semiconductor physics

semiconductor physics, Total:81 items.

The international standard classification for "semiconductor physics" includes: Aerospace electric equipment and systems , Chemical analysis , Semiconductor devices in general .

The Chinese standard classification for "semiconductor physics" includes: Electronic components , Industrial gas and chemical gas , Semiconductor discrete devices in general , Technical Management .

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Professional Standard - Aerospace

• QJ 10006-2008 General Specification for Semiconductor Integrated Circuits for Aerospace
• QJ 1906A-1997 器件
• QJ 1906-1990 器件
• QJ 1511A-1998 Semiconductor Discrete Devices - Specifications for Acceptance

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

• GJB 5914-2006 Methodsof destructive physical analysis for military semiconductor devices of all kinds of quality class

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

• GB/T 34971-2017 Guide for gaseous effluent handling in semiconductor industry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification

Group Standards of the People's Republic of China

• T/CASAS 002-2021 Terminology for wide bandgap semiconductors
• T/QGCML 3956-2024 Semiconductor laboratory constant humidity and temperature test management platform
• T/CECA 35-2019 Metal oxide semiconductor gas sensor
• T/CIECCPA 007-2024 Semiconductor Industry Nitrogen Oxide Emission Requirements

Jiangsu Provincial Standard of the People's Republic of China

• DB32/ 3747-2020 Pollutant Emission Standards for the Semiconductor Industry

Anhui Provincial Standard of the People's Republic of China

• DB34/ 4294-2022 Discharge Standards for Water Pollutants in the Semiconductor Industry

Professional Standard - Electron

• SJ/T 10149-1991 Graphic base of electronic components graphics of semiconductor discrete device
• SJ 2433-1984 Bonding sheet for semiconductor tubes

Military Standard of the People's Republic of China-General Armament Department

• GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor

ESD - ESD ASSOCIATION

• EP118-2007 Physics of Semiconductor Devices

European Committee for Electrotechnical Standardization（CENELEC）

• EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Defense Logistics Agency

• DLA SMD-5962-94532-1994 MICROCIRCUIT, CMOS, 64-BIT MICROPROCESSOR
• DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON
• DLA SMD-5962-94533-1994 MICROCIRCUIT, DIGITAL, CMOS, 32-BIT MICROPROCESSOR, MONOLITHIC SILICON
• DLA SMD-5962-90526 REV M-2004 MICROCIRCUIT, DIGITAL, CMOS, DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
• DLA SMD-5962-90678 REV A-2005 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT, MICROPROCESSOR, MONOLITHIC SILICON
• DLA SMD-5962-06208-2006 MICROCIRCUIT, DIGITAL, CMOS, DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
• DLA SMD-5962-93006 REV B-1999 MICROCIRCUIT, DIGITAL, CMOS, DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
• DLA SMD-5962-84052 REV D-1990 MICROCIRCUITS, DIGITAL, CMOS, 16 BIT MICROPROCESSOR, MONOLITHIC SILICON
• DLA SMD-5962-94537-1994 MICROCIRCUIT, DIGITAL, CMOS, 8-BIT MEMORY PROCESSING UNIT, MONOLITHIC SILICON
• DLA SMD-5962-94514 REV B-2004 MICROCIRCUIT, LINEAR, MICROPROCESSOR SUPERVISORY CIRCUIT, MONOLITHIC SILICON
• DLA SMD-5962-03245 REV A-2004 MICROCIRCUIT, DIGITAL, CMOS, FIXED-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON

American Society for Testing and Materials (ASTM)

• ASTM F637-85(1994)e1 Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices

British Standards Institution (BSI)

• BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
• BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
• BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
• BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
• BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
• BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
• BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
• BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system - Test method of sound variation detection
• BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
• BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices
• BS EN 62779-1:2016 Semiconductor devices. Semiconductor interface for human body communication. General requirements
• BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
• BS IEC 60747-6:2001 Discrete semiconductor devices and integrated circuits - Thyristors
• BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors
• BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
• BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers

SE-SIS

• SIS SEN 01 26 51-1969 Symbols for electrical diagrams Semi-conductors
• SIS SS IEC 617-5:1987 Graphical symbols for diagrams - Semiconductors and electron tubes

RU-GOST R

• GOST 22622-1977 Semiconductor materials. Terms and definitions

CZ-CSN

• CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
• CSN 35 8701 Z1-1997 Semiconductor naming

Association Francaise de Normalisation

• NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
• NF EN 62417:2010 Semiconductor Devices – Mobile Ion Testing for Metal Oxide Field Effect Semiconductor Transistors (MOSFETs)

Danish Standards Foundation

• DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Spanish Association for Standardization (UNE)

• UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)

International Electrotechnical Commission (IEC)

• IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
• IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
• IEC 60747-14-2:2000 Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements
• IEC 60747-8-4:2004 Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications

German Institute for Standardization

• DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
• DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985

SCC

• DANSK DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
• CEI EN 62417:2011 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
• BS IEC 60747-14-3:2001 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-Pressure sensors
• BS IEC 60747-14-1:2000 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-General and classification-Sensor generals and classification for semiconductor sensors
• IEC 60146:1973 Semiconductor convertors
• DANSK DS/EN IEC 63364-1:2023 Semiconductor devices – Semiconductor devices for IoT system – Part 1: Test method of sound variation detection
• CEI EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IoT system Part 1: Test method of sound variation detection

GSO

• GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
• GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

Standard Association of Australia （SAA）

• AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors

Lithuanian Standards Office

• LST EN 62417-2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)

JP-JEITA

• JEITA ED7500A-2-2006 Standard for the dimensions of semiconductor devices (Discrete semiconductor devices)

NEMA - National Electrical Manufacturers Association

• NEMA CB-4:1989 Semiconductor Graphite

Korean Agency for Technology and Standards (KATS)

• KS C 6587-1973(1998) GENERAL RULES FOR MECHANICAL STANDARDIZATION OF SEMICONDUCTOR INTEGRATED CIRCUITS
• KS C 5212-1981(2002) GENERAL RULES FOR RELIABILITY ASSURED DISCRETE SEMICONDUCTOR DEVICES
• KS C 5212-1981 GENERAL RULES FOR RELIABILITY ASSURED DISCRETE SEMICONDUCTOR DEVICES
• KS C 6587-1982 GENERAL RULES FOR MECHANICAL STANDARDIZATION OF SEMICONDUCTOR INTEGRATED CIRCUITS

National Fire Protection Association (NFPA)

• NFPA FPH SECTION 6-30-2003 Semiconductor Manufacturing

YU-JUS

• JUS N.R1.322-1979 Terms and definitions for semiconductor ?evices. Thyristors

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

• IEEE 256-1963 SEMICONDUCTOR DIODES

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