Infrared reflectance measurement method
Infrared reflectance measurement method, Total:3 items.
The international standard classification for "Infrared reflectance measurement method" includes: Semiconducting materials .
The Chinese standard classification for "Infrared reflectance measurement method" includes: Metal physical property test method , Semimetal and semiconductor material in general .
Group Standards of the People's Republic of China
- T/IAWBS 007-2018 Test method for thickness of 4H silicon carbide homo-epitaxial layers by infrared reflectance
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 14847-1993 Test method for thickness of lightly doped silicon eqitaxial layers on heavily doped silicon substrates by infrared reflectance
- GB/T 14847-2010 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance
Infrared reflection,reflective infrared,Infrared Spectral Reflectance,Infrared reflection,Infrared Spectral Reflectance,reflective infrared,Infrared Reflectance Spectrum,Reflection measurement method,near infrared reflection,Infrared + reflective,Infrared reflective infrared,reflectance infrared,reflectance infrared spectroscopy,Infrared + reflection,Reflection Infrared Instrument,reflectance infrared,Infrared reflectance,Infrared reflection test,Infrared reflectance measurement method,reflective infrared reflective infrared
