mass spectrometer ion
mass spectrometer ion, Total:11 items.
The international standard classification for "mass spectrometer ion" includes: Chemical analysis , Testing of metals , Semiconducting materials .
The Chinese standard classification for "mass spectrometer ion" includes: Basic standards and general methods , Semimetal and semiconductor material analysis method , Elemental semiconductor material , Chemical Measurement .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 39144-2020 Test method for magnesium content in gallium nitride materials—Secondary ion mass spectrometry
- GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- GB/T 41153-2021 Determination of boron,aluminum and nitrogen impurity content in silicon carbide single crystal―Secondary ion mass spectrometry
- GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 42263-2022 Determination of nitrogen content in silicon single crystal—Secondary ion mass spectrometry method
- GB/T 29851-2013 Test method for measuring boron and aluminium in silicon materials used for photovoltaic applications by secondary ion mass spectrometry
- GB/T 29852-2013 Test Method for Measuring Phosphorus, Arsenic and Antimony in Silicon Materials Used for Photovoltaic Applications by Secondary Ion Mass Spectrometry
Group Standards of the People's Republic of China
- T/CASAS 009-2019 Determination of Trace Impurities Concentration and Distribution in Semi-insulating SiC Materials by Secondary Ion Mass Spectrometry
- T/CASAS 010-2019 Determination of Trace Impurities Concentration and Distribution in GaN Materials by Secondary Ion Mass Spectrometry
Qinghai Provincial Standard of the People's Republic of China
- DB63/T 1849-2020 Determination of Lithium in Brine by Inductively Coupled Plasma Mass Spectrometry
National Metrological Technical Specifications of the People's Republic of China
- JJF 1159-2006 Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers
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