total reflection x
total reflection x, Total:15 items.
The international standard classification for "total reflection x" includes: Semiconducting materials , Testing of metals , Chemical analysis .
The Chinese standard classification for "total reflection x" includes: Semimetal and semiconductor material in general , Metal physical property test method , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- GB/T 24578-2024 Test method for measuring surface metal contamination on semiconductor wafers —Total reflection X-Ray fluorescence spectroscopy
- GB/T 30701-2014 Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy
- GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
- GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water
German Institute for Standardization
- DIN 51003 E:2021-05 Total reflection x-ray fluorescence - Principles and definitions
- DIN 51003:2004 Total reflection x-ray fluorescence - Principles and definitions
- DIN 51003:2022 Total reflection X-ray fluorescence - Principles and definitions
- DIN 51003:2022-05 Total reflection x-ray fluorescence - Principles and definitions
- DIN 51003:2021-05 Draft Document - Total reflection x-ray fluorescence - Principles and definitions
- DIN 51003 E:2021 Draft Document - Total reflection x-ray fluorescence - Principles and definitions
International Organization for Standardization (ISO)
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
British Standards Institution (BSI)
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
- 24/30482073 DC BS ISO 20289 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
Japanese Industrial Standards Committee (JISC)
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
total reflection x-ray spectroscopy,total reflection x-ray fluorescence,Portable Total Reflection x Fluorescence,Total Reflection X-ray Fluorescence Analysis,total reflection x-ray fluorescence,total reflection,Total Reflection X-ray Fluorescence Spectroscopy,Total Reflection X-ray Fluorescence Analysis,Total Reflection X-ray Fluorescence,total reflection x fluorescence,Total Reflection x Fluorescence Analysis,total reflection x-ray,Total Reflection X-ray Fluorescence,total x-ray reflection,total x-ray reflection,total reflection fluorescence x-ray analysis,total reflection x fluorescence,Total Reflection X-ray Fluorescence,total reflection x-ray analysis,total reflection x
