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Database: 365,228(8 Aug 2026)

Spectral Quantitative Analyzer

Spectral Quantitative Analyzer, Total:176 items.

The international standard classification for "Spectral Quantitative Analyzer" includes: Optics and optical measurements , Analytical chemistry in general , Chemical laboratories. Laboratory equipment , Other standards related to analytical chemistry , Metrology and measurement. Physical phenomena (Vocabularies) , Chemical analysis , Measurement of electrical and magnetic quantities , Textiles in general , Cadmium, cobalt and their alloys .

The Chinese standard classification for "Spectral Quantitative Analyzer" includes: Optical Measurement , Radio Measurement , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Basic standards and general methods , Ionizating Radiation Measurement , Technical management , Heavy metals and their alloys analysis method .


Taiwan Provincial Standard of the People's Republic of China

National Metrological Verification Regulations of the People's Republic of China

Professional Standard - Machinery

  • JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
  • JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 32198-2015 Standard practice for general techniques of infrared quantitative analysis
  • GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
  • GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
  • GB/T 17359-2012 Microbeam analysis - Quantitative analysis using energy dispersive spectrometry
  • GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
  • GB/T 43968-2024 General rules for high performance liquid chromatography-atomic fluorescence spectrometry analysis method
  • GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
  • GB/T 29858-2013 Standard guidelines for molecular spectroscopy multivariate calibration quantitative analysis

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
  • JJF(石化)057-2021 Calibration Specification for Chromatographs(Flame Photometric Detectors) for Micro-sulfur in Gas

Professional Standard - Energy and Power Planning

  • DL/T 386-2010 Calibration for second derivative flame atomic emission spectrometer

Professional Standard - Electron

  • SJ/T 10234-1991 Spectrum analyzer for QF4031
  • SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum
  • SJ 20249-1993 Verification reguation of model BP28A LF spectrum analyzers
  • SJ/Z 3206.11-1989 General rules for analysis of quantities of emision spectrum
  • SJ 20251-1993 Verification reguation of model YH4020/YH4021/YH4022 spectrum analyzers

Professional Standard - Nuclear Industry

Group Standards of the People's Republic of China

  • T/SZBX 191-2024 Laser-Induced Breakdown Spectroscopy (LIBS) Online Coal Quality Analyzer
  • T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
  • T/CIS 17008-2024 Laser-induced breakdown spectrometer for metal materials analysis

Professional Standard - Textile

  • FZ/T 01144-2018 Textiles-Quantitative analysis of fiber-Near-infrared spectroscopy method

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

Shaanxi Provincial Standard of the People's Republic of China

  • DB61/T 1520-2021 Specification for performance evaluation of real-time fluorescence quantitative PCR analyzer

Military Standard of the People's Republic of China-General Armament Department

  • GJB 8805-2015 Calibration procedures for wideband spectrum analyzers

Professional Standard - Non-ferrous Metal

  • YS/T 536.7-2009 Methods for chemical analysis of bismuth—Determination of arsenic content—Atomic fluorescence spectrometric method
  • YS/T 536.11-2009 Method for chemical analysis of bismuth - Determination of mercury content - Atomic fluorescence spectrometric method

U.S. Air Force

British Standards Institution (BSI)

  • BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
  • BS EN 61290-1-1:1998 Optical spectrum analyzer
  • BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
  • BS EN 62129:2006 Calibration of optical spectrum analyzers
  • BS EN 61290-1-3:1998 Optical fibre amplifiers. Basic spectrum analyzers-Optical power meter
  • PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)
  • BS ISO 22309:2006 Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS)
  • BS EN ISO 23674:2022 Cosmetics. Analytical methods. Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
  • BS EN 61280-1-1:1998 Optical fibre amplifiers.Basic spectrum analyzers - Transmitter output optical power measurement for single-mode optical fibre cable
  • BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
  • BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
  • BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
  • BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
  • BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
  • BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • 21/30387777 DC BS EN ISO 23674. Cosmetics. Analytical methods. Direct determination of traces of mercury in cosmetics by thermal decomposition. Atomic absorption spectrometry (mercury analyzer)
  • BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters

International Organization for Standardization (ISO)

  • ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
  • ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
  • ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
  • ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
  • ISO 23674:2022 Cosmetics — Analytical methods — Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
  • ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

European Committee for Standardization (CEN)

  • CEN EN 62129-2006 Calibration of optical spectrum analyzers
  • CEN EN 62129-2006_ Calibration of optical spectrum analyzers
  • EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)

Association Francaise de Normalisation

  • NF C93-845:2006 Calibration of optical spectrum analyzers.
  • NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
  • NF EN 62129-1:2016 Calibration of wavelength measuring devices/optical frequency measuring devices - Part 1: optical spectrum analyzers
  • NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
  • NF EN ISO 23674:2022 Cosmetics - Analysis methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyzer)
  • NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
  • NF X11-672:1996 Particle size analysis. Photon correlation spectroscopy.
  • NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
  • NF T75-647*NF EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
  • NF C93-845-2*NF EN 62150-2:2011 Fibre optic active components and devices - Test and measurement procedures - Part 2 : ATM-PON transceivers.
  • NF A06-902*NF EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry.
  • NF EN ISO 13196:2015 Soil Quality – Rapid analysis of selected elements in soils using a portable or handheld energy dispersive X-ray fluorescence spectrometer

