metal half potential

metal half potential, Total:410 items.

The international standard classification for "metal half potential" includes: Corrosion of metals , Cutting tools , Powder metallurgy , Other non-ferrous metals and their alloys , Semiconductor devices in general , Electronic components in general , Wires , Chemical analysis of metals , Other mining equipment , Advanced ceramics .

The Chinese standard classification for "metal half potential" includes: Metal chemical property test method , Powder metallurgy material and product , Powder metallurgy in general , Precious metals and their alloys , Semiconductor discrete devices in general , Sensitive component and sensor , Wire with insulation layer , Electronic components , Pipe fittings, clamps and seals , Technical management , Precious metals and its alloy analysis method , Hygiene, safety and labor protection , Special ceramics .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 37619-2019 Corrosion of metals and alloys—Potentiostatic test and evaluation method for determination of susceptibility to grooving corrosion of high frequency electric resistance welded steel pipes
GB/T 8654.7-1988 Methods for chemical analysis of manganese metal--The potentiometric titration method for the determination of manganese content
GB/T 2077-1987 Indexable hardmetal (carbide) inserts; Corner radii
GB/T 29088-2012 Corrosion of metals and alloys—Electrochemical potentiokinetic reactivation measurement using the double loop method
GB/T 15072.5-2008(英文版) Test method of precious metal alloys—Determination of silver content for gold and palladium alloys—Potentionmeter titration with potassium iodide
GB 2077-1987 Carbide Indexable Insert Fillet Radius
GB/T 15072.1-2008 Test method of precious alloys - Determination of gold content for gold platinum and palladium alloys - Potentiometric titration using ferrous sulfate
GB/T 15072.2-2008(英文版) Chemical analysis methods for precious metal alloys - Determination of silver content in silver alloys - Sodium chloride potentiometric titration method
GB/T 24196-2009 Corrosion of metals and alloys—Electrochemical test methods—Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
GB/T 45719-2025 Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors
GB/T 17899-2023 Corrosion of metals and alloys—Method of measuring the pitting potential for stainless steels by potentiodynamic control in sodium chloride solution
GB/T 15652-1995 Generic specification for gas sensors of metal-oxide semiconductor
GB/T 45718-2025 Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for inter-metal layers
GB/T 15072.5-2008 Test method of precious metal alloys - Determination of silver content for gold and palladium alloys - Potentionmeter titration with potassium iodide
GB/T 2077-2023 Determinating the epoxy value of plasticizers
GB/T 15072.2-2008 Test method of precious metal alloys - Determination of silver contents for silver alloys - Potentionmeter titration with sodium chloride
GB/T 32550-2016 Corrosion of metals and alloys―Determination of the critical pitting temperature under potentiostatic control

Professional Standard - Aviation

HB 5291-1984 Precious Alloy Wire Packeted with Oil Paint Used for Aviation Potentiometer
HB 6383-1989 Small-sized rectangular electrical connector for locating metal shell
HB 5187-1996 Bare wires of precious metals and their alloy potentiometers for aviation
HB 4-118-1996 Semi-flexible Connection of Metal Conduit
HB 4-118-1983 Metal conduit semi-flexible connection
HB 4-118-1976 Metal conduit semi-flexible connection
HB 5187-1981 Bare wires of precious metals and their alloy potentiometers for aviation

Taiwan Provincial Standard of the People's Republic of China

CNS 7767-1981 Loops
CNS 8104-1981 Method for Measuring MOSFET Linear Threshold Voltage

Military Standard of the People's Republic of China-General Armament Department

GJB 955-1990 Precious metals and their alloy potentiometer winding bare wires for aerospace use
GJB 955A-2003 Specifications for bare wire materials for potentiometer windings of precious metals and their alloys
GJB 955A-2021 Specifications for bare wire materials for potentiometer windings of precious metals and their alloys

Guangxi Provincial Standard of the People's Republic of China

DB45/T 1489-2017 Energy consumption quota per unit product of electrolytic manganese metal

Professional Standard - Electron

SJ 20025-1992 Generic specification for gas sensors of metal-oxide semiconductor
SJ/T 10176-1991 Detail specification of metal rhomb package for semiconductor integrated circuits

未注明发布机构

FORD FLTM EU-BA 054-1-2000 METAL FOIL METHOD FOR DETERMINATION OF C- AND N-POTENTIAL OF CARBURIZING AND CARBONITRIDING FURNACE ATMOSPHERES
ANSI/AWWA C700-2024 Cold-Water Meters—Displacement Type, Metal Alloy Main Case
FORD M5J3-A-1990 GRAY METALLIC OFFICE EQUIPMENT SEMIGLOSS ENAMEL

Professional Standard - Non-ferrous Metal

YS/T 1433-2021 Energy consumption limit per unit product of precious metal smelting in the non-ferrous metal industry
YS/T 372.1-2006 Methods for elementary analysis of precious alloy -- Determination of silver content -- Potentiometer titration with potassium iodide
YS/T 372.14-2006 Methods for elementary analysis of precious alloy -- Determination of magnesium content -- Potentiometer titration using potassium permanganate
YS/T 372.1-1994 Methods for elementary analysis of precious alloy. Determination of silver content. Potentiometer titration with potassium iodide
YS/T 372.14-1994 Methods for elementary analysis of precious alloy. Determination of manganese content. Potentiometer titration using potassium permanganate

Professional Standard-Safe Production

AQ 2032-2011 Regulations for the Construction of Personnel Regional Positioning System in Metal and Nonmetal Underground Mine
AQ/T 2051-2016 General technical requirements of personnel regional positioning system in metal and nonmetal underground mine

Professional Standard - Agriculture

SN/T 5691-2024 Determination of cadmium, chromium, lead, and mercury in automotive metallic and semimetallic brake lining materials by inductively coupled plasma atomic emission spectrometry

Group Standards of the People's Republic of China

T/CECA 35-2019 Metal oxide semiconductor gas sensor
T/QGCML 3081-2024 Semiconductor sputtering target high-purity titanium metal powder
T/ZJCX 0023-2022 Metal cold heading multi station intelligent forming machine
T/JSEE 002-2020 Technical guidelines for live location of grounding defects in metal sheath of high-voltage cables

Professional Standard - Ocean

HY/T 192-2015 Test method of potentiodynamic polarization resistance of metallic materials in seawater

Professional Standard - Building Materials

JC/T 2024-2010 Translucent Alumina Ceramic Tube for Metal Halide Lamps

Professional Standard - Environmental Protection

HJ 1208-2021 Self-monitoring technology guidelines for pollution sources -Non-ferrous metal metallurgy industry-secondary non-ferrous metal

Hebei Provincial Standard of the People's Republic of China

DB13/T 5721-2023 Specifications for construction of high-precision personnel positioning system for metal and non-metal underground mines

Spanish Association for Standardization (UNE)

UNE-EN 23909:1993 HARDMETALS. DETERMINATION OF COBALT. POTENTIOMETRIC METHOD. (Endorsed by AENOR in January of 1994.)
UNE-EN ISO 17475:2009 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)
AENOR UNE-EN ISO 17475:2009 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)
UNE 38-040-1986 Semi-processed products of light metals and their alloys. Terms and definitions
UNE-EN ISO 17864:2009 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control (ISO 17864:2005)
AENOR UNE-EN ISO 17864:2009 Corrosion of metals and alloys - Determination of the critical pitting temperature under potentiostatic control (ISO 17864:2005)
UNE-EN 2600:2018 Aerospace series - Designation of metallic semi-finished products - Rules (Endorsed by Asociación Española de Normalización in February of 2019.)
UNE-EN 62418:2010 Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
UNE-EN ISO 1460:2021 Metallic coatings - Hot dip galvanized coatings on ferrous materials - Gravimetric determination of the mass per unit area (ISO 1460:2020)
UNE-EN ISO 12732:2008 Corrosion of metals and alloys - Electrochemical potentiokinetic reactivation measurement using the double loop method (based on Cihal's method) (ISO 12732:2006) (Endorsed by AENOR in June of 2008.)
UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)

British Standards Institution (BSI)

BS EN 23909:1994 Hardmetals. Determination of cobalt. Potentiometric method
BS ISO 17475:2005 Corrosion of metals and alloys. Electrochemical test methods. Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
BS 6042:1981 Specification for dental semi-precious metal casting alloys
BS 6042:1990 Specification for dental semi-precious metal casting alloys
BS 2709:1956 Specification for the electrical performance of semiconductor rectifiers (metal rectifiers)
BS ISO 17864:2005 Corrosion of metals and alloys. Determination of the critical pitting temperature under potentiostatic control
BS EN ISO 17864:2008 Corrosion of metals and alloys. Determination of the critical pitting temperature under potientiostatic control
BS EN ISO 17864:2006 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control
BS ISO 15158:2014 Corrosion of metals and alloys. Method of measuring the pitting potential for stainless steels by potentiodynamic control in sodium chloride solution
BS 3466:1962 Methods of test for resistance per unit length of metallic electrical resistance material
BS ISO 17864:2006 Corrosion of metals and alloys - Determination of the critical pitting temperature under potentiostatic control
BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
12/30215316 DC BS ISO 15158. Corrosion of metals and alloys. Method of measuring the pitting potential for stainless steels by potentiokinetic control in sodium chloride solution
BS 1131-4:1955 Plain bearings (metal) Dimensions of thin walled bearing half liners and thrust half washers
BS 1244-1:1956 Metal sinks for domestic purposes-Imperial units with metric equivalents
BS EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
BS 1244-2:1972 Metal sinks for domestic purposes. Metric units
BS EN ISO 17475:2006 Corrosion of metals and alloys. Electrochemical test methods. Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
BS EN 2600:2018 Aerospace series. Designation of metallic semi-finished products. Rules
BS ISO 18089:2015 Corrosion of metals and alloys. Determination of the critical crevice temperature (CCT) for stainless steels under potentiostatic control
BS EN 4000:2002 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
BS EN ISO 11427:2024 Jewellery and precious metals. Determination of silver. Potentiometry using potassium bromide
BS EN ISO/ASTM 52909:2024 Additive manufacturing of metals. Finished part properties. Orientation and location dependence of mechanical properties for metal parts
BS EN ISO /ASTM 52909:2024 Additive manufacturing of metals. Finished part properties. Orientation and location dependence of mechanical properties for metal parts
BS ISO 6282:2018 Plain bearings. Metallic thin-walled half bearings. Determination of the $Gs0, 01*-limit
BS EN 10071:2012 Chemical analysis of ferrous materials. Determination of manganese in steels and irons. Electrometric titration method
BS ISO 12732:2006 Corrosion of metals and alloys. Electrochemical potentiokinetic reactivation measurement using the double loop method (based on Cihal's method)
BS EN 62418:2010 Semiconductor devices. Metallization stress void test
24/30472584 DC BS ISO 19376-1 Jewellery and precious metals - Vocabulary - Part 1: Precious metals and units
BS EN 62374-1:2010(2011) Semiconductor devices Part 1 : Time - dependent dielectric breakdown (TDDB) test for inter - metal layers
BS EN ISO/ASTM 52909:2022 Additive manufacturing of metals. Finished part properties. Orientation and location dependence of mechanical properties for metal powder bed fusion
BS EN 2600:2018(2019) Aerospace series - Designation of metallic semi - finished products - Rules

