tem electron microscope

tem electron microscope, Total:200 items.

The international standard classification for "tem electron microscope" includes: Physicochemical methods of analysis , Laboratory medicine , Chemical analysis , Optical equipment , Ophthalmic equipment .

The Chinese standard classification for "tem electron microscope" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Magnifier and microscope , Chemical Measurement , Medical optical instrument and endoscope , General and microsurgical devices .

Professional Standard - Machinery

JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 8230.11-1999 Microscopes.Graticules for oculars
JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
JB/T 8230.9-1995 Microscope eyepiece series
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 7398.3-1994 Microscope Objective Thread
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 8230.2-1995 Microscope objective lens series
JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 2609-2015 Microscopes―Objectives
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB/T 9246-2008 Microscopes—Oculars (eyepieces)
GB 2609-1981 Object lens for microscopes series
GB/T 9247-2008 Microscopes—Condensers
GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
GB 9246-1988 Microscopes--Series of oculars(eyepieces)
GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
GB/T 26600-2024 Microscopes—Immersion liquid for light microscopy
GB/T 2609-2006 Microscopes - Objectives
GB/T 9246-1996 Microscopes-Oculars (eyepieces)
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 2609-1996 Microscopes--Objectives
GB/T 43748-2024 Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 27668-2023 Microscopes—Vocabulary for light microscopy
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 9247-1996 Microscopes-Condensers

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Education

JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 011-1996 General rules for transmission electron microscopy
JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy

Professional Standard - Medicine

YY 0067-2007 Micro-circulation microscopes
YY 0067-1992 Micro-circulation microscopes
YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
YY/T 0067-2007 Micro-circulation microscopes

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

Professional Standard - Petroleum

SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

Professional Standard - Ferrous Metallurgy

YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

American Society for Testing and Materials (ASTM)

ASTM STP 372-1965 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM RR-D22-1031 2009 D6281-Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
ASTM D6281-98 Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2025 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO 10934:2025 Microscopes — Vocabulary for light microscopy
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 9344:2011 Microscopes - Graticules for eyepieces
ISO/PRF 19012-4:2024 Microscopes
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes

British Standards Institution (BSI)

BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
BS ISO 10934:2025 Microscopes. Vocabulary for light microscopy
25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 9344:2016 Microscopes. Graticules for eyepieces
BS ISO 9344:2011 Microscopes. Graticules for eyepieces

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7148:1992 Microscope eyepieces
JIS B 7150:1993 Micrometer microscopes
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS B 7147:1993 Biological microscope objectives
JIS B 7141:1994 Microscope -- Screw thread for objectives
JIS B 7141:2003 Microscope -- Screw thread for objectives

GCC Standardization Organization

GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy

Association Francaise de Normalisation

NF ISO 15932:2014 Microbeam Analysis - Analytical Electron Microscopy - Vocabulary
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of confocal fluorescence microscopes for biological imaging

Korean Agency for Technology and Standards (KATS)

KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS I 0051-2019 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2024 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B 5601-1995 Micrometer microscopes
KS B 5601-1995(2021) Micrometer microscopes
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS B 5601-2021 Micrometer microscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
KS B ISO 19012-1:2016 Optics and photonics － Designation of microscope objectives － Part 1: Flatness of field/Plan
KS B ISO 11884-2-2011(2016) Optics and photonics － Minimum requirements for stereomicroscope － Part 2: High performance microscopes
KS B 5615-2016(2021) Biological microscope objectives
KS B 5615-1997 Biological microscope objectives
KS L 2010-2009(2024) Slide glasses for microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS B 5617-2013 Stage micrometer for biological microscope
KS B 5616-2023 Biological microscope eyepieces
KS B 5616-2018 Biological microscope eyepieces
KS B 5615-2021 Biological microscope objectives
KS B 5616-2013 Biological microscope eyepieces
KS L 2010-2009(2019) Slide glasses for microscope
KS B 5615-2016 Biological microscope objectives
KS B 5617-1993 Stage micrometer for biological microscope
KS B 5616-1981 Biological Microscope Eyepieces
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS B ISO 11884-2:2011 Optics and photonics － Minimum requirements for stereomicroscope － Part 2: High performance microscopes
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
DOD A-A-51689-1986 DISK, MICROMETER, MICROSCOPE EYEPIECE

Bureau of Indian Standards

IS 13108-2019 Optics and Photonics —— Microscopes —— Immersion Liquids for Light Microscopy ( Second Revision )

Magyar Szabványügyi Testület

MNOSZ 5534-1956 Microscope light mirror
MNOSZ 15577-1953 microscope light

Spanish Association for Standardization (UNE)

AENOR UNE 1059:1956 Microcopy.

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
IPC JEDEC J-STD-035A-2022 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Devices

Gosstandart of Russia

GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols

German Institute for Standardization

DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern

International Electrotechnical Commission (IEC)

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

American Society of Mechanical Engineers (ASME)

ASME B1.11-1958(R2016) Microscope Objective Thread Errata - July 1972
ASME B1.11-1958 Microscope Objective Thread Errata - July 1972

American National Standards Institute （ANSI)

ANSI B1.11-1958 Microscope Objective Thread
ANSI/ASME B1.11-1958 Microscope Objective Thread

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

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