1. Semiconductor Photocatalytic Oxidation
1. Semiconductor Photocatalytic Oxidation, Total:117 items.
The international standard classification for "1. Semiconductor Photocatalytic Oxidation" includes: Other products of the chemical industry , Other organic chemicals , Paints and varnishes , Medicaments , Wastes in general , Electronic components in general .
The Chinese standard classification for "1. Semiconductor Photocatalytic Oxidation" includes: Catalyst , Coating auxiliary materials , Hygiene, safety and labor protection , Standardization and quality management , Basic standards and general methods for catalyst , Sensitive component and sensor .
未注明发布机构
- DIN 19279 E:2016-11 Photocatalytic activity of surfaces - Determination of the photocatalytic deposition velocity of nitrogen monoxide at photocatalytically active surfaces
- DIN ISO 22197-1 E:2015-01 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
- DIN ISO 22197-1 E:2018-03 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
- DIN CEN/TS 16599:2014*DIN SPEC 7397:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
Professional Standard - Chemical Industry
- HG/T 6282-2024 Determination of Carbon Monoxide Index of Catalytic Cracking Catalyst
- HG/T 3556-2012 Low Temperature Carbon Monoxide Shift Catalysts
- HG 3556-2004 Low temperature carbon monoxide shift catalyst
- HG/T 3544-1989 The determinatino of high temperature carbon monoxide shift catalyst
- HG/T 3546-2011 High temperature carbon monoxide shift catalysts
- HG 3546-2002 High temperature carbon monoxide shift catalysts
- HG/T 2779-2009 Sulfur-tolerant carbon monoxide shift catalysts(low pressure part)
- HG/T 2779-1996 Carbon Monoxide Sulfur Tolerant Shift Catalyst
- HG/T 2693-1995 一氧化碳高温变换催化剂化学成份的测定
- HG/T 2086-2004 The catalyst oxidizing sulphuric dioxide into sulphuric acid
- HG/T 2780-1996 Test method for carbon monoxide sulfur tolerant shift catalysts
- HG 2086-2004 The catalyst oxidizing sulphuric dioxide into sulphuric acid
- HG/T 2086-2013 The Catalyst Oxidizing Sulphuric Dioxide Into Sulphuric Acid
国家能源局
- SH/T 0950-2017 Determination of lanthanum oxide and cerium oxide content in catalytic cracking catalysts by X-ray fluorescence spectrometry
- SH/T 0962-2017 Determination of sodium oxide content in catalytic cracking catalysts by flame photometry
- SH/T 0963-2017 Determination of iron oxide content in catalytic cracking catalyst - phenanthroline spectrophotometry
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 39952-2021 Titanium dioxide-based dispersion for photocatalysis
Professional Standard - Coal
- MT 869-2000 Carbon monoxide oxidative for filter self-rescuers
工业和信息化部
- JC/T 2517-2019 Titanium dioxide hydrosol as indoor photocatalyst
- HG/T 5703-2020 Test method of physical properties for carbon monoxide removing catalyst in monomer olefin at low temperature
- HG/T 5702-2020 Test method of activity for carbon monoxide removing catalyst in monomer olefin at low temperature
- HG/T 5596-2019 Sulfur-tolerant carbon monoxide shift catalysts in medium-high pressure
- HG/T 2779-2016 Sulfur-tolerant carbon monoxide shift catalysts
Group Standards of the People's Republic of China
- T/CIECCPA 007-2024 Semiconductor Industry Nitrogen Oxide Emission Requirements
- T/SACE 017-2020 Zinc Oxide from Spent Catalyst
- T/JSSES 11-2020 Group standard for ex-situ regeneration of alumina base catalyst
- T/CECA 35-2019 Metal oxide semiconductor gas sensor
Professional Standard - Petrochemical Industry
- SH/T 0341-1992 Determination method for aluminum oxide content in catalyst carrier
Jilin Provincial Standard of the People's Republic of China
- DB22/T 2736-2017 Nano-titanium dioxide diatomite composite photocatalytic material
Professional Standard - Nuclear Industry
- EJ/T 1101-1999 Determination of ruthenium in natural uranium dioxide by catalysis colorinetry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 15652-1995 Generic specification for gas sensors of metal-oxide semiconductor
Association Francaise de Normalisation
- XP CEN/TS 16599:2014 Photocatalysis - Determination of irradiation conditions to test the photocatalytic properties of semiconductor materials
- XP B44-014*XP CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- NF ISO 10677:2011 Céramiques techniques - Sources lumineuses UV destinée aux essais des matériaux photocatalytiques semi-conducteurs
- NF ISO 14605:2013 Céramiques techniques - Sources lumineuses destinées aux essais des matériaux photocatalytiques semi-conducteurs dans un environnement d'éclairage intérieur
- NF EN 16980-1:2021 Photocatalysis - Continuous flow test method - Part 1: determination of degradation of nitrogen monoxide (NO) in air by photocatalytic materials
- NF B44-212-1*NF EN 16980-1:2021 Photocatalysis - Continuous flow test methods - Part 1 : determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
- NF ISO 22197-4:2021 Technical ceramics - Test methods for the performance of semiconductor photocatalytic materials for air purification - Part 4: formaldehyde removal
- NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
- NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
European Committee for Standardization (CEN)
- PD CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- PD CEN/TS 16980-1:2016 Photocatalysis - Continuous flow test methods - Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
- EN 16980-1:2021 Photocatalysis - Continuous flow test methods - Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
Japanese Industrial Standards Committee (JISC)
- JIS R 1708:2016 Fine ceramics (Advanced ceramics, advanced technical ceramics) -- Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
- JIS R 1750:2012 Fine ceramics -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
British Standards Institution (BSI)
- BS PD CEN/TS 16599:2014 Photocatalysis. Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- BS ISO 19722:2017 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
- BS ISO 22197-1:2016 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of nitric oxide
- BS ISO 22197-1:2008 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Removal of nitric oxide
- BS EN 16980-1:2021 Photocatalysis. Continuous flow test methods. Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
- BS PD CEN/TS 16980-1:2016 Photocatalysis. Continuous flow test methods. Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
- BS ISO 17168-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of nitric oxide
- BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
- 20/30405589 DC BS EN 16980-1. Photocatalysis. Continuous flow test methods. Part 1. Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
- BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
SCC
- DANSK DS/CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- DIN 19279:2018 Photocatalytic activity of surfaces - Determination of the photocatalytic deposition velocity of nitrogen monoxide at photocatalytically active surfaces
- DIN CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
- DIN 19279 E:2016 Draft Document - Photocatalytic activity of surfaces - Determination of the photocatalytic deposition velocity of nitrogen monoxide at photocatalytically active surfaces
- BS ISO 22197-1:2007 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials-Removal of nitric oxide
- 06/30156520 DC BS ISO 22197-1. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of nitric oxide
- AWWA QTC97021 Catalytic Photochemical Oxidation of NOM in Drinking Water
- DANSK DS/EN 16980-1:2021 Photocatalysis – Continuous flow test methods – Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
- NS-EN 16980-1:2021 Photocatalysis – Continuous flow test methods – Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
- SN-CEN/TS 16980-1:2016 Photocatalysis - Continuous flow test methods - Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
- AENOR UNE 83321 EX:2017 Concrete with photocatalytic activity. Determination of the degradation of nitric oxide (NO) in air by photocatalytic materials. Continuous flow method
- DANSK DS/CEN/TS 16980-1:2016 Photocatalysis – Continuous flow test methods – Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
- DIN ISO 22197-1 E:2018 Draft Document - Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016); Text in German and English
- AWWA ACE91065 Destruction of Disinfection By-Product Precursors Using Photoassisted Heterogeneous Catalytic Oxidation
- AWWA ACE95069 Catalyzed Manganese Oxidation in the Presence of Iron Oxides
- AWWA JAW39259 Journal AWWA — Destruction of DBP Precursors With Catalytic Oxidation
German Institute for Standardization
- DIN CEN/TS 16599:2014-07*DIN SPEC 7397:2014-07 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
- DIN 19279:2018-01 Photocatalytic activity of surfaces - Determination of the photocatalytic deposition velocity of nitrogen monoxide at photocatalytically active surfaces
- DIN ISO 22197-1:2018-12 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)
- DIN ISO 22197-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)
- DIN EN 16980-1:2021-12 Photocatalysis - Continuous flow test methods - Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials; German version EN 16980-1:2021
- DIN ISO 22197-1:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2007)
- DIN EN 16980-1:2020 Photocatalysis - Continuous flow test methods - Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials; German and English version prEN 16980-1:2020
GSO
- GSO ISO 19722:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
- BH GSO ISO 19722:2022 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
- NB/SH/T 0950-2017 Determination of lanthanum oxide and cerium oxide content in catalytic cracking catalysts - X-ray fluorescence spectrometry
- NB/SH/T 0962-2017 Determination of sodium oxide content in catalytic cracking catalysts - Flame photometry
- NB/SH/T 0963-2017 Determination of iron oxide content in catalytic cracking catalysts - O-phenanthroline spectrophotometric method
- OS GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
- GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
International Organization for Standardization (ISO)
- ISO 19722:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
- ISO 22197-1:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
- ISO 22197-1:2007 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
- ISO 17168-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Part 1: Removal of nitric oxide
AENOR
- UNE-ISO 22197-1:2012 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Part 1: Removal of nitric oxide
- UNE 127197-1:2013 Test method application to evaluate the air-purification performance of semiconducting photocatalytic materials soaked into precast concrete products - Part 1: Removal of nitric oxide.
- UNE 83321:2017 EX Concrete with photocatalytic activity. Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials. Continuous flow test method
Korean Agency for Technology and Standards (KATS)
- KS L ISO 22197-1:2018 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
- KS L ISO 22197-1:2022 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
- KS L ISO 22197-1:2008 Fine ceramics (advanced ceramics, advanced technical ceramics)-Test method for air-purification performance of semiconducting photocatalytic materials-Part 1:Removal of nitric oxide
- KS L ISO 17168-1:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 1: Remova
KR-KS
- KS L ISO 22197-1-2018 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
- KS L ISO 22197-1-2022 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
- KS L ISO 17168-1-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 1: Remova
- KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
Defense Logistics Agency
- DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON
European Committee for Electrotechnical Standardization(CENELEC)
- EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
IT-UNI
- UNI EN 16980-1-2021 Photocatalysis - Continuous flow test methods - Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
ES-UNE
- UNE-EN 16980-1:2022 Photocatalysis - Continuous flow test methods - Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials.
CH-SNV
- SN EN 16980-1-2021 Photocatalysis - Continuous flow test methods - Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
Danish Standards Foundation
- DS/EN 16980-1:2021 Photocatalysis – Continuous flow test methods – Part 1: Determination of the degradation of nitric oxide (NO) in the air by photocatalytic materials
US-FCR
- FCR UFGS-44 13 52-2011 THERMAL (CATALYTIC) OXIDATION SYSTEMS
- FCR COE CEGS 11378-1999 THERMAL (CATALYTIC) OXIDATION SYSTEMS
ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc.
- ASHRAE LV-11-C052-2011 Air Cleaning by Photo Catalytic Oxidation: An Experimental Performance Test
Universal Oil Products Company (UOP)
- UOP 917-1993 PALLADIUM IN FRESH AND SPENT ALUMINA CATALYST BY SPECTROPHOTOMETRY
U.S. Military Regulations and Norms
- ARMY UFGS-44 13 52-2011 THERMAL (CATALYTIC) OXIDATION SYSTEMS
International Electrotechnical Commission (IEC)
- IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor Photocatalytic Oxidation,Semiconductor Photocatalytic Oxidation,semiconductor nitric oxide,What is the general photocatalytic activity of semiconductors?,1. Semiconductor Photocatalytic Oxidation,Semiconductor Photocatalytic Oxidation,Photocatalytic Oxidation of Semiconductors