X-ray thin film reflectometer
X-ray thin film reflectometer, Total:43 items.
The international standard classification for "X-ray thin film reflectometer" includes: Other standards related to optics and optical measurements , Chemical analysis .
The Chinese standard classification for "X-ray thin film reflectometer" includes: Electron optics and other physical optics instrument , Basic standards and general methods .
National Metrological Technical Specifications of the People's Republic of China
- JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
Professional Standard - Machinery
- JB/T 11144-2011 X-ray diffractometer
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 9400-2010 Specification of X-ray diffractometer
工业和信息化部
- HG/T 5854-2021 Optical functional films--Coated reflective film
- HG/T 5676-2020 Silver reflective film with high reflectivity
未注明发布机构
- DIN EN ISO 17636-1 E:2010-11 Non-destructive radiographic examination of welds Part 1 X-ray and gamma-ray techniques with thin films (draft)
- NF A89-510-1*NF EN ISO 17636-1:2013 Non-destructive testing of welds - Radiographic testing - Part 1: X- and gamma-ray techniques with film
- DIN EN ISO 17636-1 E:2021-05 Non-destructive radiographic examination of welds Part 1 X-ray and gamma-ray techniques with thin films (draft)
- DIN 51003 E:2021-05 Total reflection x-ray fluorescence - Principles and definitions
- DIN 51003:2022-05 Total reflection x-ray fluorescence - Principles and definitions
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 36053-2018 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 6-2018 X-ray optical systems - Reflexion zone plates
PL-PKN
- PN C99282-06-1989 Radiographic medical films Qualitative and usable characteristic of films for X-ray radiography
SCC
- VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors
- VDI/VDE 5575 BLATT 6:2018 X-ray optical systems — reflection zone plates
American Society for Testing and Materials (ASTM)
- ASTM E2444-05 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2444-11 Terminology Relating to Measurements Taken on Thin, Reflecting Films
RU-GOST R
- GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
- GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
- GOST R IEC 61953-2001 Diagnostic X-ray imaging equipment. Characteristics of mammographic anti-scatter grids
Korean Agency for Technology and Standards (KATS)
- KS A 4729-1997 Anti - scatter grids
- KS D ISO 16413:2021 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Japanese Industrial Standards Committee (JISC)
- JIS Z 4328:1984 Radiation survey meters for X and gamma rays
- JIS Z 4816:1975 Back scattering X-ray reducing paints
- JIS Z 4818:1984 Reducing materials for back scattering X-rays
- JIS Z 4606:2007 Industrial X-ray apparatus for radiographic testing
Society of Automotive Engineers (SAE)
- SAE AMS2521C-2013 Coating, Reflection-Reducing for Instrument Glasses
International Organization for Standardization (ISO)
- ISO 17636-1:2013 Non-destructive testing of welds - Radiographic testing - Part 1: X- and gamma-ray techniques with film
- ISO 16413:2013 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
- ISO 16413:2020 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
KR-KS
- KS D ISO 16413-2021 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Association Francaise de Normalisation
- NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
British Standards Institution (BSI)
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- BS ISO 16413:2020 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
- BS ISO 16413:2013 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements alignment and positioning, data collection, data analysis and reporting
International Electrotechnical Commission (IEC)
- IEC 61953:1997 Diagnostic X-ray imaging equipment - Characteristics of mammographic anti-scatter grids
German Institute for Standardization
- DIN 51003:2004 Total reflection x-ray fluorescence - Principles and definitions
DIN
- DIN 51003:2022 Total reflection X-ray fluorescence - Principles and definitions
Indonesia Standards
- SNI 18-6938-2002 Specification of X-rays or Y-rays radiation portable surveymeter
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 4-2011 X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors
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