Semiconductor equipment quartz ring

Semiconductor equipment quartz ring, Total:95 items.

The international standard classification for "Semiconductor equipment quartz ring" includes: Semiconducting materials , Glass products , Plug-and-socket devices. Connectors , Electrical equipment of ships and of marine structures , Optoelectronics. Laser equipment , Integrated circuits. Microelectronics , Therapy equipment .

The Chinese standard classification for "Semiconductor equipment quartz ring" includes: Special electronic technology material , Quartz glass , Connector , Electrical, observation/communication and navigation equipment for vessel in general , Dedicated processing equipment , Semiconductor integrated circuit , Power semiconductor device and parts .

Group Standards of the People's Republic of China

T/CEMIA 023-2021 Quartz crucible for semiconductor monosilicon growth
T/NXCL 28-2024 Synthetic quartz crucible for semiconductor grade monocrystalline silicon growth
T/CEMIA 042-2024 Quartz tank for semi-conductor silicon wafer cleaning
T/CEMIA 024-2021 Quartz crucible manufacturing practices for semiconductor monosilicon growth
T/ZSA 224-2024 Equipment front end module
T/CASME 929-2023 Technical requirements for precision structural components of semiconductor equipment
T/ICMTIA CM0038-2024 High purity quartz crucible for semiconductor silicon single crystal production
T/QGCML 4167-2024 High purity quartz sand for semiconductor quartz crucible production
T/ZACA 041-2022 Mixed signal semiconductor device test equipment
T/CIET 940-2024 Semiconductor Thin Film Deposition Equipment Technical Specification
T/CEMIA 041-2024 Quartz ring for integrated circuit etching equipment
T/IAWBS 019-2023 Equipment front end module
T/GVS 014-2024 Evaluation specification for cryogenic vacuum pumps used in semiconductor equipment
T/CIET 941-2024 Semiconductor etching equipment
T/CEMIA 033-2023 Quartz glass furnace tubes for 8 inches (200mm) and 12 inches (300mm) for semiconductor manufacturing process
T/ZZB Q041-2022 Mixed signal semiconductor device test equipment

Professional Standard - Building Materials

JC/T 755-1988 Transparent quartz glass tubes for semiconductor technology
JC/T 597-1995 Transparent quartz glass tubes for semiconductors
JC/T 181-2011 Transparent quartz glass devices for semiconductor
JC/T 597-2011 Transparent quartz glass tubes for semiconductor
JC/T 2064-2011 Transparent quartz glass rods for semiconductor

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 15872-2013 Power supply interface for semiconductor equipment
GB 10292-1988 Semiconductor rectifier equipments for telecommunicat-ions
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB/T 44375-2024 Requirements for load ports of 300mm semiconductor equipment
GB/T 15136-1994 General principles of measuring methods for quartz clock and watch circuits of semiconductor integrated circuits
GB/T 22193-2008 Electrical installations in ships - Equipment - Semiconductor convertors
GB 9657-1988 Transparent quartz glass tubes for semiconductor technology

Professional Standard - Machinery

JB/T 8320-1996 Coated Quartz Glass Tubes Intended to Be Used in the Production Process of Power Semiconductor Devices

Professional Standard - Post and Telecommunication

YD 576-1992 Semiconductor rectifier equipments For telecommunications

Professional Standard - Medicine

YY/T 0998-2015 Semiconductor heating and/or cooling therapy equipment

Professional Standard - Electron

SJ/T 11762-2020 Requirements for semiconductor equipment manufacturing information tagging
SJ/T 11763-2020 Specification for human interface for semiconductor manufacturing equipment

Gosstandart of Russia

GOST 26239.5-1984 Semiconductor silicon and quartz. Method of impurities determination
GOST 26239.0-1984 Semiconductor silicon, raw materials for its production and quartz. General requirements for methods of analysis
GOST 26239.3-1984 Semiconductor selicon, raw materials for its production and quartz. Methods of phosphorus determination
GOST 26239.2-1984 Semiconductor selicon, raw materials for its production and quartz. Methods of boron determination
GOST 26239.1-1984 Semiconductor silicon, raw materials for its production and quartz. Method of impurities determination

SE-SIS

SIS SS-IEC 747:1991 Semiconductor devices — Discrete devices
SIS SEN 01 03 51-1966 Semiconductor devices Terminology
SIS SEN 01 03 51-1976 Semiconductor devices Terminology
SIS SS-IEC 748:1991 Semiconductor devices — Integrated circuits
SIS SEN 27 06-1962 Polycrystalline semiconductor rectifier stacks and equipments

Defense Logistics Agency

DLA MIL-DTL-19491 H-2002 SEMICONDUCTOR DEVICES, PACKAGING OF
DLA MIL-S-19500/173 A VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N389 and 2N424 (Navy)

BE-NBN

NBN C 95-001-1977 Semiconductor equipment. the term

British Standards Institution (BSI)

BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
BS 4417:1969 Specification for semiconductor rectifier equipments
BS IEC 62047-41:2021 Semiconductor devices. Micro-electromechanical devices. RF MEMS circulators and isolators
12/30258683 DC BS EN 62779-1. Semiconductor devices. Semiconductor interface for human body communication. General requirements
BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications

CZ-CSN

CSN 35 8720 Cast.1-1987 Semiconductor devices. Dimensions
CSN 35 8754-1973 Semiconductor devices. Transistors. Measurement of short-circuit output admittance
CSN 35 8797 Cast.8 IEC 747-8 ZA1+A2:1996 Semiconductor devices. Discrete devices. Part 8: Field-effect transistore
CSN 35 8756-1973 Semiconductor devices. Transistors Measurement of y-parameters
CSN 35 8742-1973 Semiconductor devices. Transistors. Measurement of cut-oíf currents
CSN 34 0415-1973 Screwless terminals for connecting copper of eonductors

National Electrical Manufacturers Association（NEMA)

NEMA CB-4:1989 Semiconductor Graphite
NEMA RI 6-1959 ELECTROCHEMICAL PROCESSING SEMICONDUCTOR RECTIFIER EQUIPMENT

Semiconductor Equipment and Materials International (SEMI)

SEMI S2-0310e-2012 ENVIRONMENTAL, HEALTH, AND SAFETY GUIDELINE FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT
SEMI S22-1110b-2011 SAFETY GUIDELINE FOR THE ELECTRICAL DESIGN OF SEMICONDUCTOR MANUFACTURING EQUIPMENT

AT-OVE/ON

OVE EN IEC 63244-1:2020 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications (IEC 47/2653/CDV) (english version)

YU-JUS

JUS N.A3.500-1980 Semiconductor devices. Graphical symbols

RO-ASRO

STAS 6360-1974 SEMICONDUCTOR MATERIALS AND DEVICES Terminology
STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties

Korean Agency for Technology and Standards (KATS)

KS C IEC 60204-33-2010(2020) Safety guideline for semiconductor fabrication equipment
KS C IEC 60204-33-2020 Safety guideline for semiconductor fabrication equipment
KS C IEC 62047-5:2015 Semiconductor devices - MEMS devices - Part 5: RF MEMS switches

American National Standards Institute （ANSI)

ANSI/NFPA 318-2011 Standard for the Protection of Semiconductor Fabrication Facilities

IN-BIS

IS 6619-1972 Safety Specifications for Semiconductor Rectifier Equipment
IS 3136-1965 Polycrystalline Semiconductor Rectifier Equipment Specification
IS 5000 OC.3-1969 Dimensions of Semiconductor Equipment Case Outline OC3
IS 5000 OC.1-1969 Dimensions of Semiconductor Equipment Case Outline OC1
IS 5000 OC.5-1969 Dimensions of Semiconductor Equipment Case Outline OC5

European Committee for Electrotechnical Standardization（CENELEC）

EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
EN 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
EN 62047-5:2011 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
EN 62047-5:2012 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses

Danish Standards Foundation

DS/EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
DS/EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
DANSK DS/IEC 60092-304 ED4:2022 Electrical installations in ships – Part 304: Equipment – Semiconductor converters
DS/EN 62047-5:2011 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches

Association Francaise de Normalisation

NF EN 62779-1:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 1 : exigences générales
NF C63-244-1*NF EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1 : general requirements and specifications
NF C96-779-2*NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2 : characterization of interfacing performances

International Electrotechnical Commission (IEC)

IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD30E-2008 Descriptive Designation System for Semiconductor-device Packages

IECQ - IEC: Quality Assessment System for Electronic Components

PQC 82-1989 Semiconductors for Use in Electronic Equipment: Sectional Specification: Semiconductor Integrated Circuits Excluding Hybrid Circuits
PQC 83 ISSUE 1.1-1989 Generic Specification: Quartz Crystal Units for Use in Electronic Equipment

GCC Standardization Organization

BH GSO IEC 60092-304:2024 Electrical installations in ships - Part 304: Equipment - Semiconductor converters

Swedish Institute for Standards

SS-IEC 60092-304:2023 Electrical installations in ships - Part 304: Equipment - Semiconductor convertors

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