sj/t 11037-1996

sj/t 11037-1996, Total:442 items.

The international standard classification for "sj/t 11037-1996" includes: Screw threads in general , Test conditions and procedures in general , Medical Sciences and health care facilities in general .

Professional Standard - Electron

SJ/T 10928-1996 Potassium silicate solution for use in electronic industry - Methods of determination of nickel
SJ/T 10986-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5250CP SIF amplifiers
SJ/T 11105-1996 Metallic coatings - Test mothods for electrodeposited gold and gold alloy coatings - Part 1: Determination of coating thickness
SJ/T 11034-1996 Test method for d.c. disruptive strength of electronic glass
SJ/T 11008-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11235CP line and field sweep circuits
SJ/T 10935-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CF747 general dual operational amplifiers (Applicable for certification)
SJ/T 11145-1996 Technical requirements and testing methods for infrared remote control system of air-conditioners
SJ/T 11079-1996 General specification for mask alignment and exposure system
SJ/T 11001-1996 Detail specification for electronic components - Fixed aluminium electrolyte capacitors for Type CD291, CD292 and CD293 (Applicable for certification)
SJ/T 11106-1996 Metallic coatings-Test methods for electrodeposited gold and gold alloy coatings-Part 2:Environmental tests
SJ/T 11107-1996 Metallic coatings - Test methods for electrodeposited gold and gold alloy coatings - Part 3: Electrographic tests for porosity
SJ/T 10914-1996 Technical requirements for meteorogical facsimile (analog)
SJ/T 10734-1996 Letter symbols for semiconductor integrated circuits - Letter symbols for electrical parameters
SJ/T 10905-1996 Determination of lead oxide in electronic glass - Extraction/EDTA complexometric titration method
SJ/T 11018-1996 Methods of analysis for pure silver brazing for electronic devices-Determination of sulfur (iodimetric combustion method)
SJ/T 10932-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CC4013 CMOS dual D positive edge-triggered flip-flops (Applicable for certification)
SJ/T 10968-1996 Detailed specifications for electronic components - 3DD205A silicon NPN case-rated transistors for high frequency amplification (Applicable for certification)
SJ/T 10718-1996 Examples for preparation of design documents of electronic equipment
SJ/T 11099-1996 Tables for life testing Tables for best linear unblased estimate (BLUE) (Extreme-value distribution, Weibull distribution)
SJ/T 10916-1996 Packaging of color picture tubes
SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits
SJ/T 10691-1996 General specification for variable frequency and voltage power supplies
SJ/T 10778-1996 Detail specification for electronic components-Fixed aluminium electrolytic capacitors Assessment level E (Applicable for certification)
SJ/T 10951-1996 Detailed specifications for electronic components - 2CZ33 ambient-rated silicon rectifier diodes (Applicable for certification)
SJ/T 10745-1996 Mechanical and climatic test methods for semiconductor integrated circuits
SJ/T 10946-1996 Liquid flux for soldering (rosin based)
SJ/T 10844-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10106 ECL Triple 4, 3, 3-input NOR gate (Applicable for certification)
SJ/T 11061-1996 Inspection procedures for electrical performance test equipments for solar cells
SJ/T 11050-1996 prepreg for use as bonding sheet material in the fabrication of multilayer printed boards
SJ/T 10952-1996 Detailed specifications for electronic components - 2CZ323 ambient-rated silicon rectifier diodes (Applicable for certification)
SJ/T 10726-1996 General inspection principles of stampings
SJ/T 10818-1996 Semiconductor integrated circuits - General principles of measuring methods for D/A and A/D converters of non-linear circuits
SJ/T 10849-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10121 ECL4-channel 3-3-3-3 input AND-OR/OR-NAND gate (Applicable for certification)
SJ/T 11109-1996 Metallic coatings-Test methods for electrodeposited gold and gold alloy coatings-Part 5:Adhesion tests
SJ/T 11049-1996 Motors for recorders, Permanent magnet D. C. --General specification for
SJ/T 11052-1996 Detailed specifications for electronic components - 3DG162 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10984-1996 Detail specification for electronic components - Fixed tantalum capacitors with solid electrolyte for Type CA (Applicable for certification)
SJ/T 11108-1996 Metallic coatings - Test methods for electrodeposited gold and gold alloy coatings - Part 4: Determination of gold content
SJ/T 10983-1996 Detail specification for flat cable connectors, Type DC2
SJ/T 10813-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1020 TTL dual 4-input positive-NAND gate (Applicable for certification)
SJ/T 10904-1996 Determination of fluorine in electronic glass - Specific ion electrode methods
SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
SJ/T 11103-1996 Tables for life testing Tables for {1+1/M
SJ/T 10826-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0450 HTL dual peripheral positive AND drivers
SJ/T 10892-1996 Detail specification for electronic components-Silicon switching rectifier diode,Type 2CN31D
SJ/T 11077-1996 Guide to the drafting of specifications for microwave ferrites
SJ/T 10806-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for display drivers
SJ/T 10700-1996 General specification for solid state transmitter in LORAN - C navigation system
SJ/T 10911-1996 Video frequency connectors,Type SL12
SJ/T 10876-1996 Detail specification for electronic components-Fixed feed-through ceramic dielectric capacitors for Type CT52 (Applicable for certification)
SJ/T 11089-1996 Letter symbols for discrete semiconductor components
SJ/T 10917-1996 Requirements for camera tube yoke assemblies
SJ/T 11010-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD1124ACP SIF amplifying circuits
SJ/T 10959-1996 Detailed specifications for electronic components - 3CT320 case-rated avalanche triode thyristors (Applicable for certification)
SJ/T 11102-1996 Tables for life testing - Tables for simple linear unbiased estimate (Normal distribution and log normal distribution)
SJ/T 10879-1996 Semiconductor integrated audio circuits - General principles of measuring methods for audio preamplifiers
SJ/T 10766-1996 Detail specification of circular connectors for radio and associated sound equipment, Type YS1 (Applicable for certification)
SJ/T 10857-1996 Chrome blanks
SJ/T 10855-1996 Detail specification for electronic components - Fixed aluminium electrolyte capacitors for Type CD27 (Applicable for certification)
SJ/T 10933-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CC4518 CMOS dual decimal system synchronous counters (Applicable for certification)
SJ/T 11094-1996 Performance parameter and methods of measurement for medical X-ray image intensifier television system
SJ/T 11002-1996 Detail specification for electronic components - Fixed polypropylene film dielectric metal foil d.c. capacitors for Type CBB111 Assessment level E (Applicable for certification)
SJ/T 11085-1996 General specification for vertical turbomolecular pumps
SJ/T 10710-1996 Type designation for the magnetic heads of non-broadcast video tape recorders
SJ/T 10776-1996 Detail specification for electronic components-Fixed ceramic dielectric capacitors for Type CT1 Assessment level E (Applicable for certification)
SJ/T 11070-1996 Detailed specifications for electronic components - CH11 fixed polyester-polypropylene film dielectric metal foil DC capacitors - Assessment level E (Applicable for certification)
SJ/T 10998-1996 Detail specification for Electronic components - Fixed polypropylene film dielectric metal foil d.c. capacitors for Type CBB13 Assessment level E (Applicable for certification)
SJ/T 10881-1996 Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders
SJ/T 10796-1996 General specification for raised access floors for electrostatic protection
SJ/T 11091-1996 General specification for lead-tinned for electronic components
SJ/T 11080-1996 Cathode Ray Tube Reference Line Gauge Dimensions
SJ/T 10747-1996 colour codes for wire leads of microwave devices
SJ/T 10781-1996 Detailed specifications for electronic components - 37SX101Y22-DC01 color picture tubes (Applicable for certification)
SJ/T 10906-1996 Determination of baryta (BaO) in electronic glass-Barium sulfate weight method
SJ/T 10823-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2009 HTL triple 3-input positive-NAND gate
SJ/T 10829-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0453 HTL dual peripheral positive OR drivers
SJ/T 11146-1996 Audio-visual,video and television equipment and systems Synchronized tape/visual operating practice
SJ/T 10713-1996 Indoor electronic controllers
SJ/T 10808-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1000 TTL Quad 2-input positive-NAND gate (Applicable for certification)
SJ/T 10887-1996 Detailed specifications for electronic components -3DD102B bipolar transistors for low frequency amplification case (Applicable for certification)
SJ/T 10706-1996 Optimum size series for contours and windows of liquid crystal display devices
SJ/T 11058-1996 Detailed specifications for electronic components - 4CS1421 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)
SJ/T 10836-1996 Detailed specifications for electronic components - 3DK107A and 3DK107B bipolar switching transistors (Applicable for certification)
SJ/T 10785-1996 Detail specification for electronic components - Fixed polythylene-terephthalate film dielectric metal foil d.c. capacitors for Type CL10 Assessment level E (Applicable for certific
SJ/T 10991-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CW574CS voltage regulators for electronic tuners
SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits
SJ/T 11090-1996 The properties and the test methods for antistatic silk fabric of synthetic filament in electronic industry
SJ/T 10773-1996 Detailed specifications for electronic components - 3DK106A and 3DK106B bipolar switching transistors (Applicable for certification)
SJ/T 10883-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CDA7520 10-bit D/A converters (Applicable for certification)
SJ/T 11113-1996 Detail specification for electronic components, low power non-wirewound fixed resistors RJ13 type metal film fixed resistors assessment level E
SJ/T 10843-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10105 ECL Triple 2, 3, 2-input OR/NOR gate (Applicable for certification)
SJ/T 10830-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0454 HTL dual peripheral positive NOR drivers
SJ/T 10987-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits
SJ/T 10725-1996 Methods for determining main characteristics of measurement condenser microphones
SJ/T 10888-1996 Type designation system for magnetic heads of cassette tape recorders
SJ/T 10716-1996 Capability detail specification:single and double sided printed boards with plated-through holes
SJ/T 10947-1996 Detailed specifications for electronic components - FG341052 and FG343053 semiconductor green light emitting diodes
SJ/T 10692-1996 General specification for the transport mechanism of car audio cassette players
SJ/T 11081-1996 Preparation of outline drawings of cathode-ray tubes
SJ/T 10705-1996 Standard practice for inspection of surface quality of semiconductor lead-bonding wire
SJ/T 10799-1996 Detail specification for electronic component.Directly heated negative temperature coefficient thermistor for style MF53-1.Assessment level E
SJ/T 10761-1996 Classification and designation for names and models of ceramic dielectric materials for capacitors
SJ/T 11101-1996 Tables for life testing Tables for best linear unblased estimate (BLUE) (Normal distribution, log normal distribution)
SJ/T 10828-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0452 HTL dual peripheral positive NAND drivers
SJ/T 10965-1996 Detailed specifications for electronic components - 3CD546 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)
SJ/T 10737-1996 Semiconductor integrated circuits - General principles of measuring methods for ECL circuits
SJ/T 10774-1996 Detail specification for electronic components.Fixed low-power non-wirewound resistors.Type RT 14 carbon film fixed resistors.Assessment level E
SJ/T 10707-1996 Quartz crystal units - A specification in the Quality Assessment System for Electronic Components Part 2: Sectional specification - Capability approval Section 1: Blank detail specific
SJ/T 10834-1996 Detailed specifications for electronic components - CS111, CS112, CS113, CS114, CS115 and CS116 single-gate junction field-effect transistors (Applicable for certification)
SJ/T 10733-1996 Types and dimensions of single-hole mounting bushes of electronic components
SJ/T 11026-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of iron, cadmium and zinc (spectrophotometric-atomic absorption method)
SJ/T 10819-1996 Detailed specifications for electronic components - 35SX5B black and white picture tubes (Applicable for certification)
SJ/T 10816-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1040 TTL dual 4-input positive-NAND buffer (Applicable for certification)
SJ/T 10842-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10104 ECL Quad 2-input AND gate (Applicable for certification)
SJ/T 10769-1996 Detail specification for circular connectors for radio and associated sound equipment-Circular connectors,Type YL(Applicable for certification)
SJ/T 11110-1996 Matallic coatings - Electrodeposited silver and silver alloy coatings for engineering purposes
SJ/T 11025-1996 Analytical methods for silver copper brazing for electron device Determination of lead by atomic absorption spectrophotometry
SJ/T 10864-1996 Measurement of electrical properties of disk-seal tubes-General
SJ/T 10913-1996 General specification for crimping tools hand or power actuated
SJ/T 11055-1996 Detailed specifications for electronic components - 4CS119 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)
SJ/T 10982-1996 Detailed specifications for electronic components -2CC25 and 2CC30 silicon band variable capacitance diodes (Applicable for certification)
SJ/T 10874-1996 Detail specification for electronic components - Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors for Type CL21 Assessment level E (Applicable for certifi
SJ/T 10974-1996 Detailed specifications for electronic components - 3DD325 silicon NPN ambient-rated transistors for low frequency amplification (Applicable for certification)
SJ/T 2421-1996 Tinned copper clad wire for electronic components
SJ/T 11004-1996 Semiconductor TV integrated circuits - General principles of measuring methods for picture channel circuits
SJ/T 11098-1996 Test methods of VSWR of the waveguide feed-system for marine radar
SJ/T 11100-1996 Tables for life testing - Tables for simple linear unbiased estimate (Extreme-value distribution and Weibull distribution)
SJ/T 10945-1996 Type designation system for alundum powder for vacuum tubes
SJ/T 11012-1996 Method of analysis for pure silver brazing for electronic devices - Determination of magnesium and zinc (spectrophotometric-atomic absorption method)
SJ/T 10851-1996 Detail specification for electronic components - Fixed aiuminium electrolyte capacitors for Type CD13 (Applicable for certification)
SJ/T 10792-1996 Detailed specifications for electronic components - 33DX201A, 3DX201B and 3DX201C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10795-1996 Detail specification for general purpose rigid coaxial transmission line and its flange connectors
SJ/T 10943-1996 Test method for granulometric distribution of alundum powder for vacuum tubes - Density balance method
SJ/T 10885-1996 Detailed specifications for electronic components -3DA150B and 3DA150C bipolar transistors for high frequency amplification case (Applicable for certification)
SJ/T 11011-1996 Method of analysis for pure silver brazing for electronic devices - Determination of lead (spectrophotometric-dithizone method)
SJ/T 10746-1996 Procedures and rules for pattern evaluation of new products for semiconductor integrated circuits
SJ/T 10742-1996 Tolerances for electronic ceramic parts
SJ/T 10961-1996 Detailed specifications for electronic components - 3CG778 silicon PNP ambient-rated transistors for high frequency amplification (Applicable for certification)
SJ/T 10810-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1004 TTL Hex inverters (Applicable for certification)
SJ/T 10900-1996 Determination of arsenic (As2O3) in electronic glass
SJ/T 10732-1996 Type designation system for electronic tubes
SJ/T 11087-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7698CP horizontal and vertical sweep and chrominance processing circuits
SJ/T 10833-1996 Detailed specifications for electronic components - 3DG80 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10827-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0451 HTL dual peripheral positive AND drivers
SJ/T 10878-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CW723 multi-terminal adjustable voltage regulators (Applicable for certification)
SJ/T 10735-1996 Semiconductor integrated circuits General principles of measuring methods for TTL circuits
SJ/T 11093-1996 Series of turning numbers for variable vacuum capacitors
SJ/T 10915-1996 Methods for test for meteorological facsimile (analog
SJ/T 10701-1996 General specification for microwave radiometers
SJ/T 10779-1996 Detailed specifications for electronic components - 2CN41 silicon fast-switching rectifier diodes - Assessment level E (Applicable for certification)
SJ/T 11039-1996 Test method for annealing point and strain point of electronic glass
SJ/T 211.1-1996 Design documents for special equipment for eelctronic industry - Part 1: Completeness of design documents
SJ/T 11014-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of antimony (spectrophotometric-malichite green method)
SJ/T 10871-1996 Methods of measurement for electrical properties of disk-seal tubes - Methods of measurement for the three tone inter-modulation distortion
SJ/T 10731-1996 Tolerances for regular clearance screw threads
SJ/T 10925-1996 Potassium silicate solution for use in electronic industry - Methods of calculation of concentration and modulus
SJ/T 11051-1996 Specifications for printed boards for TV broadcast receivers
SJ/T 10939-1996 Determination of Cerium oxide in color picture tube glass
SJ/T 10693-1996 General specification for power supply system of SPC exchange
SJ/T 10882-1996 Semiconductor integrated circuits - General principles of measuring methods for linear amplifiers
SJ/T 11021-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of Pb, Bi, Zn, Cd, Fe, Mg, Al, Sn and Sb (spectrochemical method)
SJ/T 10751-1996 Detailed specifications for CJ40 fixed metalized paper dielectric DC capacitors
SJ/T 10897-1996 Determination of Co2O3 NiO and MnO2 in electronic glass - Atomic absorption method
SJ/T 10790-1996 Detailed specifications for electronic components - 3CG21B and 3CG21C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10780-1996 Detail specification for electronic components - Fixed mica dielectric capacitors for Type CY-0, 1, 2, 3 Assessment level E (Applicable for certification
SJ/T 10869-1996 Measurements of electrical properties of disk-seal tubes - Methods of measurement for power gain
SJ/T 10805-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators
SJ/T 10837-1996 Detailed specifications for electronic components -3DG131A, 3DG131B and 3DG131C ambient-rated bipolar transistors for high frequency amplification (Applicable for certification)
SJ/T 11042-1996 Test method for temperature (Tk-100) of electronic glass with volume resistivity of 100MΩ.cm
SJ/T 10825-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2013 HTL Hex inverters
SJ/T 10960-1996 Detailed specifications for electronic components - 3CG844 silicon PNP ambient-rated transistors for high frequency amplification
SJ/T 10719-1996 Examples for preparation of design documents used in electronic equipments
SJ/T 10886-1996 Detailed specifications for electronic components - 3DD201 bipolar transistors for low frequency amplification case (Applicable for certification)
SJ/T 10838-1996 Detailed specifications for electronic components - 2CZ201, 2CZ202 and 2CZ203 switching rectifier diodes (Applicable for certification)
SJ/T 10894-1996 Determination of Li2O Na20 and K20 in electronic glass - Atomic absorption method
SJ/T 211.4-1996 Design documents for special equipment for electronic industry - Part 4: Drafting of design documents
SJ/T 10797-1996 Symbols and other markings on hearing aids and related equipment
SJ/T 10866-1996 Measurements of electrical properties of disk-seal tubes - Methods of measurement for frequency position
SJ/T 10743-1996 Tungsten-cerium electrodes for inert gas arc welding, plasma welding and cutting
SJ/T 10782-1996 Detailed specifications for electronic components - 56SX101Y22-DC03 color picture tubes (Applicable for certification)
SJ/T 11035-1996 Test method for chemical stability for water resistance of electronic glass
SJ/T 11013-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of cadmium (spectrophotometric-atomic absorption method)
SJ/T 10902-1996 Determination of silica (SiO2) in electronic glass
SJ/T 10720-1996 Safety Terminology for electronic products
SJ/T 11112-1996 Metallic coatings - Test methods for electrodeposited silver and silver alloy coatings - Part 2: Adhesion tests
SJ/T 10703-1996 Radio frequency and coaxial cable assemblies-Part 2-2: Blank detail specification for flexible coaxial cable assemblies
SJ/T 10999-1996 Detail specification for electronic components - Fixed aluminium electrolyte capacitors for Type CD30 (Applicable for certification)
SJ/T 10696-1996 Semiconductor discrete device - Detail specification for Type QL50 in use for automotive nine diodes bridge rectifying modules
SJ/T 10697-1996 Electromechanical switches for use in electronic equipment-Part 5: Sectional specification for pushbutton switches-Section 1: Blank detail specification
SJ/T 10788-1996 Detailed specifications for electronic components - 3DG79 forward AGC low-noise transistor for high-frequency (Applicable for certification)
SJ/T 10990-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5612CP Picture chrominance signal processing circuits
SJ/T 10893-1996 General rules for chemical analysis of electronic glass
SJ/T 10901-1996 Determination of manganese dioxide in electronic glass - Potassium periodate oxidation method
SJ/T 10822-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2008 HTL dual 4-input positive-NAND gate
SJ/T 10922-1996 Potassium silicate solution for use in electronic industry - General rules of analysis
SJ/T 10909-1996 Determination of K2O Na2O and Li2O electronic glass - Flame spectroscopy
SJ/T 11033-1996 Test method for density of electronic glass - Sink-float comparator method
SJ/T 10992-1996 Detailed specifications for electronic components - 2CW412-473 voltage-regulating diodes (Applicable for certification)
SJ/T 11054-1996 Detailed specifications for electronic components - 3DG140 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 11009-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11215ACP PIF amplifying circuits
SJ/T 10807-1996 Detail specification for electronic component Glass passivated high voltage rectifier silicon stack for types 2CL61, 2CL62, 2CL63, 2CL64, 2CL65, 2CL66, 2CL67, 2CL68
SJ/T 10763-1996 The basic dimensions of ribbon spools for drum type printers
SJ/T 10824-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2010 HTL Quad 2-input positive-NAND gate
SJ/T 10771-1996 Detailed specifications for electronic components - 3DG111B (111C, 111E and 111F) ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10757-1996 Semiconductor integrated circuit audio circuit series and varieties
SJ/T 10702-1996 Methods of measurement for digital microwave relay links
SJ/T 11029-1996 Methods of analysis for gold-nickel brazing for electronic devices - Determination of nickel (Volumetric - EDTA method)
SJ/T 10729-1996 General specification for a.c. powder electro luminescent glass display devices
SJ/T 10752-1996 Detailed specifications for CJ41 fixed metalized paper dielectric DC capacitors
SJ/T 11114-1996 Type designation system for miniature driving-machines
SJ/T 10708-1996 Quartz crystal units - A specification in the Quality Assessment System for Electronic Components Part 3: Sectional specification - Qualification approval Section 1: Blank detail s
SJ/T 10846-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10110 ECL dual 3-input OR gate (3-output) (Applicable for certification)
SJ/T 10996-1996 Detail specification for electronic components-Fixed aluminium electrolyte capacitors for Type CD288 (Applicable for certification)
SJ/T 10770-1996 Detailed specifications for electronic components - 3DG130A-3DG130D ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10997-1996 Detail specification for electronic components - Fixed aluminium electrolyte capacitors for Type CD289 (Applicable for certification)
SJ/T 10814-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1027 TTL Triple 3-input positive-NAND gate (Applicable for certification)
SJ/T 10863-1996 Detailed specifications for electronic components - 47SX101Y22-DC05 color picture tubes (Applicable for certification)
SJ/T 11064-1996 Dumet wire
SJ/T 10755-1996 Test method for gold,silver and their alloy brazing for electronic devices-Test method for spittering
