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Spectrometer parameters

Spectrometer parameters, Total:17 items.

The international standard classification for "Spectrometer parameters" includes: Other standards related to analytical chemistry , Chemical analysis .

The Chinese standard classification for "Spectrometer parameters" includes: Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
  • GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
  • GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
  • GB/T 25187-2010 Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
  • GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters

Professional Standard - Machinery

  • JB/T 8231-1999 The basic parameters of the plane-gratings spectrographs

Korean Agency for Technology and Standards (KATS)

  • KS D ISO 15471-2020 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 15471-2005(2020) Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters

British Standards Institution (BSI)

  • BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters

RU-GOST R

  • GOST 26874-1986 Ionizing radiation power spectrometers. Methods of basic parameters measurement

SCC

  • BS ISO 15471:2004 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
  • BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters

International Organization for Standardization (ISO)

  • ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

German Institute for Standardization

  • DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...

CZ-CSN

  • CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters