total reflection
total reflection, Total:22 items.
The international standard classification for "total reflection" includes: Semiconducting materials , Testing of metals , Chemical analysis , Farming and forestry , Optics and optical measurements .
The Chinese standard classification for "total reflection" includes: Semimetal and semiconductor material in general , Metal physical property test method , Basic standards and general methods , Pesticide management and application method , Material and component for instrument and meter .
Tianjin Provincial Standard of the People's Republic of China
- DB12/T 1015-2020 Determination of Nitrogen and Phosphorus in Dung Water of Dairy Farms Mid-infrared Attenuated Total Reflectance Spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
- GB/T 30701-2014 Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy
- GB/T 24578-2024 Test method for measuring surface metal contamination on semiconductor wafers —Total reflection X-Ray fluorescence spectroscopy
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
农业农村部
- NY/T 3284-2018 Guidelines on the spectrum collection for solid formulation of pesticide by attenuated total reflection fourier transform infrared (ATR-FTIR) spectroscopy
Group Standards of the People's Republic of China
- T/CIE 173-2023 Infrared total reflection rain light sensor
Illuminating Engineering Society of North America
- IESNA LM-44-1990 Approved Method for Total and Diffuse Reflectometry
German Institute for Standardization
- DIN 51003 E:2021-05 Total reflection x-ray fluorescence - Principles and definitions
- DIN 51003:2004 Total reflection x-ray fluorescence - Principles and definitions
- DIN 51003:2022-05 Total reflection x-ray fluorescence - Principles and definitions
DIN
- DIN 51003:2022 Total reflection X-ray fluorescence - Principles and definitions
SCC
- DIN 51003 E:2021 Draft Document - Total reflection x-ray fluorescence - Principles and definitions
- VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 4-2011 X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors
International Organization for Standardization (ISO)
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 Blatt 4-2009 X-ray optical systems - X-ray mirrors - Total reflection mirrors and multi layer mirrors
SE-SIS
- SIS SS-ISO 7669:1988 Anodized aluminium and its alloys — Measurement of total reflectivity using a photoelectric reflectometer
Japanese Industrial Standards Committee (JISC)
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
British Standards Institution (BSI)
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
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