SJ/T 10760-1996 Designations for names and models of structure ceramic materials for electronic components
SJ/T 10841-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10102 ECL Quad 4-input NOR gate (Applicable for certification)
SJ/T 10976-1996 Detailed specifications for electronic components - QL62 silicon single phase bridge rectifiers (Applicable for certification)
SJ/T 10800-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for sense amplifiers
SJ/T 11027-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of magnesium (spectrophotometric-atomic absorption method)
SJ/T 10704-1996 Basic parameters requirements and methods of measurement on TV receiver with built-in satallite TV broadcast receiving unit
SJ/T 10840-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10101 ECL Quad 2-input OR/NOR gate (Applicable for certification)
SJ/T 10835-1996 Detailed specifications for electronic components - 3DK105A and 3DK105B bipolar switching transistors (Applicable for certification)
SJ/T 11053-1996 Detailed specifications for electronic components - 3DG182 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10940-1996 Determination of Chromium oxide (Cr2O3) in color picture tube glass
SJ/T 10815-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1030 TTL8 input positive-NAND gate (Applicable for certification)
SJ/T 10923-1996 (2) Methods for determination of total alkalinity in potassium silicate solution for use in electronic industry
SJ/T 11019-1996 Methods of analysis for pure silver brazing for electronic devices-Determination of Pb, Bi, Zn, Cd, Fe, Mg, Al, Sn and Sb (spectrochemical method)
SJ/T 10977-1996 Detailed specifications for electronic components - 2CK111, 2CK112 and 2CK113 silicon switching diodes (Applicable for certification)
SJ/T 10821-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2007 HTL Quad inverters
SJ/T 10690-1996 General specification for digital direct-current micro resistance measuring instruments
SJ/T 10759-1996 Dimensions of the plugs for hearing aids
SJ/T 10845-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10109 ECL dual 4,5-input OR/NOR gate (Applicable for certification)
SJ/T 10995-1996 Detail specification for electronic components - Fixed high-voltage ceramic capacitors for Type CT81 Assessment level E (Applicable for certification)
SJ/T 11059-1996 Detailed specifications for electronic components - CS4220A single-gate N-channel junction type field-effect transistors (Applicable for certification)
SJ/T 11104-1996 Metallic coatings-Electrodeposited gold and gold alloy coatings for engineering purposes
SJ/T 10798-1996 Detail specification for electronic component.Directly heated negative temperature coefficient thermistor for style MF11.Assessment level E
SJ/T 10783-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7176CP SIF amplifying circuits (Applicable for certification)
SJ/T 10789-1996 Detailed specifications for electronic components - 2CL24, 2CL25, 2CL27 and 2CL29 glass passivated and encapsulated high voltage silicon stacks (Applicable for certification)
SJ/T 10848-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10117 ECL dual 2-channel 2-3-input AND-OR/OR-NAND gate (Applicable for certification)
SJ/T 11078-1996 Detail specification for electronic components - Electronic tube of type FC-306 (Applicable for certification)
SJ/T 10868-1996 Measurements of electrical properties of disk-seal tubes - Methods of measurement for self-neutralization frequency
SJ/T 11068-1996 Fixed capacitors for use in electronic equipment - Part 4: Blank detail specification: Aluminium electrolytic capacitors with solid electrolyte Assessment level E (Applicable for ce
SJ/T 10908-1996 Determination of alumina (Al2O3) and zine oxide (ZnO) in electronic glass - EDTA complexiometric titration method
SJ/T 10969-1996 Detailed specifications for electronic components - 3DG2636 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)
SJ/T 11074-1996 Specification for plastic parts for color television sets
SJ/T 10929-1996 Methods for determination of heavy metals (Pb) in potassium silicate solution for use in electronic industry
SJ/T 11060-1996 Detailed specifications for electronic components - 3DG3130 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10764-1996 Information processing-Spools of printing ribbons for office machines and printing maching
SJ/T 10767-1996 Detail specification of circular connectors for radio and associated sound equipment, Type YS2 (Applicable for certification)
SJ/T 10715-1996 Capability detail specification:single and double sided printed boards with plain holes
SJ/T 10957-1996 Detailed specifications for electronic components - 4CS103 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)
SJ/T 10739-1996 Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
SJ/T 10985-1996 Methods for the designation of electrostatic deflecting electrodes of cathode-ray tubes
SJ/T 10847-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10111 ECL dual 3-input NOR gate (3-output) (Applicable for certification)
SJ/T 10975-1996 Detailed specifications for electronic components - 3CG1825 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)
SJ/T 11076-1996 Cores for inductors and transformers for telecommunications-Part 2:Guides to the drafting of performance specifications
SJ/T 10753-1996 Gold,silver and their alloy brazing for electronic devices
SJ/T 10744-1996 Glossary of terms for production of tungsten and molybdenum wires
SJ/T 11045-1996 Type designation system for lithium batteries
SJ/T 11095-1996 General specification for medical X-ray television equipment
SJ/T 10890-1996 Defect criteria in useful screen area for cathode ray tubes
SJ/T 10944-1996 Alundum powder for vacuum tubes
SJ/T 10762-1996 Ribbon cassettes used in serial matrix printers
SJ/T 11037-1996 Test method for thermal shock of electronic glass
SJ/T 10775-1996 Detail Specification for Electronic Components Low Power Non-wirewound Fixed Resistor RJ14 Type Metal Film Fixed Resistor Assessment Level E
SJ/T 10791-1996 Detailed specifications for electronic components - 3CX2014A, 3CX201B and 3CX201C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10877-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CF741 operational amplifiers (Applicable for certification)
SJ/T 10712-1996 Stationary valve regulated sealed (maintenance-free)lead-acid batteries
SJ/T 11022-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of tin (spectrophotometric C21H38BrN absorption method)
SJ/T 10801-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for magnetic memory drivers
SJ/T 10794-1996 Type designation system for glass used in electronic applications
SJ/T 10711-1996 Standard test condition for communication equipment used in the mobile services
SJ/T 10923-1996 Potassium silicate solution for use in electronic industry - Methods of determination of total alkalinity
SJ/T 10955-1996 Detailed specifications for electronic components - 3DG107 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10910-1996 Video frequency connectors, Type SL10
SJ/T 10889-1996 Variable ceramic vacuum capacitors for Type CKTB 400/7.5/60
SJ/T 10980-1996 Detailed specifications for electronic components - 2CC23 and 2CC28 silicon tuning variable capacitance diodes (Applicable for certification)
SJ/T 11072-1996 Type BNC radio-frequency coaxial connectors
SJ/T 10862-1996 Measurement of the performance characteristics of hearing aids for quality inspection for delivery purposes
SJ/T 11005-1996 Semiconductor TV integrated circuits - General principles of measuring methods for audio channel circuits
SJ/T 10861-1996 Test method for optical density of chrome blanks
SJ/T 10694-1996 Test methods for electrostatic protection system in manufacturing electronic products
SJ/T 10964-1996 Detailed specifications for electronic components - 3DD401 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)
SJ/T 10852-1996 Detail specification for electronic components - Fixed aluminium electrolyte capacitors for Type CD15 (Applicable for certification)
SJ/T 10854-1996 Detailed specifications for electronic components - CD26 fixed aluminum electrolyte capacitors (Applicable for certification)
SJ/T 11086-1996 Specification of gap sparker for type FD08, FD12 and FD15
SJ/T 11043-1996 Test method for high frequency dielectric losses and permittivity of electronic glass
SJ/T 11065-1996 Molybdenum-deposited tungsten target
SJ/T 10931-1996 Detailed specifications for electronic components - Semiconductor microcomputer integrated circuits - Cμ6800 8-bit microprocessors (Applicable for certification)
SJ/T 10870-1996 Measurements of electrical properties of disk-seal tubes - Methods of measurement for AM - PM conversion coefficient
SJ/T 10698-1996 Amorphous silicon reference solar cell
SJ/T 10924-1996 Potassium silicate solution for use in electronic industry - Methods of determination of silica content
SJ/T 11063-1996 Tungsten heater element
SJ/T 10784-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7609CP horizontal and vertical sweep circuits (Applicable for certification)
SJ/T 10722-1996 Zircon power for use in electronic glass
SJ/T 10787-1996 Detail specification for electronic components-Fixed polythylene-terephthalate film dielectric metal foil d.c. capacitors for Type CL12 Assessment level E (Applicable for certific
SJ/T 10728-1996 Blank detail specification of ceramic vacuum switch tubes for low-voltage circuit breakers
SJ/T 10804-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods for level translator
SJ/T 10891-1996 Inspection standards of glass bulbs for Cathode-Ray tubes
SJ/T 11032-1996 Methods of analysis for gold-copper and gold-nickel brazing for electronic devices-Determination of zinc (spectrophotometric atomic absorption method)
SJ/T 10903-1996 Determination of boron oxide(B2O3) in electronic glass
SJ/T 11084-1996 Detailed specifications for electronic components - FU-100F electronic tubes (Applicable for certification)
SJ/T 11083-1996 Detailed specifications for electronic components - FU-250F electronic tubes (Applicable for certification)
SJ/T 10978-1996 Detailed specifications for electronic components - 2CC21 and 2CC26 silicon tuning variable capacitance diodes (Applicable for certification)
SJ/T 10872-1996 Detail specification for electronic components.Fixed low-power non-wirewound resistors.Type RJ 15 metal film fixed resistors.Assessment level E
SJ/T 11111-1996 Metallic coatings - Test methods for electrodeposited silver and silver alloy coatings - Part 1: Determination of coating thickness
SJ/T 10930-1996 Potassium silicate solution for use in electronic industry - Methods for determination of chlorite
SJ/T 10865-1996 Measurements of electrical properties of disk-seal tubes - Methods of measurement for the frequency response characteristic
SJ/T 10756-1996 Type designation system for circular connectors for radio and associated sound equipment
SJ/T 11040-1996 Test method for viscosity of electronic glass at high temperature
SJ/T 37-1996 Model-drafting and designating methods of special equipment for electronics industry
SJ/T 211.2-1996 Design documents for special equipment for electronic industry-Part 2: Title blocks,addition list and item list of drawing
SJ/T 10896-1996 Determination of ZnO PbO Al2O3 and Sb2O3 in electronic glass - Atomic absorption method
SJ/T 11041-1996 Test method for impact resistance of electronic glass
SJ/T 10709-1996 Generic specification for piezoelectric ceramic buzzer chips
SJ/T 11031-1996 Methods of analysis for gold-copper and gold-nickel brazing for elelctronic devices - Determination of phophorus (spectrophotometric method)
SJ/T 10717-1996 Capability detail specification:multilayer printed boards
SJ/T 10754-1996 Test method for gold, silver and their alloy brazing for electronic devices - Test method for cleanness
SJ/T 10950-1996 Detailed specifications for electronic components - 2CZ322 ambient-rated silicon rectifier diodes (Applicable for certification)
SJ/T 142-1996 General specification for special equipment for electronic industry
SJ/T 10736-1996 Semiconductor integrated circuits - General principles of measuring methods for HTL circuits
SJ/T 10918-1996 Methods of measurement for camera tube yoke assemblies
SJ/T 10740-1996 Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories
SJ/T 10768-1996 Detail specification for circular connectors for radio and associated sound equipment - Circular connectors, Type YC (Applicable for certification)
SJ/T 10934-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CW7805 triple-terminal positive voltage regulators (Applicable for certification)
SJ/T 11047-1996 Detailed specifications for electronic components - CB14 fixed polystyrene film dielectric metal foil DC capacitors - Assessment level E (Applicable for certification)
SJ/T 11028-1996 Methods of analysis for gold-copper brazing for electronic devices - Determination of copper (Volumetric - EDTA method)
SJ/T 10802-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for peripheral drivers
SJ/T 10989-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5622CP PAL system chrominance signal processing circuits
SJ/T 10963-1996 Detailed specifications for electronic components - 3DG2271 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)
SJ/T 10749-1996 Detailed specifications for CJ11 fixed metalized paper dielectric DC capacitors
SJ/T 10994-1996 Detail specification for electronic components - Fixed high-voltage ceramic capacitors for Type CC81 Assessment level E (Applicable for certification)
SJ/T 11017-1996 Methods of analysis for pure silver drazing fro electronic devices - Determination of phosphorus (spectrophotometric phosphomolybdate method)
SJ/T 10938-1996 Method for measurement of light transmissivity (τ546) for color pictrure tube glass panel
SJ/T 11056-1996 Detailed specifications for electronic components - 4CS1191 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)
SJ/T 11016-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of bismuth (spectrophotometric strychnine-potasssium iodide method)
SJ/T 10898-1996 Determination of iron oxide and titania in electronic glass - Photometric method
SJ/T 10812-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1010 TTL Triple 3-input positive-NAND gate (Applicable for certification)
SJ/T 10907-1996 Determination of alumina (A12O3) in electronic glass - EDTA complexicretric titration method
SJ/T 10777-1996 Detail specification for electronic components-Fixed ceramic dielectric capacitors for Type CC1 Assessment level E (Applicable for certification)
SJ/T 10873-1996 Detail specification for electronic components - Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors for Type CL20 Assessment level E (Applicable for certific
SJ/T 11046-1996 Lithium-iodine battery for cardiac pacemaker
SJ/T 11003-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CB14433 31/2-bit A/D converters (Applicable for certification)
SJ/T 10937-1996 Method for measurement of chromaticity coordinates for color picture tube glass panel
SJ/T 1635-1996 Basic identification colours and code indications for electronics industrial pipelines
SJ/T 11097-1996 Test methods of radiation pattern of the slotted-waveguide antenna for marine radar
SJ/T 10970-1996 Detailed specifications for electronic components - 3DG3077 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)
SJ/T 11067-1996 Commonly used terms for semiconductor photoelectric materials and pyroelectric materials in infrared detecting materials
SJ/T 10748-1996 Detailed specifications for CJ10 fixed metalized paper dielectric DC capacitors
SJ/T 11038-1996 Test method for softening point of electronic glass
SJ/T 10967-1996 Detailed specifications for electronic components - 3DD203 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)
SJ/T 10993-1996 Detailed specifications for electronic components - 2CW380-411 voltage-regulating diodes (Applicable for certification)
SJ/T 10953-1996 Detailed specifications for electronic components - 2CZ324Q ambient-rated silicon rectifier diodes (Applicable for certification)
SJ/T 10724-1996 General specifciation for measurement condenser microphones
SJ/T 11030-1996 Methods of analysis for gold-copper and gold-nickel brazing for electronic devices-Determination of lead (spectrophotometric dithizone method)
SJ/T 10981-1996 Detailed specifications for electronic components - 2CC24 and 2CC29 silicon tuning variable capacitance diodes (Applicable for certification)
SJ/T 10858-1996 Test methods for surface flatness of glass substrate and chromium film
SJ/T 11044-1996 Detailed specifications for electronic components - UYF10 magnetic oxide cores - Assessment level A (Applicable for certification)
SJ/T 10895-1996 Determination of CaO SrO and MgO in electronic glass - Atomic absorption method
SJ/T 10954-1996 Detail specification for electronic components - Silicon switching diode, Type 2CK120 (Applicable for certification)
SJ/T 11069-1996 Detail specification for electronic components - Fixed ceramic dielectric capacitors for Type CS1 Assessment level E (Applicable for certification)
SJ/T 11073-1996 Type SMA radio-frequency coaxial connectors
SJ/T 11036-1996 Test method for average linear thermal expansion coefficent of electronic glass
SJ/T 10738-1996 Semiconductor integrated circuits - General principles of measuring methods for operational (voltage) amplifiers
SJ/T 10912-1996 Video frequency connectors,Type SL16
SJ/T 11088-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7680CP SIF amplifying circuits
SJ/T 10942-1996 Determination of sulfur (S) in color picture tube glass
SJ/T 10941-1996 Determination of chlorine (Cl)in color picture tube glass
SJ/T 10832-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7611CP PIF amplifying circuits
SJ/T 10988-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5132CP PIF amplifying circuits
SJ/T 143-1996 Silvered ceramic parts
SJ/T 10850-1996 Detail specification for electronic components - Fixed aluminium electrolyte capacitors for Type CD10 (Applicable for certification)
SJ/T 10811-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1008 TTL Quad 2-input positive-NAND gate (Applicable for certification)
SJ/T 10966-1996 Detailed specifications for electronic components - 3DD100C silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)
SJ/T 11082-1996 Measuring methods of the heater or filament current and voltage for electronic tubes
SJ/T 11048-1996 Detailed specifications for electronic components - Varistors for surge suppression - MYG1 varistors for over-voltage protection - Assessment level E (Applicable for certification)
SJ/T 11057-1996 Detailed specifications for electronic components - 4CS142 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)
SJ/T 11007-1996 Semiconductor TV integrated circuits - General principles of measuring methods for video signal and chrominance signal processing circuits
SJ/T 10699-1996 Insulation coordination for equipment within low-voltage systems. Part 3: Use of coatings to achieve insulation coordination of printed board assemblies
SJ/T 11015-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of iron (spectrophotometric-O-phenanthroline method)
