Transmission Electron Microscopy 2
Transmission Electron Microscopy 2, Total:28 items.
The international standard classification for "Transmission Electron Microscopy 2" includes: Physicochemical methods of analysis , Other standards related to analytical chemistry , Chemical analysis .
The Chinese standard classification for "Transmission Electron Microscopy 2" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer .
Professional Standard - Education
- JY/T 011-1996 General rules for transmission electron microscopy
- JY/T 0581-2020 General analysis rules for transmission electron microscope
Professional Standard - Machinery
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
工业和信息化部
- YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method
GSO
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
International Organization for Standardization (ISO)
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
Korean Agency for Technology and Standards (KATS)
- KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KR-KS
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
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