Microscopic roughness measurement
Microscopic roughness measurement, Total:11 items.
The international standard classification for "Microscopic roughness measurement" includes: Testing of metals .
The Chinese standard classification for "Microscopic roughness measurement" includes: Metal physical property test method .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
Association of German Mechanical Engineers
- VDI VDE 2604-1971 Surface measurement methods Roughness inspection using interference microscopy
- VDI/VDE 2655 BLATT 1.1-2008 Optical measurement technology on microtopographies — Calibration of interference microscopes and depth setting standards for roughness measurement
- VDI/VDE 2655 BLATT 1.2-2010 Optical measurement technology on microtopographies — Calibration of confocal microscopes and depth setting standards for roughness measurement
- VDI/VDE 2655 Blatt 1.1-2005 Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
- VDI/VDE 2655 Blatt 1.2-2009 Optical measurement of microtopography - Calibration of confocal microscopes and depth setting standards for roughness measurements
- VDI/VDE 2655 BLATT 1.2-2010 Optical measurement technology on microtopographies — Calibration of confocal microscopes and depth setting standards for roughness measurement
- VDI/VDE 2655 BLATT 1.1-2008 Optical measurement technology on microtopographies — Calibration of interference microscopes and depth setting standards for roughness measurement
Japanese Industrial Standards Committee (JISC)
- JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
- JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
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