Semiconductor Photocatalytic Oxidation

Semiconductor Photocatalytic Oxidation, Total:77 items.

The international standard classification for "Semiconductor Photocatalytic Oxidation" includes: Paints and varnishes , Wastes in general , Other products of the chemical industry .

The Chinese standard classification for "Semiconductor Photocatalytic Oxidation" includes: Coating auxiliary materials , Standardization and quality management , Catalyst , Basic standards and general methods for catalyst .

国家能源局

SH/T 0962-2017 Determination of sodium oxide content in catalytic cracking catalysts by flame photometry
SH/T 0950-2017 Determination of lanthanum oxide and cerium oxide content in catalytic cracking catalysts by X-ray fluorescence spectrometry
SH/T 0963-2017 Determination of iron oxide content in catalytic cracking catalyst - phenanthroline spectrophotometry

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 39952-2021 Titanium dioxide-based dispersion for photocatalysis

Group Standards of the People's Republic of China

T/CECA 35-2019 Metal oxide semiconductor gas sensor
T/JSSES 11-2020 Group standard for ex-situ regeneration of alumina base catalyst
T/SACE 017-2020 Zinc Oxide from Spent Catalyst
T/CIECCPA 007-2024 Semiconductor Industry Nitrogen Oxide Emission Requirements

工业和信息化部

JC/T 2517-2019 Titanium dioxide hydrosol as indoor photocatalyst

Professional Standard - Chemical Industry

HG/T 2086-2004 The catalyst oxidizing sulphuric dioxide into sulphuric acid
HG/T 2086-2013 The Catalyst Oxidizing Sulphuric Dioxide Into Sulphuric Acid
HG/T 6282-2024 Determination of Carbon Monoxide Index of Catalytic Cracking Catalyst
HG 2086-2004 The catalyst oxidizing sulphuric dioxide into sulphuric acid

Professional Standard - Petrochemical Industry

SH/T 0341-1992 Determination method for aluminum oxide content in catalyst carrier

Professional Standard - Nuclear Industry

EJ/T 1101-1999 Determination of ruthenium in natural uranium dioxide by catalysis colorinetry

Jilin Provincial Standard of the People's Republic of China

DB22/T 2736-2017 Nano-titanium dioxide diatomite composite photocatalytic material

Association Francaise de Normalisation

XP CEN/TS 16599:2014 Photocatalysis - Determination of irradiation conditions to test the photocatalytic properties of semiconductor materials
XP B44-014*XP CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
NF ISO 10677:2011 Céramiques techniques - Sources lumineuses UV destinée aux essais des matériaux photocatalytiques semi-conducteurs
NF ISO 14605:2013 Céramiques techniques - Sources lumineuses destinées aux essais des matériaux photocatalytiques semi-conducteurs dans un environnement d'éclairage intérieur
NF ISO 22197-4:2021 Technical ceramics - Test methods for the performance of semiconductor photocatalytic materials for air purification - Part 4: formaldehyde removal
NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).

European Committee for Standardization (CEN)

PD CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions

Japanese Industrial Standards Committee (JISC)

JIS R 1708:2016 Fine ceramics (Advanced ceramics, advanced technical ceramics) -- Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
JIS R 1750:2012 Fine ceramics -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment

British Standards Institution (BSI)

BS PD CEN/TS 16599:2014 Photocatalysis. Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
BS ISO 19722:2017 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
BS ISO 22197-1:2016 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of nitric oxide
BS ISO 22197-1:2008 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Removal of nitric oxide
BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
BS EN 16980-1:2021 Photocatalysis. Continuous flow test methods. Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials

SCC

DANSK DS/CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
DIN CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
DIN 19279:2018 Photocatalytic activity of surfaces - Determination of the photocatalytic deposition velocity of nitrogen monoxide at photocatalytically active surfaces
AWWA QTC97021 Catalytic Photochemical Oxidation of NOM in Drinking Water
DIN 19279 E:2016 Draft Document - Photocatalytic activity of surfaces - Determination of the photocatalytic deposition velocity of nitrogen monoxide at photocatalytically active surfaces
BS ISO 22197-1:2007 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials-Removal of nitric oxide
06/30156520 DC BS ISO 22197-1. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of nitric oxide
AWWA ACE91065 Destruction of Disinfection By-Product Precursors Using Photoassisted Heterogeneous Catalytic Oxidation
AWWA ACE95069 Catalyzed Manganese Oxidation in the Presence of Iron Oxides

German Institute for Standardization

DIN CEN/TS 16599:2014-07*DIN SPEC 7397:2014-07 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
DIN CEN/TS 16599:2014*DIN SPEC 7397:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
DIN 19279 E:2016-11 Photocatalytic activity of surfaces - Determination of the photocatalytic deposition velocity of nitrogen monoxide at photocatalytically active surfaces
DIN 19279:2018-01 Photocatalytic activity of surfaces - Determination of the photocatalytic deposition velocity of nitrogen monoxide at photocatalytically active surfaces
DIN ISO 22197-1 E:2018-03 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
DIN ISO 22197-1:2018-12 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)
DIN ISO 22197-1 E:2015-01 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
DIN ISO 22197-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)

GSO

GSO ISO 19722:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
BH GSO ISO 19722:2022 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
NB/SH/T 0950-2017 Determination of lanthanum oxide and cerium oxide content in catalytic cracking catalysts - X-ray fluorescence spectrometry
NB/SH/T 0962-2017 Determination of sodium oxide content in catalytic cracking catalysts - Flame photometry
NB/SH/T 0963-2017 Determination of iron oxide content in catalytic cracking catalysts - O-phenanthroline spectrophotometric method
OS GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials

International Organization for Standardization (ISO)

ISO 19722:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
ISO 22197-1:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
ISO 22197-1:2007 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide

Defense Logistics Agency

DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON

European Committee for Electrotechnical Standardization（CENELEC）

EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Spanish Association for Standardization (UNE)

UNE-ISO 22197-1:2012 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Part 1: Removal of nitric oxide
UNE 127197-1:2013 Test method application to evaluate the air-purification performance of semiconducting photocatalytic materials soaked into precast concrete products - Part 1: Removal of nitric oxide.

Korean Agency for Technology and Standards (KATS)

KS L ISO 22197-1:2018 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 22197-1:2022 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 22197-1:2008 Fine ceramics (advanced ceramics, advanced technical ceramics)-Test method for air-purification performance of semiconducting photocatalytic materials-Part 1:Removal of nitric oxide

KR-KS

KS L ISO 22197-1-2018 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 22197-1-2022 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials