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Database: 365,228(8 Aug 2026)

Content of doping elements

Content of doping elements, Total:22 items.

The international standard classification for "Content of doping elements" includes: Analytical chemistry , Nickel and chromium products , Testing of metals , Semiconducting materials .

The Chinese standard classification for "Content of doping elements" includes: Quartz crystal and piezoelectric element , Metal and alloy powder , Metal chemical property test method , Semimetal and semiconductor material in general , Metal physical property test method .


Professional Standard - Building Materials

  • JC/T 2132-2012 Determination of doped and trace elements in barium strontium titanate(BST)—Inductively coupled plasma atomic emission spectrometric method

Professional Standard - Agriculture

Professional Standard - Non-ferrous Metal

  • YS/T 1087-2015 Doped nickel cobalt manganese composite hydroxide
  • YS/T 1600-2023 Determination of trace impurity elements in silicon carbide single crystal —Glow discharge mass spectrometry

Sichuan Provincial Standard of the People's Republic of China

  • DB51/T 2044-2015 Determination method of impurity element content in high-purity vanadium pentoxide

Professional Standard - Ferrous Metallurgy

  • YB/T 6158-2023 Determination of trace impurity element content of metallic chromium by glow discharge mass spectrometry

Professional Standard - Commodity Inspection

  • SN/T 2081-2008 Determination of impurities in alumina—Inductively coupled plasma atomic emission spectrometric method (ICP-AES) with microwave dissolution

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 14847-1993 Test method for thickness of lightly doped silicon eqitaxial layers on heavily doped silicon substrates by infrared reflectance
  • GB/T 14847-2010 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance

Fujian Provincial Standard of the People's Republic of China

  • DB35/T 1146-2011 Determination of Impurity Element Content in Silicon Materials by Glow Discharge Mass Spectrometry

National Standardisation Body (ASRO)

Danish Standards Foundation

  • DS/EN 12938/AC:2001 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
  • DS/EN 12938:2001 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry

Lithuanian Standards Office

  • LST EN 12938-2000/AC-2003 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
  • LST EN 12938-2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry

American Society for Testing and Materials (ASTM)

  • ASTM F1528-94(1999) Standard Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry

Standards Norway

  • NS-EN 12938:1999 Methods for the analysis of pewter — Determination of alloying and impurity element contents by atomic spectrometry

Spanish Association for Standardization (UNE)

  • UNE-EN 12938:1999 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry

Swedish Institute for Standards

  • SS-EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry

Association Francaise de Normalisation

  • NF A06-902*NF EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry.

Magyar Szabványügyi Testület

German Institute for Standardization

  • DIN EN 12938:2000-10 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000