Defense Logistics Agency

DLA SMD-5962-87763 REV A-2004 MICROCIRCUIT, LINEAR, CMOS, DUAL 12-BIT, DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89446-1991 MICROCIRCUIT, DIGITAL, CMOS, 8-BIT VARIABLE LENGTH SHIFT REGISTERS, MONOLITHIC SILICON
DLA SMD-5962-96683-1996 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 4 BIT ARITHMETIC LOGIC UNIT, MONOLITHIC SILICON
DLA SMD-5962-89462 REV B-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 16-BIT AND 8/16-BIT MICROPROCESSOR MONOLITHIC SILICON
DLA SMD-5962-88612 REV A-1990 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-88501 REV G-2007 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON
DLA SMD-5962-88533 REV C-1994 MICROCIRCUIT, DIGITAL, CMOS, ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON
DLA SMD-5962-89596 REV D-2004 MICROCIRCUIT, DIGITAL, NMOS, 16-BIT MICROCONTROLLER, MONOLITHIC SILICON
DLA SMD-5962-88568-1988 MICROCIRCUITS, DIGITAL, NMOS, SINGLE COMPONENT, 8-BIT MICROCOMPUTER, MONOLITHIC SILICON
DLA SMD-5962-88778 REV A-2002 MICROCIRCUIT, CMOS, 12-BIT BUFFERED MULTIPLYING, DIGITAL TO ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-88743 REV B-1991 MICROCIRCUITS, LINEAR, 8-BIT CMOS FLASH A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-88543 REV C-2006 MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT IDENTITY COMPARATOR, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-90512-1992 MICROCIRCUIT, DIGITAL, HMOS, 8-BIT MICROCOMPUTER, MONOLITHIC SILICON
DLA SMD-5962-89517 REV A-1994 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT SLICE MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-86010 REV C-2004 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, UNBUFFERED HEX INVERTER, MONOLITHIC SILICON
DLA SMD-5962-89772-1992 MICROCIRCUIT, CHMOS, 16-BIT MICROCONTROLLER WITH 8-BIT OR 16-BIT EXTERNAL BUS, MONOLITHIC SILICON
DLA SMD-5962-89481 REV A-2004 MICROCIRCUIT, LINEAR, CMOS, 12-BIT, MULTIPLYING D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-88574 REV A-1994 MICROCIRCUIT, DIGITAL, HCMOS 8-INPUT, NOR/OR GATE, MONOLITHIC SILICON
DLA SMD-5962-88595 REV A-1989 MICROCIRCUITS, DIGITAL, NMOS, 256 X 4 STATIC RAM (SRAM) MONOLITHIC SILICON
DLA SMD-5962-86862 REV B-1989 MICROCIRCUITS, DIGITAL, FAST CMOS, UNIVERSAL SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-89512 REV D-1995 MICROCIRCUIT, DIGITAL, CMOS, 56-BIT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-88765 REV B-2002 MICROCIRCUIT, LINEAR, CMOS, MICROPROCESSOR COMPATIBLE, DUAL 12-BIT DIGITAL-TO-ANALOG CONVERTERS, MONOLITHIC SILICON
DLA SMD-5962-87806 REV C-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT UNIVERSAL SHIFT REGISTER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-86817 REV C-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-89533-1989 MICROCIRCUIT, DIGITAL, FAST, CMOS, 10-BIT NONINVERTING TRANSCEIVER, MONOLITHIC SILICON
DLA SMD-5962-86816 REV C-2003 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-88733 REV D-1997 MICROCIRCUIT, DIGITAL, CMOS, 16 X 16 BIT MULTIPLIER, ACCUMULATOR, MONOLITHIC SILICON
DLA SMD-5962-89518 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, 8-BIT, A/D CONVERTER WITH TRACK/HOLD, MONOLITHIC SILICON
DLA SMD-5962-88613 REV B-1991 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON
DLA SMD-5962-96736-1996 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HIGH SPEED 8-BIT BIDIRECTIONAL CMOS/TTL INTERFACE LEVEL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89534 REV C-1991 MICROCIRCUITS, DIGITAL, CMOS, 80-BIT NUMERIC PROCESSOR EXTENSION, MONOLITHIC SILICON
DLA KKK-L-370 D NOTICE 3-2001 LINING, FRICTION, (CLUTCH AND BRAKE, METALLIC, METAL-CERAMIC AND SEMI-METALLIC)
DLA KKK-L-370 D-1988 LINING, FRICTION, (CLUTCH AND BRAKE, METALLIC, METAL-CERAMIC AND SEMI-METALLIC)
DLA SMD-5962-89436 REV A-2006 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT UNIVERSAL SHIFT REGISTER WITH TRI-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-88594 REV C-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 256 X 4 STATIC RAM (SRAM), MONOLITHIC SILICON
DLA SMD-5962-88656 REV A-2004 MICROCIRCUIT, DIGITAL, FAST CMOS, 9-BIT NONINVERTING REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-87808 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT SYNCHRONOUS UP/DOWN DECADE COUNTER WITH ASYNCHRONOUS RESET, MONOLITHIC SILICON
DLA SMD-5962-88608 REV A-2004 MICROCIRCUIT, DIGITAL, FAST, CMOS, 10-BIT NONINVERTING REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-88661-1989 MICROCIRCUIT, DIGITAL, FAST CMOS 9-BIT NON-INVERTING BUS TRANSCEIVER, MONOLITHIC SILICON
DLA SMD-5962-96668 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, DUAL 64-STAGE STATIC SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-94745-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 256K X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
DLA SMD-5962-89951-1990 MICROCIRCUITS, MEMORY, DIGITAL, NMOS 256 X 4 BIT, NONVOLATILE STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-87756 REV D-2005 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL D-TYPE FLIP-FLOP WITH MASTER RESET, MONOLITHIC SILICON
DLA SMD-5962-86826 REV C-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-90705-1991 MICROCIRCUITS, DIGITAL, HIGH SPEED CMOS, BCD DECADE COUNTER, ASYNCHRONOUS RESET, MONOLITHIC SILICON
DLA SMD-5962-89519 REV F-1998 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MIL-STD-1750 INSTRUCTION SET ARCHITECTURE, MONOLITHIC SILICON
DLA SMD-5962-88650 REV A-1996 MICROCIRCUIT, LINEAR, CMOS, 8-BIT, MICROPROCESSOR COMPATIBLE, A/D CONVERTER WITH TRACK/HOLD, MONOLITHIC SILICON
DLA SMD-5962-86071 REV C-2002 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-88705 REV A-2003 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 10-BIT D-TYPE FLIP-FLOP WITH THREESTATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-88556 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, ANALOG MULTIPLEXER/DEMULTIPLEXER, DOUBLE-POLE FOUR-POSITION, MONOLITHIC SILICON
DLA SMD-5962-88766 REV A-2004 MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT CMOS DIGITAL TO ANALOG CONVERTER WITH, OUTPUT AMPLIFIER AND REFERENCE, MONOLITHIC SILICON
DLA SMD-5962-96691 REV D-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, SRAM, 128K X 8-BIT, MONOLITHIC SILICON
DLA SMD-5962-88674-1988 MICROCIRCUITS, DIGITAL, FAST CMOS, 8-BIT, NONINVERTING , BUS INTERFACE REGISTERS, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-95826 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NOR GATE, MONOLITHIC SILICON
DLA A-A-52035-1991 PROTRACTOR, ONE ARM: SEMICIRCULAR (CORROSION-RESISTANT ALLOY, WITH CASE)
DLA A-A-52035 VALID NOTICE 1-2001 PROTRACTOR, ONE ARM: SEMICIRCULAR (CORROSION-RESISTANT ALLOY, WITH CASE)
DLA A-A-52035 VALID NOTICE 2-2007 PROTRACTOR, ONE ARM: SEMICIRCULAR (CORROSION-RESISTANT ALLOY, WITH CASE)
DLA SMD-5962-87686 REV D-1999 MICROCIRCUIT, DIGITAL, CMOS, 16 X 16 MULTIPLIER, MONOLITHIC SILICON
DLA SMD-5962-86873 REV B-1993 MICROCIRCUIT, DIGITAL, CMOS 16 X 16 MULTIPLIER, MONOLITHIC SILICON
DLA SMD-5962-88672 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT MAGNITUDE COMPARATOR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-88675-1988 MICROCIRCUITS, DIGITAL, FAST CMOS, 8-BIT NONINVERTING BUS INTERFACE LATCH, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-88575-1989 MICROCIRCUITS, DIGITAL, FAST CMOS, 10-BIT NONINVERTING BUS INTERFACE LATCH WITH THREE-STATE OUTPUT, MONOLITHIC SILICON
DLA SMD-5962-88671 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT BINARY UP/DOWN COUNTER WITH TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-95715-1996 MICROCIRCUIT, DIGITAL, CMOS, CLOCK GENERATOR DRIVER, MONOLITHIC SILICON
DLA SMD-5962-94709-1994 MICROCIRCUIT, LINEAR, CMOS, BANG-BANG CONTROLLER, MONOLITHIC SILICON
DLA SMD-5962-94734-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MEG X 1 DRAM, MONOLITHIC SILICON
DLA SMD-5962-87757 REV B-2005 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, HEX D-TYPE FLIP-FLOP WITH MASTER RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-96805 REV A-2005 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, HEX INVERTER, MONOLITHIC SILICON
DLA SMD-5962-95794 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, OCTAL TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON

Association Francaise de Normalisation

NF EN 23909:1994 Métaux durs - Détermination du cobalt - Méthode potentiométrique.
NF A05-403*NF EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements.
NF A05-119*NF EN ISO 17864:2008 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control
NF A05-207*NF ISO 15158:2014 Corrosion of metals and alloys - Method of measuring the pitting potential for stainless steels by potentiodynamic control in sodium chloride solution
NF EN ISO 11427:2024 Jewellery and precious metals - Determination of silver - Potentiometry using potassium bromide
NF A06-202*NF EN ISO 11427:2024 Jewellery and precious metals - Determination of silver - Potentiometry using potassium bromide
NF L10-003*NF EN 2600:2018 Aerospace series - Designation of metallic semi-finished products - Rules
NF A05-172*NF ISO 18089:2016 Corrosion of metals and alloys - Determination of the critical crevice temperature (CCT) for stainless steels under potentiostatic control
NF A55-401:1982 NON FERROUS METALS. COLD ROLLED SEMI-FINISHED PRODUCTS MADE OF LEAD. CHARACTERISTICS.
NF L10-015*NF EN 4000:2002 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
NF EN ISO 1460:2020 Metallic coatings - Hot-dip galvanizing coatings on ferrous metals - Gravimetric determination of mass per unit area
NF C80-204*NF EN 62418:2011 Semiconductor devices - Metallization stress void test
NF A06-331:1989 Chemical analysis of ferrous materials. Determination of manganeses in steels and irons. Electrometric titration method.
NF A06-331*NF EN 10071:2012 Chemical analysis of ferrous materials - Determination of manganese in steels and irons - Electrometric titration method
NF EN 62418:2011 Semiconductor Devices - Testing Cavities Due to Metallization Stresses
NF EN 2600:2018 Série aérospatiale - Désignation des demi-produits métalliques - Règles
NF EN 4000:2002 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for semi-finished metal products

TR-TSE

TS 925-1971 FRICTION L?NINGS FOR CLUTCHES (METALLIC, SEMIMETALLIC AND METAL -CERAMIC)

Magyar Szabványügyi Testület

MNOSZ 19818-1954 Inspection of precious metal semi-finished products
MSZ KGST 1185-1978 Location diagram of metal spring
MNOSZ 12400-1953 Metal semi-finished product color
MNOSZ 747-1951 Semi-finished metal hexagonal copper rod
MSZ 18096/8-1982 Potential measurement of buildings with corrosion hazards of underground metal electrical equipment
MNOSZ 14415-1953 Radius milling machine movement concept for metal grinding machines
MSZ 8584-1966 Terminology for semi-manufactured and pre-ferrous metals and their alloys
MSZ 17785-1962 Semi-hard metal stretched steel wires, cold rolled nuts and rivets
MI 12374-1979 Definition of the concepts of raw materials and semi-finished products for non-metallic and cast products, surface error semi-finished products and their alloys
MSZ 12420-1969 Semi-finished products of non-ferrous metals and alloys. Separate testing of test conduct and test preparation

