Spectral Analysis Parameters
Spectral Analysis Parameters, Total:200 items.
The international standard classification for "Spectral Analysis Parameters" includes: Chemical analysis .
The Chinese standard classification for "Spectral Analysis Parameters" includes: Basic standards and general methods .
Group Standards of the People's Republic of China
- T/GAIA 039-2026 Technical requirements and testing methods for the full spectrum multi-parameter water quality online analyzer
- T/QGCML 4229-2024 Spectral multi-source data analysis software
Taiwan Provincial Standard of the People's Republic of China
- CNS 14341-1999 Optical spectrum analyzer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
- GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
Czech Standards Institute (UNMZ)
- CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
British Standards Institution (BSI)
- BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
- BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
- BS DD IEC/PAS 61290-3-1:2002 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters-Optical spectrum analyzer
- BS EN 61290-3-2:2009 Optical amplifiers. Test methods. Noise figure parameters. Electrical spectrum analyzer method
- BS EN 61290-3-2:2008 Optical amplifiers - Test methods - Noise figure parameters - Electrical spectrum analyzer method
- BS EN 61290-2-1:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Optical spectrum analyzer
- BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
- BS EN 61290-5-1:2000 Optical fibre amplifiers. Basic specification. Test methods for reflectance parameters-Optical spectrum analyser
- BS ISO 14594:2024 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
- BS EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Electrical spectrum analyzer
- BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
- BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
- BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
- BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- 23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- BS EN 61290-1-2:1998 Optical fibre amplifiers. Basic specification-Test methods for gain parameters. Electrical spectrum analyzer
- BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-3-2:2003 Optical fibre amplifiers - Basic specification - Test methods for noise figure parameters - Electrical spectrum analyzer method
- BS EN 61290-1-1:2007 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
- BS ISO 14594:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- 19/30398879 DC BS EN 61290-1-1. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-5-2:2004 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Electrical spectrum analyser method
- BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS EN 61290-1-1:1998 Optical spectrum analyzer
Danish Standards Foundation
- DANSK DS/EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DANSK DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DANSK DS/EN 61290-1-1:2015 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DANSK DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DANSK DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- DANSK DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
Swedish Institute for Standards
- SS-EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- SS-EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- SS-EN IEC 61290-1-1:2021 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- SS-EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- SS-EN 61290-5-2:2004 Optical fibre amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- SS-EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- SS-EN 61290-2-2:2002 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
- SS-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
Korean Agency for Technology and Standards (KATS)
- KS C IEC 61290-3-1-2005(2020) Optical amplifiers - Test methods - Part 3 - 1: Noise figure parameters - Optical spectrum analyzer method
- KS C IEC 61290-5-1-2007(2022) Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-3-1-2020 Optical amplifiers - Test methods - Part 3 - 1: Noise figure parameters - Optical spectrum analyzer method
- KS C IEC 61290-5-1-2007(2017) Optical amplifiers - Test methods - Part 5 - 1: Reflectance parameters - Optical spectrum analyzer method
- KS C IEC 61290-3-1-2005(2025) Optical amplifiers — Test methods — Part 3-1: Noise figure parameters — Optical spectrum analyzer method
- KS C IEC 61290-3-1:2005 Optical amplifiers - Test methods - Part 3 - 1: Noise figure parameters - Optical spectrum analyzer method
- KS C IEC 61290-3-1-2025 Optical amplifiers — Test methods — Part 3-1: Noise figure parameters — Optical spectrum analyzer method
- KS C IEC 61290-5-1-2022 Optical amplifiers - Test methods - Part 5 - 1: Reflectance parameters - Optical spectrum analyzer method
- KS D ISO 14594-2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS C IEC 61290-3-2-2020 Optical amplifiers - Part 3 - 2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS C IEC 61290-3-2-2005(2020) Optical amplifiers - Part 3 - 2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- KS C IEC 61290-3-2:2005 Optical amplifiers - Part 3 - 2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61290-3-2-2005(2025) Optical amplifiers — Part 3-2: Test methods for noise figure parameters — Electrical spectrum analyzer method
- KS C IEC 61290-10-1-2005(2020) Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS D ISO 15470:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61290-3-2-2025 Optical amplifiers — Part 3-2: Test methods for noise figure parameters — Electrical spectrum analyzer method
- KS C IEC 61290-10-2-2005(2020) Optical amplifiers - Test methods - Part 10 - 2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 14594:2012 Microbeam analysis-Electron probe microanalysis-Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS C IEC 61290-10-1-2020 Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS D ISO 15470-2025 Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters
International Electrotechnical Commission (IEC)
- IEC 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
- IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
- IEC 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyser method
- IEC PAS 61290-3-1:2002 Optical fibre amplifiers - Basic specification - Part 3-1: Test methods for noise figure parameters - Optical spectrum analyzer
- IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-3-2:2003 Optical amplifiers - Part 3-2: Test methods for noise figure parameters; Electrical spectrum analyzer method
- IEC 61290-10-2:2003 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters; Pulse method using a gated optical spectrum analyzer
- IEC 61290-5-2:2003 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters; Electrical spectrum analyser method
- IEC 61290-3-2:2008 Amplificateurs optiques – Méthodes d’essais - Partie 3-2: Paramètres du facteur de bruit – Méthode de l’analyseur spectral électrique (Edition 2.0)
- IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
- IEC 61290-5-1:2000 Optical fibre amplifiers - Basic specification - Part 5-1: Test methods for reflectance parameters - Optical spectrum analyser
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- OS GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- OS GSO IEC 61290-5-2:2014 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
Association Francaise de Normalisation
- NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
- NF C93-805-1-2*NF EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2 : power and gain parameters - Electrical spectrum analyzer method.
- NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: noise figure parameters - Optical spectrum analyzer method
- NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
- NF C93-805-5-1*NF EN 61290-5-1:2006 Optical amplifier test methods - Part 5-1 : reflectance parameters - Optical spectrum analyser method
- NF EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: reflectance parameters - Optical spectrum analyzer method
- NF EN 61290-3-2:2009 Optical amplifiers - Test methods - Part 3-2: noise figure parameters - Electrical spectral analyzer method
- NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
- NF EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: power and gain parameters - Optical spectrum analyzer method
- NF C93-805-3-2*NF EN 61290-3-2:2009 Optical amplifiers - Test methods - Part 3-2 : noise figure parameters - Electrical spectrum analyzer method
- NF C93-805-2-1:1998 Optical fibre amplifiers. Basic specification. Part 2-1 : test methods for optical power parameters. Optical spectrum analyzer.
- NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
- NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
- NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: reflectance parameters - Electrical spectrum analyzer method
- NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
- NF C93-805-5-2*NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2 : reflectance parameters - Electrical spectrum analyser method
- NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
- NF C93-805-1-1:1998 Optical fibre amplifiers. Basic specification. Part 1-1 : test methods for gain parameters. Optical spectrum analyzer.
- NF EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: multiple channel parameters - Pulse method using a stroboscopic optical spectrum analyzer
German Institute for Standardization
- DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
- DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
- DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
- DIN EN 61290-3-2:2009-06 Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008 / Note: DIN EN 61290-3-2 (2003-08) remains valid alongside this standard until 2011-10-01....
- DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
- DIN EN 61290-3-2:2009 Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008
- DIN EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
- DIN EN 61290-1-1 E:2013-10 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DIN EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007
- DIN EN 61290-10-1:2010-01 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009 / Note: DIN EN 61290-10-1 (2004-02) remains valid along...
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO IEC 61290-3-1:2016 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- BH GSO ISO 14594:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- BH GSO IEC 61290-1-1:2016 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- BH GSO IEC 61290-3-2:2016 Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- BH GSO IEC 61290-5-2:2016 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
Spanish Association for Standardization (UNE)
- UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
- UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)
- UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
- UNE-EN 61290-3-2:2008 Optical amplifier test methods -- Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (Endorsed by AENOR in February of 2009.)
- UNE-EN 61290-5-1:2006 Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006). (Endorsed by AENOR in October of 2006.)
- UNE-EN 61290-5-2:2004 Optical amplifiers - Test methods -- Part 5-2: Reflectance parameters - Electrical spectrum analyser method (Endorsed by AENOR in September of 2004.)
International Organization for Standardization (ISO)
- ISO 14594:2024 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1
- ISO 14594:2003 Microbeam analysis - Electron microprobe analysis (Castaing Microprobe) - Guidelines for determining experimental parameters for wavelength dispersive spectrometry
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
South African Bureau of Standard
- SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- SANS 5567:1968 Spectrographic analysis of copper
Comitato Elettrotecnico Italiano
- CEI EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- CEI EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1: Power and gain parameters - Optical spectrum analyzer method
- CEI EN IEC 61290-1-1:2021 Optical amplifiers - Test methods Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- CEI EN 61290-3-2:2010 Optical amplifier test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- CEI EN 61290-2-2:1999 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
Japanese Industrial Standards Committee (JISC)
- JIS C 6122-1-1:2024 Optical amplifiers-Test methods-Part 1-1: Power and gain parameters-Optical spectrum analyzer method
- JIS C 6122-3-1:2011 Optical amplifiers -- Test methods -- Part 3-1: Noise figure parameters -- Optical spectrum analyzer method
- JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
- JIS C 6122-3-2:2006 Optical amplifiers -- Test methods -- Part 3-2: Noise figure parameters -- Electrical spectrum analyzer method
- JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
- JIS C 6122-1-1:2011 Optical amplifiers -- Test methods -- Part 1-1: Power and gain parameters -- Optical spectrum analyzer method
- JIS C 6122-5-1:2001 Optical fiber amplifiers -- Test methods -- Part 5-1: Test methods for reflectance parameters -- Optical spectrum analyzer test method
- JIS C 6122-10-1:2007 Optical amplifiers -- Test methods -- Part 10-1: Multichannel parameters -- Pulse method using an optical switch and optical spectrum analyzer
European Committee for Electrotechnical Standardization(CENELEC)
- EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
- EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
- EN 61290-3-2:2003 Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method
- EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
- EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- EN 61290-2-2:1998 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters Electrical SPectrum Analyzer
- EN 61290-3-1:2003 Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method
- EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- EN 61290-5-1:2006 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- EN 61290-10-1:2003 Optical amplifiers Test methods Part 10-1: Multichannel parameters Pulse method using an optical switch and optical spectrum analyzer
GCC Standardization Organization
- GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- GSO IEC 61290-3-2:2014 Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- GSO ISO 14594:2015 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- GSO IEC 61290-5-2:2014 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
Finnish Standards Institute
- SFS-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
Standard Association of Australia (SAA)
- AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
American National Standards Institute (ANSI)
- ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
Lithuanian Standards Office
- LST EN 61290-3-1-2004 Optical amplifiers. Test methods. Part 3-1: Noise figure parameters. Optical spectrum analyzer method (IEC 61290-3-1:2003)
- LST EN 61290-5-1-2006 Optical amplifiers -Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006)
National Standardisation Body (ASRO)
- STAS 1706/17-1971 CUPPER speelrochemical analysis
U.S. Air Force
- AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
American Society for Testing and Materials (ASTM)
- ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
Associação Brasileira de Normas Técnicas
- ABNT P-EB-304-1969 "Spectral Analysis" Standard
Gosstandart of Russia
- GOST 12223.0-1976 Iridium. Method of spectral analysis
- GOST 14316-1991 Molybdenum. Spectrum analysis methods
- GOST 14339.5-1991 Tungsten. Methods of spectral analysis
- GOST 12227.0-1976 Rodium. Method of spectral analysis
Microwave parameters,Physiological parameters,resolution parameter,Atmospheric parameters,parametric product,ms parameter,Spectral Analysis Parameters,Spectrum Analyzer Main Parameters,Spectrum Analyzer Main Parameters,Parameter parameter tester,Parameter parameter measuring instrument,Four parameters and calibration parameters,Spectrum Analyzer Parameters,Spectrum Analyzer Parameters,Fiber Optic Spectrum Analyzer Parameters,Flue gas parameters,Five-parameter spectral analysis,Physical and Mechanical Parameters,Spectral Analysis Spectral Analysis,working parameters and operating parameters