Common Photocatalytic Semiconductors
Common Photocatalytic Semiconductors, Total:30 items.
The international standard classification for "Common Photocatalytic Semiconductors" includes: .
The Chinese standard classification for "Common Photocatalytic Semiconductors" includes: .
未注明发布机构
- DIN CEN/TS 16599:2014*DIN SPEC 7397:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
Association Francaise de Normalisation
- XP CEN/TS 16599:2014 Photocatalysis - Determination of irradiation conditions to test the photocatalytic properties of semiconductor materials
- NF ISO 10677:2011 Céramiques techniques - Sources lumineuses UV destinée aux essais des matériaux photocatalytiques semi-conducteurs
- XP B44-014*XP CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- NF ISO 14605:2013 Céramiques techniques - Sources lumineuses destinées aux essais des matériaux photocatalytiques semi-conducteurs dans un environnement d'éclairage intérieur
- NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
- NF ISO 22197-4:2021 Technical ceramics - Test methods for the performance of semiconductor photocatalytic materials for air purification - Part 4: formaldehyde removal
- NF ISO 22197-5:2021 Technical ceramics - Test methods for the performance of semiconductor photocatalytic materials for air purification - Part 5: removal of methyl mercaptan
European Committee for Standardization (CEN)
- PD CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
Japanese Industrial Standards Committee (JISC)
- JIS R 1750:2012 Fine ceramics -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
- JIS R 1708:2016 Fine ceramics (Advanced ceramics, advanced technical ceramics) -- Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
British Standards Institution (BSI)
- BS PD CEN/TS 16599:2014 Photocatalysis. Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- BS ISO 19722:2017 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
- BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
- BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- BS ISO 13125:2013 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for antifungal activity of semiconducting photocatalytic materials
SCC
- DANSK DS/CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
- DIN CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
- 09/30186157 DC BS ISO 10677. Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
German Institute for Standardization
- DIN CEN/TS 16599:2014-07*DIN SPEC 7397:2014-07 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
GSO
- GSO ISO 19722:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
- BH GSO ISO 19722:2022 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
- GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
- OS GSO ISO 10677:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Ultraviolet light source for testing semiconducting photocatalytic materials
KR-KS
- KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
- KS L ISO 14605-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
International Organization for Standardization (ISO)
- ISO 19722:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
- ISO 13125:2013 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for antifungal activity of semiconducting photocatalytic materials
Defense Logistics Agency
- DLA MIL-PRF-19500 N-2005 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
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