BR-ABNT

ABNT P-EB-307-1970 Semi-metallic corrugated paper
ABNT P-NB-159-1968 Use of boiler semi-metallic spiral joints
ABNT P-NB-191-1970 Use of lined semi-metallic corrugated joints
ABNT P-NB-155-1967 The use of pipe flange semi-metallic spiral joints
ABNT P-EB-234-1967 Semi-metallic screw joints for pipe flanges

CZ-CSN

CSN 42 0890 Cast.8-1981 Testing of metal powders. Determination of water content in metal powders by elektrometric titration
CSN 42 0648 Cast.1-1986 Chemical analysis of metallic chromium. Determination of chromium by the potentiometric titration
CSN 42 1304-1989 Metallurgical semi-finished products and products made of non-ferrous metals. Marking
CSN 25 1141-1962 Steel pocket rules, semi-cloused metale cases
CSN 25 1140-1962 Steel pocket rules, semi-cloused metale cases
CSN 42 0611 Cast.7-1986 Chemical analysis of non-ferrous metals. Copper-base bearing metals. Determination of silver by the potentiometric method and atomic absorption method

Korean Agency for Technology and Standards (KATS)

KS D ISO 17475-2017(2022) Corrosion of metals and alloys－Electrochemical test methods－Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
KS D ISO 17475-2017 Corrosion of metals and alloys－Electrochemical test methods－Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
KS D ISO 17475-2023 Corrosion of metals and alloys — Electrochemical test methods — Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
KS B 0611-2022 Radii of machine parts(Press working of sheet metals)
KS F 2712-2002 Testing method for half－cell potentials of reinforcing steel in concrete
KS D ISO 17475:2017 Corrosion of metals and alloys－Electrochemical test methods－Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
KS D ISO 17475:2008 Corrosion of metals and alloys－Electrochemical test methods－Guidelines for conducting potentiostatic and potentiodynamic polarization measurements

Ente Nazionale Italiano di Unificazione

UNI ISO 3909:1987 Sintered metal carbides. Determination of cobalt. Potentiometric method
UNI EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
UNI CEI 6:1992 Cathodic protection of buried metallic structures.Potential measurements.
UNI EN 515:1996 Aluminium and aluminium alloys. Wrought products. Temper designations.
UNI 6863:1971 Caps of semirigid plastic for metal collapsible tubes.
UNI EN ISO 7539-7:1997 Corrosion of metals and alloys. Stress corrosion testing. Slow strain rate testing.
UNI EN ISO 17864:2008 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control
UNI 9295-3:1988 Light metals and their alloys. Semi-finished products. Terminology and classification
UNI EN ISO 11427:2024 Jewellery and precious metals - Determination of silver - Potentiometry using potassium bromide
UNI 5506:1964 Special purpose machine files. Half- round files for soft metals.
EC 1-2019 UNI EN 2600:2019 Aerospace series - Designation of metallic semi-finished products - Rules

International Organization for Standardization (ISO)

ISO 17475:2005 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
ISO 17475:2005/cor 1:2006 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements; Technical Corrigendum 1
ISO/DIS 11427 Jewellery and precious metals — Determination of silver in silver alloys — Potentiometry using potassium bromide
ISO/PRF 11427:2024 Jewellery and precious metals — Determination of silver — Potentiometry using potassium bromide
ISO 15158:2014 Corrosion of metals and alloys - Method of measuring the pitting potential for stainless steels by potentiodynamic control in sodium chloride solution
ISO 17864:2005 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control
ISO/DIS 13756 Jewellery and precious metals — Determination of silver in silver alloys — Potentiometry using sodium chloride or potassium chloride
ISO 18089:2015 Corrosion of metals and alloys - Determination of the critical crevice temperature (CCT) for stainless steels under potentiostatic control
ISO 1460:1992 Metallic coatings; hot dip galvanized coatings on ferrous materials; gravimetric determination of the mass per unit area

German Institute for Standardization

DIN EN ISO 17475:2008-07 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005+Cor. 1:2006); German version EN ISO 17475:2008
DIN EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005+Cor. 1:2006); English version of DIN EN ISO 17475:2008-07
DIN EN ISO 17475 E:2007 Draft Document - Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005); German version prEN ISO 17475:2007
DIN EN ISO 17475 E:2007-12 Draft Document - Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005); German version prEN ISO 17475:2007
DIN EN ISO 17864:2008 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control (ISO 17864:2005);English version of DIN EN ISO 17864:2008-07
DIN EN ISO 17864:2008-07 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control (ISO 17864:2005); German version EN ISO 17864:2008
DIN 9430-2:1984 Aerospace; sampling of semi-finished products in light metals; wrought aluminium alloys
DIN 9430-3:1984 Aerospace; sampling of semi-finished products in light metals; titanium and titanium alloys
DIN 4967-1:1987 Indexable hard metal cutting disc
DIN 9430-2:1984-12 Aerospace; sampling of semi-finished products in light metals; wrought aluminium alloys
DIN 9430-3:1984-12 Aerospace; sampling of semi-finished products in light metals; titanium and titanium alloys
DIN EN ISO 11427:2024-08 Jewellery and precious metals - Determination of silver - Potentiometry using potassium bromide (ISO 11427:2024)
DIN EN 2600:2019-03 Aerospace series - Designation of metallic semi-finished products - Rules; German and English version EN 2600:2018
DIN EN 2600:2018 Aerospace series - Designation of metallic semi-finished products - Rules; German and English version FprEN 2600:2018
DIN EN 2600:2019 Aerospace series - Designation of metallic semi-finished products - Rules; German and English version EN 2600:2018
DIN EN ISO 11427:2023 Jewellery and precious metals - Determination of silver in silver alloys - Potentiometry using potassium bromide (ISO/DIS 11427:2023); German and English version prEN ISO 11427:2023
DIN 9430-1:1984-12 Aerospace; sampling of semi-finished products in light metals; wrought aluminium alloys, titanium and titanium alloys; general
DIN EN ISO 11427:2023-03 Jewellery and precious metals - Determination of silver in silver alloys - Potentiometry using potassium bromide (ISO/DIS 11427:2023); German and English version prEN ISO 11427:2023 / Note: Date of issue 2023-02-17*Intended as replacement for DIN EN IS...
DIN EN 4000:2003 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products; German and English version EN 4000:2001
DIN EN ISO 17864 E:2007 Draft Document - Corrosion of metals and alloys - Determination of critical pitting temperature under potentiostatic control (ISO 17864:2005); German version prEN ISO 17864:2007
DIN EN ISO 17864 E:2007-12 Draft Document - Corrosion of metals and alloys - Determination of critical pitting temperature under potentiostatic control (ISO 17864:2005); German version prEN ISO 17864:2007
DIN EN 62418:2010-12 Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010
DIN 9430-1:1984 Aerospace; sampling of semi-finished products in light metals; wrought aluminium alloys, titanium and titanium alloys; general
DIN EN 2600 E:2018 Draft Document - Aerospace series - Designation of metallic semi-finished products - Rules; German and English version FprEN 2600:2018
DIN EN ISO 1460:2020-12 Metallic coatings - Hot dip galvanized coatings on ferrous materials - Gravimetric determination of the mass per unit area (ISO 1460:2020); German version EN ISO 1460:2020
DIN EN ISO 12732:2008-07 Corrosion of metals and alloys - Electrochemical potentiokinetic reactivation measurement using the double loop method (based on Cihal's method) (ISO 12732:2006); German version EN ISO 12732:2008
DIN 53531-1:1972 Testing the adhesion of elastomers to metal bonds using a sheet of metal
DIN EN ISO 11427:2024 Jewellery and precious metals - Determination of silver - Potentiometry using potassium bromide (ISO 11427:2024)

European Committee for Standardization (CEN)

EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
CEN EN ISO 17864:2008 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control
EN ISO 17864:2008 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control (ISO 17864:2005)
prEN ISO 11427 Jewellery and precious metals - Determination of silver in silver alloys - Potentiometry using potassium bromide (ISO/DIS 11427:2023)
EN 4000:2001 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
EN ISO 11427:2024 Jewellery and precious metals - Determination of silver - Potentiometry using potassium bromide (ISO 11427:2024)

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 17475:2013 Corrosion of metals and alloys -- Electrochemical test methods -- Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
OS GSO ISO 17864:2013 Corrosion of metals and alloys -- Determination of the critical pitting temperature under potientiostatic control
OS GSO ISO 12732:2014 Corrosion of metals and alloys -- Electrochemical potentiokinetic reactivation measurement using the double loop method (based on Cihal's method)
OS GSO ISO 1460:2007 Metallic coatings-Hot dip galvanized coatings on ferrous materials- Gravimetric determination of the mass per unit area

Danish Standards Foundation

DANSK DS/EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
DS/EN ISO 17475:2009 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
DS/EN ISO 17864:2008 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control
DANSK DS/EN ISO 17864:2008 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control
DANSK DS/EN 2600:2019 Aerospace series – Designation of metallic semi-finished products – Rules
DS/EN ISO 12732:2008 Corrosion of metals and alloys - Electrochemical potentiokinetic reactivation measurement using the double loop method (based on Cihal's method)
DANSK DS/EN 4000:2002 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
DANSK DS/ISO 11427:2024 Jewellery and precious metals – Determination of silver – Potentiometry using potassium bromide
DANSK DS/EN 62418:2010 Semiconductor devices - Metallization stress void test
DS/EN 62418:2010 Semiconductor devices - Metallization stress void test
DANSK DS/EN ISO 12732:2008 Corrosion of metals and alloys - Electrochemical potentiokinetic reactivation measurement using the double loop method (based on Cihal's method)
DANSK DS/ISO 1460:2020 Metallic coatings – Hot dip galvanized coatings on ferrous materials – Gravimetric determination of the mass per unit area

American Society for Testing and Materials (ASTM)

ASTM D4388-08 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4388-02 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4388-13 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4388-97 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM F616M-96 Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric)
ASTM F616M-96(2003) Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric)
ASTM D4325-02 Standard Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4325-97 Standard Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4325-08 Standard Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4325-13 Standard Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4388-20 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ASTM D4325-20 Standard Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes

American National Standards Institute （ANSI)

ANSI/ASTM D4388:2013 Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ANSI/ASTM D4325:2013 Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
ANSI/EIA 377-1:1972 Metallized Dielectric Capacitors in Metallic and Non-Metallic Cases for Direct Current Application
ANSI/UL 2565-2013 Standard for Safety for Semiautomatic Metal Sawing Machines

Aerospace, Security and Defence Industries Association of Europe (ASD)

ASD-STAN prEN 2600:1970 Designation of metallic semi-finished products - Rules
ASD-STAN PREN 4000:1997 Aerospace Series Metallic Materials Rules for the Drafting and Presentation of Dimensional Standards for Metallic Semi-Finished Products
ASD-STAN PREN 4000-1997 Aerospace Series Metallic Materials Rules for the Drafting and Presentation of Dimensional Standards for Metallic Semi-Finished Products (Edition P 2)
ASD-STAN TR 3970-1996 Aerospace Series Designation Codes for Semi-Finished Metallic Products

Swedish Institute for Standards

SS-ISO 17475:2005 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarisation measurements (ISO 17475:2005,IDT)
SS-ISO 17864:2005 Corrosion of metals and alloys - Determination of the critical pitting temperature under potentiostatic control (ISO 17864:2005, IDT)
SS-ISO 6282:1994 Plain bearings - Metallic thin-walled half bearings - Determination of the sigma 0,01*-limit
SS-EN ISO 17864:2008 Corrosion of metals and alloys - Determination of the critical pitting temperature under potentiostatic control (ISO 17864:2005)
SS-EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)
SS-EN 2600:2019 Aerospace series - Designation of metallic semi-finished products - Rules
SS-EN 4000:2002 Aerospace series - Metallic materials - Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
SS-ISO 15158:2014 Corrosion of metals and alloys - Method of measuring the pitting potential for stainless steels by potentiodynamic control in sodium chloride solution (ISO 15158:2014, IDT)
SS-EN 62418:2011 Semiconductor devices - Metallization stress void test

RO-ASRO

STAS 9229-1980 NON-FERROUS METALS AND ALLOYS SNAP HEAD RIVETS
STAS 8082-1988 METALLIC HARDWARE FOR FURNITURE SEMI-MORTICE LOCKS WITH SAFETY CYLINDER Dimensions
STAS 9553-1974 SEMIFINISHED PRODUCTS AND PRODUCTS OF NON-FERROUS METALS AND ALLOYS Terminology
STAS 2426-1988 RIGID METALLIC MEASURING RODS
STAS 11587-1983 Metal welding FLUX CORED WIRES FOR WELDING AND SURFACING
STAS 7365-1974 METAL WELDING Fundamental welding positlons
STAS 8640/4-1987 Files for non-ferrous metals working HALF-ROUND FILE Dimesnions
STAS E 12803-1990 Tests of metals CRACK OPENING DISPLACEMENT TESTING
STAS 12181-1984 Tests of Metals HARI NESS TESTING NETHCD UNDER TEH WELDING SEAM
STAS SR ISO 1460:1994 Metallic coatings. Het dip galvanized coatings on ferrous materials. Gravimetric determination of. the mass per unit area

Japanese Industrial Standards Committee (JISC)

JIS B 5111:2000 Locating rings of moulds for plastics
JIS B 5111:1994 Locate rings of moulds for plastics

IT-UNI

UNI 5506-1964 Special purpose machine files. Half- round files for soft metals.
UNI 5975-1967 Methods for chemical analysis of ferrous metal materials. Determination of copper and lead in wear-resistant white metals. controlled potential electrolysis
UNI 5976-1967 Methods for chemical analysis of ferrous metal materials. Determination of copper in wear-resistant white metals, lead alloys for printing and tin-lead soldering alloys. controlled potential electrolysis
UNI 6863-1971 Semi-rigid plastic sheath for deformable metal small tubes

Underwriters Laboratories (UL)

UL 2565-2019 UL Standard for Safety Manual and Semiautomatic Metal Sawing Machines
UL 2565-2013 UL Standard for Safety Manual and Semiautomatic Metal Sawing Machines (First Edition; Reprint with revisions through and including July 26@ 2017)

Lithuanian Standards Office

LST EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)
LST EN ISO 17864:2008 Corrosion of metals and alloys - Determination of the critical pitting temperature under potientiostatic control (ISO 17864:2005)
LST EN ISO 12732:2008 Corrosion of metals and alloys - Electrochemical potentiokinetic reactivation measurement using the double loop method (based on Cihal's method) (ISO 12732:2006)

Gosstandart of Russia

GOST 27861-1988 Billets and semiproducts of nonferrous metals and their alloys. Marking
GOST 16249-1970 Chill moulds. Fixator of metal cores. Construction and dimensions
GOST 24047-1980 Half-finished products out of non-ferrous metals and their alloys. Sampling for tensile test
GOST 25501-1982 Stocks and semifinished products of non-ferrous metals and alloys. Terms and definitions
GOST 20340-1974 Metal casting patterns. Fixing patterns by pins on metal pattern plates. Design and dimensions
GOST 27880-1988 Sectional gas-fired furnaces for iron-and-steel heating. Specific energy consumption

PL-PKN

PN H04420-1988 Metals Metallurgic semiproducts and products Measurement of form deviations
PN M82162-1960 Studs semi-precise length of the metal end 1d
PN M82164-1960 Studs semi-precise length of the metal end 2d
PN H01701-1973 Non-?errous metals Halfproducts and products Marking
PN M82163-1960 Studs semi-precises lenght of the metal end l,25d
PN M55551-28-1988 Metal cutting machin? tools Methods of measurement of positioning repetability
PN M55551-04-1986 Metal cutting machin? tools ethods of measurement of the treightness of displacement

Standards Norway

NS-EN ISO 17475:2008 Corrosion of metals and alloys — Electrochemical test methods — Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)
NS-EN ISO 17864:2008 Corrosion of metals and alloys — Determination of the critical pitting temperature under potientiostatic control (ISO 17864:2005)
NS-EN 2600:2018 Aerospace series — Designation of metallic semi-finished products — Rules
NS-EN 4000:2001 Aerospace series — Metallic materials — Rules for the drafting and presentation of dimensional standards for metallic semi-finished products
NS-EN ISO 11427:2024 Jewellery and precious metals - Determination of silver - Potentiometry using potassium bromide (ISO 11427:2024)

