Spectrum Analyzer Main Parameters
Spectrum Analyzer Main Parameters, Total:346 items.
The international standard classification for "Spectrum Analyzer Main Parameters" includes: Other standards related to analytical chemistry , Chemical analysis , Analytical chemistry in general , Protective equipment in general , Optoelectronics. Laser equipment , Other standards related to nuclear energy , Chemical analysis of metals , Optical measuring instruments , Optics and optical measurements , Navigation and control equipment .
The Chinese standard classification for "Spectrum Analyzer Main Parameters" includes: Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Safety requirements on protection equipment , Laser device , General nuclear instrument , Lighting and other electrical devices for vessel , Optical instrument in general , Electron optics and other physical optics instrument , Optical metrological instrument , Optical Measurement .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
- GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
- GB/T 17736-1999 Testing method of main parameters for laser protective eyewear
- GB/T 15175-1994 Measurement methods for main parameter of solid - State lasers
- GB 4124.3-1984 The types, parameters and main sizes of projection lights for marine use
- GB/T 15175-2012 Measurement methods for main parameter of solid state lasers
- GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
- GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
- GB/T 41572-2022 Measurement methods for main parameters of pulsed laser in time-domain
- GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
- GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
Professional Standard - Machinery
- JB/T 5748-1991 Test method of main parameters of ruby laser
- JB/T 8231-1999 The basic parameters of the plane-gratings spectrographs
- JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
- JB/T 9346-1999 Basic parameters for spectrophotometer
- JB/T 6250.2-1992 Test method of main parameters of YAG pulse lasers
- JB/T 9490-1999 Measuring mathod of major parameter for CO2 lasers
- JB/T 6249-1992 Test method of main parameters of helium cadmium lasers
- JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
- JB/T 9489-1999 Measuring mathod of major parameter for argon ion lasers
- JB/T 6250.1-1992 Test method of main parameters of YAG continuous wave lasers
- JB/T 6176-1992 Basic Parameter of Photographic Plate Cassette and Cassette Frame for Spectrograph
- JB/T 9491-1999 Measuring mathod of major parameter for He-Ne lasers
- JB/T 9490-2013 CO2 laser main parameter test method
- JB/T 5749-1991 Test method of main parameters of neodymium glass laser
Taiwan Provincial Standard of the People's Republic of China
- CNS 14341-1999 Optical spectrum analyzer
未注明发布机构
- JIS C 6122-1-1:2024 Optical amplifiers-Test methods-Part 1-1: Power and gain parameters-Optical spectrum analyzer method
National Metrological Verification Regulations of the People's Republic of China
- JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication
- JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
- JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
Professional Standard - Electron
- SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum
Group Standards of the People's Republic of China
- T/GDCKCJH 022-2020 Determination methods for main parameters of ultrashort pulse fiber laser
- T/SXICS 006-2024 Calibration specification for multiparameter analyzers of water quality
- T/GDCKCJH 021-2020 Determination methods for main parameters of single-frequency fiber laser
Hunan Provincial Standard of the People's Republic of China
- DB43/T 1776-2020 Test method for main parameters of high energy continuous fiber laser
- DB43/T 1897-2020 General technical requirements for reference light sources for chemiluminescence immunoassay analyzers
工业和信息化部
- JBT13738-2019 Portable multi-parameter water quality analyzer
- JB/T 13738-2019 Portable multiparameter analyzer for water quality
工业和信息化部/国家能源局
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
Professional Standard-Ships
- CB/T 3852.3-1999 The types parameters and main sizes of projection lights for marine use
CZ-CSN
- CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
- CSN 35 8850 Cast.3-1987 Photocouplers. Measuring methods of main parameters
British Standards Institution (BSI)
- BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
- BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
- BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
- BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
- BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
- BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
- BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS EN 62129:2006 Calibration of optical spectrum analyzers
- BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- BS EN 61290-3-2:2003 Optical fibre amplifiers - Basic specification - Test methods for noise figure parameters - Electrical spectrum analyzer method
- BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-1-1:2007 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
- BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- BS EN 61290-5-2:2004 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Electrical spectrum analyser method
- BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
- BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- 19/30398879 DC BS EN 61290-1-1. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
- BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
- BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BS EN 61290-1-2:2007 Optical amplifiers. Test methods. Power and gain parameters. Electrical spectrum analyzer method
- BS EN 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
- 18/30387381 DC BS EN 61290-1-1 Ed.4.0. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-3-2:2008 Optical amplifiers - Test methods - Noise figure parameters - Electrical spectrum analyzer method
- BS EN 61290-3-2:2009 Optical amplifiers. Test methods. Noise figure parameters. Electrical spectrum analyzer method