Spanish Association for Standardization (UNE)

  • UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
  • UNE-EN ISO 23674:2023 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)

European Committee for Electrotechnical Standardization(CENELEC)

  • EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers

Comitato Elettrotecnico Italiano

  • CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers
  • CEI EN 62129:2006 Calibration of optical spectrum analyzers

Swedish Institute for Standards

  • SS-EN 62129:2006 Calibration of optical spectrum analyzers
  • SS-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
  • SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

Danish Standards Foundation

International Electrotechnical Commission (IEC)

  • IEC PAS 62129:2004 Calibration of optical spectrum analyzers
  • IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
  • IEC 62129:2006 Calibration of optical spectrum analyzers
  • IEC TR 61276:1994 Nuclear Instrumentation - Guidelines for Selection of Metrologically Supported Nuclear Radiation Spectrometry Systems (Edition 1.0)

Japanese Industrial Standards Committee (JISC)

  • JIS C 6192:2008 Calibration of optical spectrum analyzers
  • JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
  • JIS C 6183-2:2018 Optical spectrum analyzers -- Part 2: Calibration method
  • JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
  • JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
  • JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

Association of German Mechanical Engineers

Korean Agency for Technology and Standards (KATS)

  • KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
  • KS C 6918-2020 Test methods of fiber-optic spectrum analyzer
  • KS C 6918-1995(2024) Test methods of fiber-optic spectrum analyzer
  • KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
  • KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
  • KS D ISO 22309-2011(2016) Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
  • KS D ISO 22309-2011(2021) Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
  • KS D ISO 22309-2021 Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
  • KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS D ISO 22489:2012 Microbeam analysis-Electron probe microanalysis-Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
  • KS D ISO 15472-2025 Surface chemical analysis ― X-ray photoelectron spectrometers — Calibration of energy scales
  • KS D ISO 17973:2011 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
  • KS D ISO 14707-2003(2023) Surface chemical analysis - Glow discharge emission spectroscopy (GD-OES) - Introduction
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 15470:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters

Czech Standards Institute (UNMZ)

  • CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters

South African Bureau of Standard

German Institute for Standardization

  • DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
  • DIN EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000
  • DIN EN 62129-1 E:2014 Draft Document - Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 86/468/CD:2014)
  • DIN EN 62129-1 E:2014-12 Draft Document - Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 86/468/CD:2014)
  • DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
  • DIN EN 62129-1 E:2012-06 Draft Document - Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 86/417/CD:2011)
  • DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
  • DIN EN 62129-1:2016-12 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
  • DIN EN 62129:2007-01 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006

Lithuanian Standards Office

American Society for Testing and Materials (ASTM)

  • ASTM E168-92 Standard Practice for General Techniques of Infrared Quantitative Analysis
  • ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM E137-82(1987) Method for evaluating mass spectrometers for quantitative analysis of batch samples
  • ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems

Gosstandart of Russia

  • GOST 4.450-1986 Product-quality index system. Instruments for spectral analysis. Nomenclature of indices
  • GOST 30508-1997 Lead concentrates. Method of spectrum analysis
  • GOST 1367.1-1983 Antimony. Spectral method for the determination of impurities without preliminary concentration
  • GOST 4.361-1985 Product-quality index system. Mass-spectrometric analysers. Index nomenclature

Ente Nazionale Italiano di Unificazione

  • UNI EN 14242:2004 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis
  • UNI EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
  • UNI EN ISO 5398-4:2008 Leather - Chemical determination of chromic oxide content - Part 4: Quantification by inductively coupled plasma - optical emission spectrometer (ICP-OES)
  • UNI 8776:1985 Spectral analysis of ferrous materials. Determination of calcium in steels. Method by rx fluorescence spectrometry.

The Directorate General of Specifications and Metrology (DGSM)

  • OS GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

Kingdom of Bahrain Testing and Metrology Directorate

  • BH GSO ISO 15632:2017 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales

Indonesia Standards

  • SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers

Bureau of Indian Standards

  • IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer
  • IS 15338-2003 Spectrometric Analysis of Cast Iron by Direct Reading Optical Emission Vacuum Spectrometer - Point to Plane Technique

Society of Automotive Engineers (SAE)

  • SAE AIR1255 Spectrum Analyzers for Electromagnetic Interference Measurements
  • SAE AIR1255-2009 Spectrum Analyzers for Electromagnetic Interference Measurements
  • SAE AIR1255-1971 Spectrum Analyzers for Electromagnetic Interference Measurements

GCC Standardization Organization

  • GSO ISO 23674:2024 Cosmetics — Analytical methods — Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
  • GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
  • GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

Institute of Electrical and Electronics Engineers (IEEE)

European Telecommunications Standards Institute (ETSI)

  • ETSI TR 103 977-2024 RFID Measurement methods for transmit spectrum using modern spectrum analysers

Standard Association of Australia (SAA)

  • AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters