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Database: 365,228(8 Aug 2026)
  1. HOME
  2. Standards for Conductive test piece

Conductive test piece

Conductive test piece, Total:108 items.

The international standard classification for "Conductive test piece" includes: Testing of metals , Semiconducting materials , Other methods of testing of metals , Measurement of electrical and magnetic quantities , Integrated circuits. Microelectronics , Optoelectronics. Laser equipment , Adhesives , Electricity. Magnetism. Electrical and magnetic measurements , Testing of metals in general .

The Chinese standard classification for "Conductive test piece" includes: Semimetal and semiconductor material analysis method , Metal physical property test method , Semimetal and semiconductor material in general , AC/DC electrical instrument recording instrument , Semiconductor integrated circuit , Microwave and millimeter wave diode and triode , Magnetic measurement instrument , Power semiconductor device and parts , Nonmetallic materials used for aviation and aerospace , Electromagnetic Measurement .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 42835-2023 Semiconductor integrated circuits—System on chip(SoC)
  • SPC GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots -- Non-contact measurement of photoconductivity decay by microwave reflectance method (TEXT OF DOCUMENT IS IN CHINESE)
  • GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
  • GB/T 14140-2025 Test method for measuring diameter of semiconductor wafer
  • GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
  • GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
  • GB/T 13789-2022 Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester
  • GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method
  • GB/T 28030-2011 Earth continuity tester
  • GB/T 13789-2008 Methods of measurement of the magnetic properties of magnetic sheet and strip by means of a single sheet tester

Professional Standard - Electron

  • SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer
  • SJ/T 11399-2009 Measurement methods for chips of light emitting diodes
  • SJ/T 11997.1-2025 Test methods of semiconductor laser chips for optical fiber communication Part 1: basic photoelectric characteristics

Professional Standard - Machinery

Group Standards of the People's Republic of China

  • T/SHMHZQ 042-2022 Thermal conductive graphite sheets for electronic products
  • T/IAWBS 011-2019 Test methods for measuring resistivity of conductive silicon carbide wafers with a noncontact eddy-current gauge

Professional Standard - Aerospace

  • QJ 1523-1988 Test Method for Resistivity of Conducting Resin

National Metrological Verification Regulations of the People's Republic of China

  • JJG 984-2004 Verification Regulation of Earth-Continuity Testers

Professional Standard - Ferrous Metallurgy

  • YB/T 4148-2006 Measurement method for magnetic property of small single sheet sample of electrical strip

未注明发布机构

German Institute for Standardization

  • DIN 30691 E:2024-06 Draft Document - Lightning current tests - flanges with electrically conductive gaskets
  • DIN 30691 E:2024 Draft Document - Lightning current tests - flanges with electrically conductive gaskets
  • DIN 50448:1998 Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
  • DIN 50435:1988 Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method
  • DIN 57472-509:1986 Testing cables, conductors and flexible wires Electrical strength testing of cables, conductors and wires
  • DIN 50441-4:1999 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 4: Slice diameter, diamter variation, flat diameter, flat length, flat depth
  • DIN VDE 0481-356:2003 Testing cables and conductors with test voltage

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

Defense Logistics Agency

Military Standards (MIL-STD)

International Electrotechnical Commission (IEC)

  • IEC 62047-9:2011/COR1:2012 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
  • IEC 62047-9:2011 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
  • IEC 62899-202-3:2019 Printed electronics - Part 202-3: Materials - Conductive ink - Measurement of sheet resistance of conductive films - Contactless method
  • IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
  • IEC PAS 61338-1-5:2010 Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

National Standardisation Body (ASRO)

  • STAS 10138-1975 PENETRANT RADIATION TESTING Guidances for radiographs viewing

Association Francaise de Normalisation

Polski Komitet Normalizacyjny (PKN)

  • PN T04850-1974 Information Processing Safety Standards in Industrial Control Systems
  • PN C99460-09-1986 Sampling of photographic light sensitive materials for testing Guide sampling of aerofilms
  • PN E04160 ArkusZ54-1973 Electric cables Me?hods of ?esting Te?t for resistant againt? gluing ol con- duc?ors
  • PN E04160-68-1988 Electric cables Methods of test Electrical test of conducting polymeric screen

European Committee for Electrotechnical Standardization（CENELEC）

  • EN 62047-9:2011 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS

Korean Agency for Technology and Standards (KATS)

  • KS M ISO 23559:2019 Plastics — Film and sheeting — Guidance on the testing of thermoplastic films
  • KS M ISO 23559-2019 Plastics — Film and sheeting — Guidance on the testing of thermoplastic films
  • KS M ISO 23559:2014 Plastics — Film and sheeting — Guidance on the testing of thermoplastic films
  • KS C IEC 62899-202-3:2021 Printed electronics — Part 202-3: Materials — Conductive ink —Measurement of sheet resistance of conductive films Contactless method
  • KS C IEC 62899-202-3-2021 Printed electronics — Part 202-3: Materials — Conductive ink —Measurement of sheet resistance of conductive films Contactless method

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

  • JEDEC JESD51-4-1997 Thermal Test Chip Guideline (Wire Bond Type Chip) Errata - September 1997; Replaces JEP129: 1997

Finnish Standards Institute

  • SFS-IEC 885-1:1989 Test method for electrical conductivity of wires. Not exceeding 450/750V in conductors and wires tested

Czech Standards Institute (UNMZ)

American Society for Testing and Materials (ASTM)

  • ASTM F673-90(1996)e1 Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage

Society of Motion Picture and Television Engineers (SMPTE)

  • SMPTE ST 183M-1996 Motion-Picture Film - Photographic Audio Level Test Films - Measurement of Photoelectric Output Factor

Swedish Institute for Standards

  • SS-EN ISO 24584:2022 Textiles - Smart textiles - Test method for sheet resistance of conductive textiles using non-contact type (ISO 24584:2022)

Australian/New Zealand Standard (AU-AS/NZS)

Swiss Association for Standardization (SNV)

International Civil Aviation Organization

  • ICAO 8071-2-2007 Manual on Testing of Radio Navigation Aids - Volume II: Testing of Satellite-based Radio Navigation Systems
  • ICAO 8071-1-2000 Manual on Testing of Radio Navigation Aids - Volume I: Testing of Ground-based Radio Navigation Systems

Yugoslav Association for Standardization

  • JUS N.C0.035-1983 Tatting of insulatad conductors and cables. Measurement of electrical resistance of conductors.

Argentine Institute of Standardization

Cuban Institute of Standards and Metrology

  • NC 66-100-1988 Electronic and Electrotechical Industry. Power Conductors Electric Tests

Institute of Electrical and Electronics Engineers (IEEE)

Electronic Components, Assemblies and Materials Association

  • ECA J-STD-002C-2007 Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires

Society of Automotive Engineers (SAE)

Association for Electrical, Electronic & Information Technologies (VDE)

Gosstandart of Russia

  • GOST 21573-1976 Multidisk electromagnetic clutches with magnetic-flux-conducting disks. Basic parameters and dimensions

British Standards Institution (BSI)

  • PAS 61338-1-5-2010 Waveguide type dielectric resonators – Part 1-5: General information and test conditions – Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (Edition 1.0)

How to measure conductivity,How to measure conductivity,How to measure conductivity,Conductive test piece

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