- BS EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1:Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- BS EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser
- BS ISO 14594:2024 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
SCC
- DANSK DS/EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- BS EN 61290-2-1:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Optical spectrum analyzer
- BS DD IEC/PAS 61290-3-1:2002 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters-Optical spectrum analyzer
- BS EN 61290-1-1:1998 Optical spectrum analyzer
- BS EN 61290-5-1:2000 Optical fibre amplifiers. Basic specification. Test methods for reflectance parameters-Optical spectrum analyser
- DANSK DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- CEI EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- BS EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Electrical spectrum analyzer
- CEI EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1: Power and gain parameters - Optical spectrum analyzer method
- IEC PAS 61290-3-1:2002 Optical fibre amplifiers - Basic specification - Part 3-1: Test methods for noise figure parameters - Optical spectrum analyzer
- DANSK DS/EN 61290-1-1:2015 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- CEI EN IEC 61290-1-1:2021 Optical amplifiers - Test methods Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DANSK DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DANSK DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- DANSK DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- BS EN 61290-1-2:1998 Optical fibre amplifiers. Basic specification-Test methods for gain parameters. Electrical spectrum analyzer
- CEI EN 61290-3-2:2010 Optical amplifier test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- CEI EN 62129:2006 Calibration of optical spectrum analyzers
- DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
- CEI EN 61290-2-2:1999 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
- BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- 11/30199190 DC BS ISO 15632. Microbeam analysis. Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- CEI EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
- DANSK DS/EN 61290-1-2:2006 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
- DANSK DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- DANSK DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- CEI EN 61290-10-1:2010 Optical amplifiers- Test methods Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- CEI EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- DANSK DS/EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- BS EN 61290-1-3:1998 Optical fibre amplifiers. Basic spectrum analyzers-Optical power meter
- DIN EN 61290-1-1 E:2013 Draft Document - Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 86C/1177/CD:2013)
- CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers
- 05/30143573 DC IEC 61290-10-4. Optical amplifiers. Test methods. Part 10-4. Multichannel parameters. Interpolated source subtraction method using an optical spectrum analyzer
- DANSK DS/EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzers
- 07/30170378 DC BS EN 61290-10-1. Optical amplifier test methods. Part 10-1. Multichannel parameters. Pulse method using an optical switch and optical spectrum analyzer
- DIN ISO 15632 E:2015 Draft Document - Microbeam analysis - Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012); Text in German and English
U.S. Air Force
- AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
- AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER
Korean Agency for Technology and Standards (KATS)
- KS C IEC 61290-3-1-2005(2020) Optical amplifiers-Test methods-Part 3-1:Noise figure parameters-Optical spectrum analyzer method
- KS C IEC 61290-5-1-2007(2022) Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-5-1-2007(2017) Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-3-1-2020 Optical amplifiers-Test methods-Part 3-1:Noise figure parameters-Optical spectrum analyzer method
- KS C IEC 61290-3-1:2005 Optical amplifiers-Test methods-Part 3-1:Noise figure parameters-Optical spectrum analyzer method
- KS C IEC 61290-5-1-2022 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-3-2-2020 Optical amplifiers-Part 3-2:Test methods for noise figure parameters-Electrical spectrum analyzer method
- KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61290-3-2-2005(2020) Optical amplifiers-Part 3-2:Test methods for noise figure parameters-Electrical spectrum analyzer method
- KS D ISO 15470:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61290-10-1-2005(2020) Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS C IEC 61290-10-2-2005(2020) Optical amplifiers-Test methods-Part 10-2:Multichannel parameters-Pulse method using a gated optical spectrum analyzer
- KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
- KS C 6918-2020 Test methods of fiber-optic spectrum analyzer
- KS D ISO 15471:2005 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61290-10-2-2020 Optical amplifiers-Test methods-Part 10-2:Multichannel parameters-Pulse method using a gated optical spectrum analyzer
- KS C IEC 61290-10-1-2020 Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS C IEC 61290-10-1:2005 Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS C IEC 61290-10-2:2005 Optical amplifiers-Test methods-Part 10-2:Multichannel parameters-Pulse method using a gated optical spectrum analyzer
- KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
- KS D ISO 15471-2020 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 14594-2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
German Institute for Standardization
- DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
- DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
- DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
- DIN EN 61290-3-2:2009-06 Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008 / Note: DIN EN 61290-3-2 (2003-08) remains valid alongside this standard until 2011-10-01....
- DIN EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
- DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
- DIN EN 61290-1-1 E:2013-10 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DIN EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
- DIN EN 61290-1-2:2006-07 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005 / Note: DIN EN 61290-1-2 (1999-08) remains valid alongside this standard until 2008-10-0...
- DIN EN 61290-10-1:2010-01 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009 / Note: DIN EN 61290-10-1 (2004-02) remains valid along...
- DIN EN 61290-10-2:2008-07 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008 / Note: DIN EN 61290-10-2 (2004-02) remains valid alongside this stan...
- DIN EN IEC 61290-1-1:2022-07 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020); German version EN IEC 61290-1-1:2020 / Note: DIN EN 61290-1-1 (2016-03) remains valid alongside this standard until 2023-10...
- DIN EN IEC 61290-1-1:2019 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 86C/1563/CD:2018); Text in German and English
- DIN EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008
- DIN EN 61290-10-4:2008-02 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007 / Note: Applies in conjunction with DIN EN 61291...
- DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
- DIN EN 61290-1-2:2006 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005
- DIN EN 61290-5-2:2004-12 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
International Electrotechnical Commission (IEC)
- IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
- IEC 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
- IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-5-2:2003 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters; Electrical spectrum analyser method
- IEC 61290-3-2:2003 Optical amplifiers - Part 3-2: Test methods for noise figure parameters; Electrical spectrum analyzer method
- IEC 62129:2006 Calibration of optical spectrum analyzers
- IEC 61290-10-2:2003 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters; Pulse method using a gated optical spectrum analyzer
- IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
- IEC 61290-5-1:2000 Optical fibre amplifiers - Basic specification - Part 5-1: Test methods for reflectance parameters - Optical spectrum analyser
- IEC 61290-1-1:1998 Optical fibre amplifiers - Basic specification - Part 1-1: Test methods for gain parameters - Optical spectrum analyzer
- IEC 61290-10-1:2003 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters; Pulse method using an optical switch and optical spectrum analyzer
- IEC 61290-2-2:1998 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
- IEC 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- IEC 61290-10-2:2007 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- IEC 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyser
- IEC 61290-1-2:1998 Optical fibre amplifiers - Basic specification - Part 1-2: Test methods for gain parameters - Electrical spectrum analyzer
- IEC 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyser method
Association Francaise de Normalisation
- NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
- NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: noise figure parameters - Optical spectrum analyzer method
- NF C93-805-1-2*NF EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2 : power and gain parameters - Electrical spectrum analyzer method.
- NF EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: reflectance parameters - Optical spectrum analyzer method
- NF C93-845:2006 Calibration of optical spectrum analyzers.
- NF EN 61290-3-2:2009 Optical amplifiers - Test methods - Part 3-2: noise figure parameters - Electrical spectral analyzer method
- NF EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: power and gain parameters - Optical spectrum analyzer method
- NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
- NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
- NF C93-805-2-1:1998 Optical fibre amplifiers. Basic specification. Part 2-1 : test methods for optical power parameters. Optical spectrum analyzer.
- NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: reflectance parameters - Electrical spectrum analyzer method
- NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
- NF C93-805-5-2*NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2 : reflectance parameters - Electrical spectrum analyser method
- NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
- NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
- NF C93-805-1-1:1998 Optical fibre amplifiers. Basic specification. Part 1-1 : test methods for gain parameters. Optical spectrum analyzer.
- NF EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: multiple channel parameters - Pulse method using a stroboscopic optical spectrum analyzer
- NF EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2: power and gain parameters - Electrical spectrum analyzer method
- NF EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: multiple channel parameters - Pulse method using optical switch and optical spectrum analyzer
- NF C93-805-10-4*NF EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4 : multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- NF EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: multiple channel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- NF C93-805-1-2:1998 Optical fibre amplifiers. Basic specification. Part 1-2 : test methods for gain parameters. Electrical spectrum analyzer.
- NF C93-805-10-2*NF EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer
- NF C93-805-10-2:2003 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer.
- NF J95-040*NF EN ISO 8666:2020 Small craft - Principal data
- NF J95-040:2003 Small craft - Principal data.
- NF J95-040:2016 Small craft - Principal data
- NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
- NF C93-805-5-1*NF EN 61290-5-1:2006 Optical amplifier test methods - Part 5-1 : reflectance parameters - Optical spectrum analyser method
- NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
- NF C93-805-5-3*NF EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3 : test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser.
GSO
- OS GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- BH GSO IEC 61290-3-1:2016 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- BH GSO IEC 61290-1-1:2016 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- OS GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- GSO IEC 61290-5-2:2014 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
- GSO IEC 61290-3-2:2014 Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- BH GSO IEC 61290-3-2:2016 Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- OS GSO IEC 61290-5-2:2014 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
- BH GSO IEC 61290-5-2:2016 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
- BH GSO IEC 61290-1-2:2016 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
- OS GSO IEC 61290-1-2:2014 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
- GSO IEC 61290-1-2:2014 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
- GSO IEC 61290-10-1:2014 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- OS GSO IEC 61290-10-1:2014 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- BH GSO IEC 61290-10-1:2016 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- OS GSO IEC 61290-10-2:2014 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- BH GSO IEC 61290-10-4:2016 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- OS GSO IEC 61290-10-4:2014 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- GSO IEC 61290-10-4:2014 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- OS GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BH GSO ISO 15632:2017 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- GSO IEC 61290-5-1:2014 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- BH GSO ISO 14594:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Danish Standards Foundation
- DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- DS/EN 62129:2006 Calibration of optical spectrum analyzers
- DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
- DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- DS/EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- DS/EN 61290-1-2:2006 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
Spanish Association for Standardization (UNE)
- UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
- UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)
- UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
- UNE-EN 61290-3-2:2008 Optical amplifier test methods -- Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (Endorsed by AENOR in February of 2009.)
- UNE-EN 61290-5-2:2004 Optical amplifiers - Test methods -- Part 5-2: Reflectance parameters - Electrical spectrum analyser method (Endorsed by AENOR in September of 2004.)
- UNE-EN 61290-5-1:2006 Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006). (Endorsed by AENOR in October of 2006.)
- UNE-EN 61290-1-2:2005 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (Endorsed by AENOR in March of 2006.)
- UNE-EN 61290-10-1:2009 Optical amplifiers - Test methods -- Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (Endorsed by AENOR in July of 2009.)
- UNE-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (Endorsed by AENOR in May of 2008.)
- UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
South African Bureau of Standard
- SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- SANS 62129:2008 Calibration of optical spectrum analyzers
European Committee for Standardization (CEN)
- CEN EN 62129-2006 Calibration of optical spectrum analyzers
- CEN EN 62129-2006_ Calibration of optical spectrum analyzers
Japanese Industrial Standards Committee (JISC)
- JIS C 6122-3-1:2011 Optical amplifiers -- Test methods -- Part 3-1: Noise figure parameters -- Optical spectrum analyzer method
- JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
- JIS C 6122-3-2:2006 Optical amplifiers -- Test methods -- Part 3-2: Noise figure parameters -- Electrical spectrum analyzer method
- JIS C 6192:2008 Calibration of optical spectrum analyzers
- JIS C 6122-1-1:2011 Optical amplifiers -- Test methods -- Part 1-1: Power and gain parameters -- Optical spectrum analyzer method
- JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
- JIS C 6122-5-1:2001 Optical fiber amplifiers -- Test methods -- Part 5-1: Test methods for reflectance parameters -- Optical spectrum analyzer test method
- JIS C 6122-1-2:2011 Optical amplifiers -- Test methods -- Part 1-2: Power and gain parameters -- Electrical spectrum analyzer method
- JIS C 6122-10-1:2007 Optical amplifiers -- Test methods -- Part 10-1: Multichannel parameters -- Pulse method using an optical switch and optical spectrum analyzer
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS C 6122-10-2:2010 Optical amplifiers -- Test methods -- Part 10-2: Multichannel parameters -- Pulse method using a gated optical spectrum analyzer
- JIS C 6122-10-4:2012 Optical amplifiers -- Test methods -- Part 10-4: Multichannel parameters -- Interpolated source subtraction method using an optical spectrum analyzer
- JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
CENELEC - European Committee for Electrotechnical Standardization
- EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
- EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
- EN 61290-3-2:2003 Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method
- EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
- EN 61290-2-2:1998 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters Electrical SPectrum Analyzer
- EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- EN 61290-10-2:2003 Optical amplifiers - Test methods Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- EN 61290-10-1:2003 Optical amplifiers Test methods Part 10-1: Multichannel parameters Pulse method using an optical switch and optical spectrum analyzer
- EN 61290-1-2:1998 Optical Fibre Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters Electrical Spectrum Analyzer
Standard Association of Australia (SAA)
- AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 14594:2024 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
European Committee for Electrotechnical Standardization(CENELEC)
- EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- EN 61290-5-1:2006 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- EN 61290-3-1:2003 Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method
- EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- EN 61290-5-2:2004 Optical amplifiers Test methods Part 5-2: Reflectance parameters Electrical spectrum analyser method
- EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
RO-ASRO
- STAS 9241-1990 Circular grinding machines. Main parameters
- STAS 9244-1990 Surface grinding machines. Main parameters
- STAS 5101-1955 Agricultural equipment. The main part of the plow. The main parameters
- STAS 11733-1980 CAR Main parameters
International Organization for Standardization (ISO)
- ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
American National Standards Institute (ANSI)
- ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
- ANSI/TIA-455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
- ANSI/TIA/EIA 455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
- ANSI/TIA-455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
- ANSI/TIA/EIA 455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
- ANSI/TIA/EIA 455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
- ANSI/TIA-455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
Lithuanian Standards Office
- LST EN 61290-3-1-2004 Optical amplifiers. Test methods. Part 3-1: Noise figure parameters. Optical spectrum analyzer method (IEC 61290-3-1:2003)
- LST EN 61290-5-1-2006 Optical amplifiers -Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006)
- LST EN 61290-1-1-2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006)
- LST EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)
- LST EN 61290-3-2-2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008)
- LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
- LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
- LST EN 61290-5-2-2004 Optical amplifiers. Test methods. Part 5-2: Reflectance parameters. Electrical spectrum analyser method (IEC 61290-5-2:2003)
- LST EN 61290-10-1-2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009)
- LST EN 61290-1-2-2006 Optical amplifiers. Test methods. Part 1-2: Power and gain parameters. Electrical spectrum analyzer method (IEC 61290-1-2:2005)
- LST EN 61290-10-4-2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007)
- LST EN 61290-10-2-2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007)
RU-GOST R
- GOST R 50784-1995 Optical isolators. Types. Main parameters
- GOST R 50785-1995 Optical filtres. Types and main parameters
- GOST 25851-1983 Radiometric instruments. Methods of main parameters measurement
- GOST 24151-1987 Inclinometers. Types. Main parameters and general technical requirements
- GOST 17173-1981 Spectral slits and attachments to them. Types, basic parameters and dimensions. Technical requirements
- GOST 9698-1986 Gate valves. Main parameters
- GOST R 59738-2021 Optics and photonics. Diffraction gratings. Types, main dimensions and parameters
PL-PKN
- PN G03352-1972 Driliing geophysies Ends of heads ins?ruments intratelluric Principal parame?ers
- PN-EN IEC 61290-1-1-2021-06 E Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)
- PN D56120-1989 Woodworking machines Drum sanders Principal parameters
- PN T92706-1985 Aerodrome direction finders -- Classification, principal parameters, general technical requirements and methods of test
IEC - International Electrotechnical Commission
- IEC 61290-3-2:2008 Amplificateurs optiques – Méthodes d’essais - Partie 3-2: Paramètres du facteur de bruit – Méthode de l’analyseur spectral électrique (Edition 2.0)
- PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)
(U.S.) Telecommunications Industries Association
- TIA/EIA-455-209-2000 FOTP-209 IEC 61290-2-1 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
- TIA/EIA-455-206-2000 FOTP-206 IEC 61290-1-1 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
- TIA/EIA-455-210-2000 FOTP-210 IEC 61290-2-2 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
KR-KS
- KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GOST
- GOST 8074-1982 Toolmaker's microscopes. Types, main parameters and dimensions. Technical requirements
- GOST R 70783-2023 Resistors sets. Classification and main parameters
TIA - Telecommunications Industry Association
- TIA/EIA-455-221-2001 FOTP-221-IEC 61290-5-1 - Optical Fiber Amplifiers - Basic Specification - Part 5-1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer (Please refer to IEC 61290-5-1)
DIN
- DIN EN 61290-10-1:2004 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2003); German version EN 61290-10-1:2003
- DIN EN 61290-10-2:2004 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2003); German version EN 61290-10-2:2003
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