:97 items.

The international standard classification for "What is the magnification of the microscope on the steel surface" includes: Chemical analysis , Surface preparation , Testing of metals .

The Chinese standard classification for "What is the magnification of the microscope on the steel surface" includes: Basic standards and general methods , Material Protection , Metal physical property test method .

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AMPP Paper 17739-2022 In Situ Atomic Force Microscopy Study of Microstructure Dependent Inhibitor Adsorption Mechanism on Carbon Steel

Group Standards of the People's Republic of China

T/SPSTS 031-2023 Graphene Material Surface Potential Measurement Atomic Force Microscopy
T/CSIQ 3101-2015 Stereo microscope method for testing surface microstructure of ceramic works of art
T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB/T 13288.3-2009 Preparation of steel substrates before application of paints and related products - Surface roughness characteristics of blast-cleaned steel substrates - Part 3: Method for the calib
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope

British Standards Institution (BSI)

BS 7012-8:1990 Light microscopes-Specification for surface marked graticules for eyepieces
BS 7011-3-3.2:1990 Consumable accessories for light microscopes. Cover glasses-Specification for materials and quality of finish
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
BS 7011-2.2:1998 Consumable accessories for light microscopes. Slides. Specification for materials and quality of finish
BS 7011-2-2.2:1990 Consumable accessories for light microscopes. Slides-Specification for materials and quality of finish
BS 7011-3.2:1998 Consumable accessories for light microscopes. Cover glasses-Specification for materials and quality of finish
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
10/30199182 DC BS ISO 11039. Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
BS ISO 29301:2023 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
BS ISO 23124:2024 Surface chemical analysis. Measurement of lateral and axial resolutions of a Raman microscope
BS ISO 29301:2017 Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures
10/30199179 DC BS ISO 28600. Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
BS ISO 20263:2024 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
BS ISO 11775:2015 Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
23/30464953 DC BS EN ISO 643. Steels. Micrographic determination of the apparent grain size
17/30363662 DC BS EN ISO 643 Steels. Micrographic determination of the apparent grain size
23/30420097 DC BS ISO 23124 Surface Chemical Analysis. Measurement of lateral and axial resolutions of Raman microscope
24/30479444 DC BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

American Water Works Association (AWWA)

AWWA WQTC55011 Characterizing Corroded Surfaces by Using High Resolution Light Microscopy
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope

International Organization for Standardization (ISO)

ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO/CD 643 Steels — Micrographic determination of the apparent grain size
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
ISO 23124:2024 Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
ISO/DIS 23124:2023 Surface Chemical Analysis — Measurement of lateral and axial resolutions of Raman microscope
ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
ISO/FDIS 23124:2023 Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO/CD 20263:2023 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO 8503-3:1988 Preparation of steel substrates before application of paints and related products; surface roughness characteristics of blast-cleaned steel substrates; part 3: method for the calibration of ISO surface profile comparators and for the determination of surf
ISO 8503-3:2012 Preparation of steel substrates before application of paints and related products - Surface roughness characteristics of blast-cleaned steel substrates - Part 3: Method for the calibration of ISO surface profile comparators and for the determination of su
ISO 11775:2015 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
ISO 18115-2:2013 Surface chemical analysis.Vocabulary.Part 2: Terms used in scanning-probe microscopy
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 20263:2024 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
ISO 20263:2017 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
BH GSO ISO 8255-2:2016 Microscopes -- Cover glasses -- Part 2: Quality of materials, standards of finish and mode of packaging
BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 28600:2016 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
BH GSO ISO 29301:2017 Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures
BH GSO ISO 11775:2022 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
BH GSO ISO 8037-2:2016 Optics and optical instruments -- Microscopes -- Slides -- Part 2: Quality of material, standards of finish and mode of packaging

RO-ASRO

STAS 5949-1980 DRTRRMINATION OF NON-METALIC STEELS Microscopie method

GCC Standardization Organization

GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
GSO ISO 28600:2013 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
GSO ISO 3057:2013 Non-destructive testing -- Metallographic replica techniques of surface examination
GSO ISO 27911:2013 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
GSO ISO 29301:2016 Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures
GSO ISO 11775:2021 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
GSO ISO 18115-2:2013 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy

Swedish Institute for Standards

SS 111114:1984 Steel - Determination of slag inclusions - Microscopic methods - Manual representation

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 8255-2:2014 Microscopes -- Cover glasses -- Part 2: Quality of materials, standards of finish and mode of packaging
OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
OS GSO ISO 29301:2016 Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures
OS GSO ISO 8037-2:2014 Optics and optical instruments -- Microscopes -- Slides -- Part 2: Quality of material, standards of finish and mode of packaging

Semiconductor Equipment and Materials International (SEMI)

SEMI F73-0309-2009 TEST METHOD FOR SCANNING ELECTRON MICROSCOPY (SEM) EVALUATION OF WETTED SURFACE CONDITION OF STAINLESS STEEL COMPONENTS

German Institute for Standardization

DIN EN ISO 8503-3:1995 Surface roughness characteristics of blast-cleaned steel substrates Method for the calibration of ISO surface profile comparators and for the DIN determination of surface profile using a focusing microscope

Ente Nazionale Italiano di Unificazione

UNI 3494:1954 Macroscopic examination of lead and lead alloys. Preparing the surfaces. Etchants.
UNI 3244 ALL.1:1980 Microscopic examination of ferrous materials. Rating of non-metallic inclusions in steels by reference pictures. Table of reference pictures.

Association Francaise de Normalisation

NF A04-114:1984 Iron and steel. High carbon continuous cast steel wire rod. Macrographic method of showing and describing the chemical heterogeneity.
NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.

Association of German Mechanical Engineers

VDI VDE 2604-1971 Surface measurement methods Roughness inspection using interference microscopy
VDI 3877 Blatt 1-2009 Indoor air pollution - Measurement of settled dust on surfaces - Scanning electron microscopy method

Japanese Industrial Standards Committee (JISC)

JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy

Gosstandart of Russia

GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope

Bureau of Indian Standards

IS 15268-2-2002 Optics and Optical Instruments - Microscopes - Slides - Part 2 : Quality of Material, Standards of Finish and Mode of Packaging

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