aes in xps

aes in xps, Total:17 items.

The international standard classification for "aes in xps" includes: Chemical analysis .

The Chinese standard classification for "aes in xps" includes: Basic standards and general methods .

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General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 34326-2017 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

Professional Standard - Electron

• SJ/T 10626-1995 Method for determining impurities in gold wire for semiconductor lead bonding by ICP-AES

Internet Engineering Task Force (IETF)

• RFC 6188-2011 The Use of AES-192 and AES-256 in Secure RTP
• RFC 5084-2007 Using AES-CCM and AES-GCM Authenticated Encryption in the Cryptographic Message Syntax (CMS)

International Organization for Standardization (ISO)

• ISO 16531:2020 Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
• ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

British Standards Institution (BSI)

• BS ISO 16531:2020 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
• 19/30399949 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
• 12/30241146 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
• BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

Universal Oil Products Company (UOP)

• UOP 303-2007 IMPURITIES IN CATALYSTS BY ICP-AES

American Society for Testing and Materials (ASTM)

• ASTM UOP303-87 Impurities in Catalysts by ICP-AES
• ASTM UOP714-87 Metals in Miscellaneous Samples by ICP-AES

Korean Agency for Technology and Standards (KATS)

• KS M 1062-2005 Determination of lead(Pb) and cadmium(Cd) in electronics byICP－AES/MS and AAS
• KS M 1064-2005 Determination of lead(Pb) and cadmium(Cd) in metals byICP－AES/MS and AAS

Society of Motion Picture and Television Engineers (SMPTE)

• SMPTE 338-2008 Format for Non-PCM Audio and Data in AES-3 - Data Types

Spanish Association for Standardization (UNE)

• AENOR UNE 92115:1997 Thermal insulating materials used in buildings. Extruded polystyrene (XPS) products. Specifications.

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