gbt 6619 2009
gbt 6619 2009, Total:5 items.
The international standard classification for "gbt 6619 2009" includes: Semiconducting materials .
The Chinese standard classification for "gbt 6619 2009" includes: Semimetal and semiconductor material in general , Metal physical property test method , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 6619-1995 Test methods for bow of silicon slices
- GB/T 6619-2009 Test methods for bow of silicon wafers
- GB/Z 37839-2019 Information model covering the contents of GB/T 5094.1 and GB/T 5094.2,GB/T 16679, GB/T 18656 and GB/T 16901.3
中华人民共和国国家卫生和计划生育委员会
- GB/T 218-2009 Guidelines for Compilation of Occupational Disease Diagnostic Criteria (replacing GB/T 16854.1-1997)
CN-STDBOOK
- 图书 3-9486 Interpretation of GB/T 32862-2016, GB/T 32863-2016, GB/T 34543-2017, GB/T 34545-2017 Gem Grading National Standards
gbt 2910.24 2009,gbt 3784 2009,gbt 14783 2009,gbt 6619 2009,gbt 13821 2009,GB/t 1.1–2009,gbt 17396 2009,GB/T 6619,gbt 1553 2009,gbt 24580 2009,gbt 14735 2009,GB/T 24533 2009,gbt 12471 2009,gbt 24211 2009,gbt 19367 2009,gbt 23469 2009,gbt 23347 2009,gbt 23882 2009,gbt 24503 2009,GB/T 24281/2009
