GB/T 36053-2018 in English
VALIDEvaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
- Issued on:2018-03-15
- Implemented on:2019-02-01
- File Format:PDF
- Delivery:Via email within 5 business days
$418.00
《GB/T 36053-2018X射线反射法测量薄膜的厚度、密度和界面宽度 仪器要求、准直和定位、数据采集、数据分析和报告》由TC38(全国微束分析标准化技术委员会)归口,TC38SC2(全国微束分析标准化技术委员会表面化学分析分会)执行,主管部门为国家标准化管理委员会。
Introduction
*** Please note: This description may not be accurate, please refer to the official documentation.

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