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Measuring Roughness Using Atomic Force Microscopy

Measuring Roughness Using Atomic Force Microscopy, Total:10 items.

The international standard classification for "Measuring Roughness Using Atomic Force Microscopy" includes: Testing of metals .

The Chinese standard classification for "Measuring Roughness Using Atomic Force Microscopy" includes: Metal physical property test method .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
  • GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films

Professional Standard - Nuclear Industry

  • EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

Group Standards of the People's Republic of China

  • T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)

Association of German Mechanical Engineers

  • VDI VDE 2604-1971 Surface measurement methods Roughness inspection using interference microscopy
  • VDI/VDE 2655 BLATT 1.1-2008 Optical measurement technology on microtopographies — Calibration of interference microscopes and depth setting standards for roughness measurement

Japanese Industrial Standards Committee (JISC)

  • JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
  • JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy

Gosstandart of Russia

  • GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope

American Society for Testing and Materials (ASTM)

  • ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy