superconducting high frequency cavity
superconducting high frequency cavity, Total:75 items.
The international standard classification for "superconducting high frequency cavity" includes: Radiographic equipment , Testing of metals in general .
The Chinese standard classification for "superconducting high frequency cavity" includes: Medical ultrasound, laser, high-frequency instrument and equipment , Ophthalmic and ENT surgical devices , Radio Measurement , Semiconductor discrete devices in general , Technical management , Metal physical property test method .
Anhui Provincial Standard of the People's Republic of China
- DB34/T 3767-2020 Superconducting Cyclotron RF Resonator Technology Management Requirements
- DB34/T 3240-2018 Testing method of voltage distribution in superconducting cyclotron resonator cavity
- DB34/T 3241-2018 Automatic Exercise Method of Superconducting Cyclotron Resonant Cavity
National Metrological Technical Specifications of the People's Republic of China
- JJF(电子) 08-1982 High frequency and ultra high frequency phase verification method
工业和信息化部
- YB/T 4667-2018 Ultra high thermal conductivity graphite block
Professional Standard - Medicine
- YY 0849-2011 Ophthalmic high frequency ultrasound scanner
- YY/T 0849-2011 Ophthalmic high frequency ultrasound scanner
National Metrological Verification Regulations of the People's Republic of China
- JJG 308-1983 Verification Regulation of SHF Electronic Millivoitmeter
- JJG 319-1983 Verification Regulation of VHF Microvolt Meter
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 1905-2016 UHF radio frequency identification (RFID) chip test method
Professional Standard - Electron
- SJ 50033/160-2002 Semiconductor discrete devices Detail specification for type 3DG122 silicon UHF low-power transistor
- SJ 50033/159-2002 Semiconductor discrete devices Detail specification for type 3DG142 silicon UHF low-noise transistor
- SJ 50033/75-1995 Semiconductor discrete devices-Detail specification for Type 3DG135 silicon ultra high frequency low-power transistor
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 30537-2014 Superconductivity - Measurements for Bulk High Temperature Superconductors - Trapped Flux Density of Large Grain Oxide Superconductors
German Institute for Standardization
- DIN EN 300720:2017-05 Ultra-High Frequency (UHF) on-board vessels communications systems and equipment - Harmonised Standard covering the essential requirements of article 3.2 of the Directive 2014/53/EU (Endorsement of the English version EN 300 720 V2.1.1 (2017-01) as Ger...
RU-GOST R
- GOST 19656.4-1974 Semiconductor UHF mixer diodes. Measurement methods of conversion losses
- GOST 19656.5-1974 Semiconductor UHF mixer and detector diodes. Measurement methods of output noise ratio
- GOST 19656.3-1974 Semiconductor UHF mixer diodes. Measurement methods of output impedance at an intermediate frequency
- GOST 19656.14-1979 Semiconductor microwave switching diodes. Measurement method of critical frequency
- GOST 20215-1984 Semiconductor microwave diodes. General specifications
- GOST 19656.12-1976 Semicondactor UHF mixer diodes. Measurement method of input impedance
- GOST 19656.2-1974 Semiconductor UHF mixer diodes. Measurement method of rectified current
- GOST 19656.6-1974 Semiconductor UHF mixer diodes. Measurement methods of standard overall noise figure
- GOST 23221-1978 UNF modules, blocks. Terms, definitions and letter symbols
- GOST 19656.0-1974 Semiconductor UHF diodes. Measurement methods of electrical parameters. General conditions
- GOST 19656.1-1974 Semiconductor UHF mixer and detector diodes. Measurement method of voltage standing-wave ratio
- GOST 19656.16-1986 Semiconductor microwave limiter diodes. Measurement method of break-down and leakage powers
- GOST 19656.13-1976 Semiconductor UHF detector diodes. Measurement methods of tangential sensitivity
- GOST 19656.7-1974 Semiconductor UHF detector diodes. Measurement method of current sensitivity
- GOST 19656.10-1988 Semiconductor microwave switching and limiter diodes. Methods of measuring loss resistances
- GOST 19656.9-1974 Ultra-high frequency multiplication and parametric semiconductor diodes fixed time and limit frequency measurement methods
- GOST 19656.9-1979 Semiconductor microwave varactors and multiplier diodes. Methods of measuring time constant and limiting frequency
Korean Agency for Technology and Standards (KATS)
- KS C 6111-4-2007 Homogeneity in the surface resistance of large high-Tc superconductor films at microwave frequencies
- KS C 6111-3-2007 Electronic characteristic measurements-Intrinsic surface impedance of high-TC superconductor films at microwave frequencies
- KS C 6111-4-2007(2017) Homogeneity in the surface resistance of large high-Tc superconductor films at microwave frequencies
- KS C 6111-4-2022 Homogeneity in the surface resistance of large high-Tc superconductor films at microwave frequencies
- KS C 6111-4-2007(2022) Homogeneity in the surface resistance of large high-Tc superconductor films at microwave frequencies
British Standards Institution (BSI)
- BS EN IEC 61788-23:2024 Superconductivity - Residual resistance ratio measurement. Residual resistance ratio of cavity-grade Nb superconductors
- BS EN IEC 61788-7:2020 Superconductivity - Electronic characteristic measurements. Surface resistance of high-temperature superconductors at microwave frequencies
- BS EN IEC 61788-23:2021 Superconductivity. Residual resistance ratio measurement. Residual resistance ratio of cavity-grade Nb superconductors
- 23/30473276 DC BS EN IEC 61788-23. Superconductivity - Part 23. Residual resistance ratio measurement. Residual resistance ratio of cavity-grade Nb superconductors
- BS EN 61788-7:2002 Superconductivity - Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
- BS EN 61788-7:2007 Superconductivity - Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
SCC
- CEI EN IEC 61788-7:2020 Superconductivity Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
- DANSK DS/EN IEC 61788-7:2020 Superconductivity – Part 7: Electronic characteristic measurements – Surface resistance of high-temperature superconductors at microwave frequencies
International Electrotechnical Commission (IEC)
- IEC 61788-23:2021 Superconductivity - Part 23: Residual resistance ratio measurement - Residual resistance ratio of cavity-grade Nb superconductors
- IEC 61788-7:2020 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
- IEC 61788-23:2021 RLV Superconductivity - Part 23: Residual resistance ratio measurement - Residual resistance ratio of cavity-grade Nb superconductors
- IEC 61788-7:2020 RLV Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
Association Francaise de Normalisation
- NF EN IEC 61788-23:2021 Superconductivity - Part 23: measurement of the residual resistance ratio - Residual resistance ratio of Nb superconductors with cavities
- NF C31-888-23*NF EN IEC 61788-23:2021 Superconductivity - Part 23 : residual resistance ratio measurement - Residual resistance ratio of cavity-grade Nb superconductors
- NF EN IEC 61788-7:2020 Superconductivity - Part 7: measurements of electronic characteristics - Surface resistance of high critical temperature superconductors at microwave frequencies
KR-KS
- KS C IEC 61788-23-2023 Superconductivity — Part 23: Residual resistance ratio measurement — Residual resistance ratio of cavity-grade Nb superconductors
Danish Standards Foundation
- DS/EN IEC 61788-23:2021 Superconductivity – Part 23: Residual resistance ratio measurement – Residual resistance ratio of cavity-grade Nb superconductors
European Committee for Electrotechnical Standardization(CENELEC)
- EN IEC 61788-7:2020 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
ES-UNE
- UNE-EN IEC 61788-7:2020 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies (Endorsed by Asociación Española de Normalización in June of 2020.)
- UNE-EN IEC 61788-23:2021 Superconductivity - Part 23: Residual resistance ratio measurement - Residual resistance ratio of cavity-grade Nb superconductors (Endorsed by Asociación Española de Normalización in November of 2021.)
International Telecommunication Union (ITU)
- ITU-T G.241-1993 PILOTS ON GROUPS, SUPERGROUPS, ETC.
- ITU-T G.241 SPANISH-1993 PILOTS ON GROUPS SUPERGROUPS ETC.
- ITU-T G.241 FRENCH-1993 PILOTS ON GROUPS SUPERGROUPS ETC.
- ITU-R BT.1195-1-2013 Transmitting antenna characteristics at VHF and UHF
- ITU-R BS.1195-1-2013 Transmitting antenna characteristics at VHF and UHF
- ITU-R BT.798-1 SPANISH-1994 Digital Television Terrestrial Broadcasting in the VHF/UHF Bands
- ITU-R RAPPORT P.2011-1 FRENCH-1999 PROPAGATION AT FREQUENCIES ABOVE THE BASIC MUF
- ITU-R INFORME SM.2125-1 SPANISH-2011 Parameters of and measurement procedures on H/V/UHF monitoring receivers and stations
DIN
- DIN EN IEC 61788-23:2023 Superconductivity - Part 23: Residual resistance ratio measurement - Residual resistance ratio of cavity-grade Nb superconductors (IEC 61788-23:2021); German version EN IEC 61788-23:2021
PL-PKN
- PN-EN IEC 61788-7-2020-12 E Superconductivity -- Part 7: Electronic characteristic measurements -- Surface resistance of high-temperature superconductors at microwave frequencies (IEC 61788-7:2020)
- PN T84700-01-1988 VHF and U HF land mobile antennae General provisions
- PN T84700-02-1988 VHF and UHF land mobile antennae Electrical re?uirements
CZ-CSN
- CSN 35 8767 Cast.1-1984 Semiconductor mixing diodes for ultrahigh frequency. Methods of measuring noise ratio and standardized noise figu?e
Japanese Industrial Standards Committee (JISC)
- JIS H 7313:2007 Superconductivity -- Measurements for bulk high temperature superconductors -- Trapped flux density of large grain oxide superconductors
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC EIA-306-1965(R1999) Measurement of Small Signal HF, VHF, and UHF Power Gain of Transistors
United States Navy
- NAVY MIL-F-85675-1987 FILTER, UHF BANDPASS F-1556/ARC
- NAVY MIL-A-28959 (1)-1973 ANTENNA: ULTRA-HIGH FREQUENCY, 225 TO 400 MEGAHERTZ
- NAVY MIL-A-28959-1970 ANTENNA: ULTRA-HIGH FREQUENCY, 225 TO 400 MEGAHERTZ
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