SEM measurement method

SEM measurement method, Total:5 items.

The international standard classification for "SEM measurement method" includes: Optical equipment , Linear and angular measurements in general , Linear and angular measurements , Other standards related to analytical chemistry .

The Chinese standard classification for "SEM measurement method" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Material Protection .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 16594-1996 Micron grade lenght measurement by SEM
• GB/T 17722-1999 Gold-plated thickness measurement by SEM
• GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
• GB/T 16594-2008 General rules for measurement of length in micron scale by SEM

Professional Standard - Machinery

• JB/T 7503-1994 Thickness of Cross Section of Metal Coatings Scanning Electron Microscope Measuring Method

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