total reflection fluorescence
total reflection fluorescence, Total:7 items.
The international standard classification for "total reflection fluorescence" includes: Semiconducting materials , Chemical analysis .
The Chinese standard classification for "total reflection fluorescence" includes: Semimetal and semiconductor material in general , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 30701-2014 Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy
- GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
未注明发布机构
- DIN 51003:2022-05 Total reflection x-ray fluorescence - Principles and definitions
- DIN 51003 E:2021-05 Total reflection x-ray fluorescence - Principles and definitions
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
DIN
- DIN 51003:2022 Total reflection X-ray fluorescence - Principles and definitions
German Institute for Standardization
- DIN 51003:2004 Total reflection x-ray fluorescence - Principles and definitions
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