SJ/T 10853-1996 Detail specification for electronic components-Fixed aluminium electrolyte capacitors for Type CD19 (Applicable for certification)
SJ/T 10958-1996 Detailed specifications for electronic components - 3CT320 case-rated reverse blocking triode thyristors (Applicable for certification)
SJ/T 10880-1996 Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders
SJ/T 11096-1996 Measuring methods for medical X-ray television equipments
SJ/T 10927-1996 Potassium silicate solution for use in electronic industry - Methods of determination of copper
SJ/T 10919-1996 Packaging of colour broadcasting TV receivers
SJ/T 10793-1996 Terms for glass used in electronic applications
SJ/T 10695-1996 Preparation of designed documents foor special tooling
SJ/T 10884-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10131 ECL dual D-type master-slave flip-flops (Applicable for certification)
SJ/T 11062-1996 Stranded tungsten wire
SJ/T 10723-1996 Auxiliary printed board information Part 3: Guidelines for artwork
SJ/T 10839-1996 Alkaline secondary cells,Type XY20
SJ/T 10772-1996 Detailed specifications for electronic components - 3DG201C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
SJ/T 10949-1996 Detailed specifications for electronic components - 2CZ321 ambient-rated silicon rectifier diodes (Applicable for certification)
SJ/T 10817-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1054 TTL4-channel 2-2-2-2 input AND OR INVENT gate (Applicable for certification)
SJ/T 10820-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2001 HTL dual 4-input positive-NAND gate
SJ/T 10727-1996 Blank detail specification of glass vacuum switch tubes for low-voltage circuit breakers
SJ/T 10750-1996 Detailed specifications for CJ30 fixed metalized paper dielectric DC capacitors
SJ/T 10972-1996 Detailed specifications for electronic components - 3DD207 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)
SJ/T 10979-1996 Detailed specifications for electronic components - 2CC22 and 2CC27 silicon tuning variable capacitance diodes (Applicable for certification)
SJ/T 11075-1996 Chemical analysis methods of raw materials used in ferrite materials
SJ/T 11066-1996 Detailed specifications for electronic components - Electromechanical all-or-nothing relays of assessed quality - Test schedules 3 - JZC-21F DC electromagnetic relays (Applicable for certification)
SJ/T 10971-1996 Detailed specifications for electronic components - 3DD204 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)
SJ/T 10920-1996 Test method for transport packages of broadcasting TV recievers
SJ/T 10899-1996 Determination of zirconia in electronic glass
SJ/T 10831-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7193CP chrominance processing circuits
SJ/T 11020-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of copper (iodimetric method)
SJ/T 10962-1996 Detailed specifications for electronic components - 3DA1514 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)
SJ/T 10926-1996 Potassium silicate solution for use in electronic industry - Methods of determination of iron
SJ/T 10875-1996 Detail specification for electronic components - Fixed feed-through ceramic dielectric capacitors for Type CC52 (Applicable for certification)
SJ/T 11024-1996 Methods of analysis for silver-copper brazing for electronic devices-Determination of antimony (spectrophotometric-atomic absorption method)
SJ/T 10765-1996 Generic specification of circular connectors for radio and associated sound equipment (Applicable for certification)
SJ/T 11071-1996 Type N radio-frequency coaxial connectors
SJ/T 10809-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1002 TTL Quad 2-input positive-NAND gate (Applicable for certification)
SJ/T 10758-1996 Semiconductor integrated circuit TV circuit series and varieties
SJ/T 10859-1996 Test method for chromium film and photoresist thickness of chrome blanks
SJ/T 10867-1996 Measurements of electrical properties of disk-seal tubes-Methods of measurement resonator unloaded Q
SJ/T 10948-1996 Detailed specifications for electronic components - FG313052, FG314053, FG313054 and FG314055 semiconductor red light emitting diodes
SJ/T 10860-1996 Test method for surface reflectivity of chromium film on chrome blanks
SJ/T 11000-1996 Detail specification for electronic components - Fixed aluminium electrolyte capacitors for Type CD110 (Applicable for certification)
SJ/T 10936-1996 Method of measurement for residue stress in color picture tube bulbs
SJ/T 10956-1996 Detailed specifications for electronic components - 4CS122 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)
SJ/T 10786-1996 Detail specification for electronic components-Fixed polythylene-terephthalate film dielectric metal foil d.c. capacitors for Type CL11 Assessment level E (Applicable for certific
SJ/T 10803-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for line circuits
SJ/T 10856-1996 Detail specification for electronic components - Fixed tantalum capacitors with solid electrolyte for Type CA42 Assessment level E (Applicable for certification)
SJ/T 11023-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of bismuth (spectrophotometric-atomic absorption method)
SJ/T 10921-1996 Potassium silicate solution for use in electronic industry - Methods for determination of potassium carbonate
SJ/T 10721-1996 Performance requirements and emthods of measurement for bobile station of public communication system
SJ/T 11092-1996 Series of dimensions of terminals for vacuum capacitors
SJ/T 211.3-1996 Design documents for special equipment for electronic industry - Part 3: Format of design documents
SJ/T 10973-1996 Detailed specifications for electronic components - 3DD200 bipolar transistors for silicon NPN low frequency amplification case (Applicable for certification)

电子工业部

SJ/T 10689-1996 Audiovisual, video and television equipment and system tape/slide synchronization operating procedures
SJ/T 10688-1996 Technical requirements and test methods for infrared remote control systems of air conditioners

未注明发布机构

LY/T 16619-1996

工业和信息化部

SJ/T 11577-2016 SJ/T 11394-2009 "Semiconductor Light Emitting Diode Test Methods" Application Guide

中华人民共和国国家卫生和计划生育委员会

WS/T 90-2017 Evaluation on the effect of water-improving for defluoridation

(U.S.) Builders Hardware Manufacturers Association

BHMA A156.20-2001 Strap and Tee Hinges, and Hasps R(1996)