U.S. Military Regulations and Norms

ARMY MIL-M-63530 (1)-1987 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
ARMY MIL-M-63530-1981 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
ARMY MIL-M-63530 NOTICE 1-1997 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
ARMY MIL-M-63324 A VALID NOTICE 1-1988 MICROCIRCUIT, DIGITAL, CMOS, SPECIAL PURPOSE NOR GATE
ARMY MIL-M-63324 A NOTICE 2-1997 MICROCIRCUIT, DIGITAL, CMOS, SPECIAL PURPOSE NOR GATE
ARMY MIL-M-63324 A-1981 MICROCIRCUIT, DIGITAL, CMOS, SPECIAL PURPOSE NOR GATE
ARMY MIL-M-63324 A (1)-1982 MICROCIRCUIT, DIGITAL, CMOS, SPECIAL PURPOSE NOR GATE
ARMY MIL-M-63320 A (4)-1990 MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC)
ARMY MIL-M-63320 A NOTICE 1-1997 MILITARY SPECIFICATION MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC)
ARMY MIL-M-63321 A NOTICE 1-1997 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)
ARMY MIL-M-63320 A-1981 MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC)
ARMY MIL-I-48634 (3)-1993 INTEGRATED CIRCUIT, DIGITAL, CMOS LOGIC ARRAY MONOLITHIC SILICON
ARMY MIL-M-63321 A-1981 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)
ARMY MIL-I-48632-1986 INTEGRATED CIRCUIT, DIGITAL, CMOS CONTROL AND TIMING BASE, MONOLITHIC, SILICON
ARMY MIL-I-48632 (2)-1993 INTEGRATED CIRCUIT, DIGITAL, CMOS CONTROL AND TIMING BASE, MONOLITHIC, SILICON
ARMY MIL-M-63321 A (4)-1990 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)
ARMY MIL-I-48634-1986 INTEGRATED CIRCUIT, DIGITAL, CMOS LOGIC ARRAY MONOLITHIC SILICON
ARMY MIL-M-48646 NOTICE 1-1997 MICROCIRCUIT, DIGITAL, SCO/DLA MULTICHIP CMOS
ARMY MIL-M-48646-1986 MICROCIRCUIT, DIGITAL, SCO/DLA MULTICHIP CMOS
ARMY MIL-I-48632 NOTICE 1-1996 INTEGRATED CIRCUIT, DIGITAL, CMOS CONTROL AND TIMING BASE, MONOLITHIC, SILICON
ARMY MIL-I-48634 NOTICE 1-1996 INTEGRATED CIRCUIT, DIGITAL, CMOS LOGIC ARRAY MONOLITHIC SILICON

American Water Works Association (AWWA)

AWWA C700-2020 Cold-Water Meters - Displacement Type, Metal Alloy Main Case
ANSI/AWWA C700-2020 Cold-Water Meters— Displacement Type, Metal Alloy Main Case
AWWA C700-2015 Cold-Water Meters - Displacement Type, Metal Alloy Main Case

Standard Association of Australia （SAA）

AS 1184:1972 Preferred metric sizes of ferrous and non-ferrous plates - Metric units
AS 1650:1974 Galvanized coatings on ferrous articles Metric Units

GM Europe

GME GMI 60459-2010 Voltage potential measurements between organic and metallic materials (English/German)

CEN - European Committee for Standardization

EN 2600:2018 Aerospace series - Designation of metallic semi-finished products - Rules

CH-SNV

SN 640 317 a-1988 Copper plastic alloy. Copper, nickel alloy. Semi-finished products. Mechanical properties
SNV 81506-1948 Copper plastic alloy. Copper, tin alloy (tin bronze) semi-finished products. Mechanical properties
SEV 1009-1959 Copper plastic alloy. Copper, aluminum alloy (aluminum bronze) semi-finished products. Mechanical properties

SE-SIS

MNC 580-1992 Metallic materials — Semi-manufacturedproducts — Technical delivery requirements — Summary
SIS SS-EN 10 071-1989 Chemical analysis of ferrous materials — Determination of manganese in steels and irons — Electrometric titration method
MNC 545-1971 Summary of Swedish Standards for semi-manufactured products of light meta/ (except tubes)

GCC Standardization Organization

GSO ISO 18089:2021 Corrosion of metals and alloys — Determination of the critical crevice temperature (CCT) for stainless steels under potentiostatic control
GSO IEC 62374-1:2013 Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
GSO IEC 62418:2021 Semiconductor devices - Metallization stress void test

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 18089:2022 Corrosion of metals and alloys — Determination of the critical crevice temperature (CCT) for stainless steels under potentiostatic control
BH GSO ISO 12732:2016 Corrosion of metals and alloys -- Electrochemical potentiokinetic reactivation measurement using the double loop method (based on Cihal's method)
BH GSO IEC 62418:2022 Semiconductor devices - Metallization stress void test

BE-NBN

NBN E 27-108 Metal screws. Half round split milled head screws
NBN I 07-003-1986 Metal anti-corrosion protective layer (by hot electroplating of ferrous metals). Determination of the amount of zinc coating per unit area. gravimetry

European Committee for Electrotechnical Standardization（CENELEC）

EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
EN 62418:2010 Semiconductor devices - Metallization stress void test

General Motors do Brasil

GMSA EMS 9309663-2011 Metal - metal adhesive - medium resistance - high tixotropy - medium expansion Adesivo metal-metal - m閐ia resist阯cia - alta tixotropia - m閐ia expans鉶 Do Not use on New Programs; No Replacement

AWS - American Welding Society

RWMA BULLETIN 19- Resistance Welding of Miscellaneous and Dissimilar Metals

US-RWMA

RWMA BULL 19 Resistance Welding of Miscellaneous and Dissimilar Metals

International Electrotechnical Commission (IEC)

IEC 62418:2010 Semiconductor devices - Metallization stress void test

Aerospace Industries Association/ANSI Aerospace Standards

AIA/NAS NAS 384-1964 Screw-100 Degree Oval Recessed Head Sheet Metal (Rev. 1)
AIA/NAS NAS 385-1981 Screw - 82 Degree Oval Recessed Head Sheet Metal (Rev. 2)

Comitato Elettrotecnico Italiano

CEI EN 62418:2011 Semiconductor devices - Metallization stress void test

YU-JUS

JUS M.C3.366-1988 Plain bearings. Metallic thin-walled half bearings. Determination of the R0，01

ZA-SANS

CKS 160-1971 Non-metallic sanitary pails

National Association of Corrosion Engineers (NACE)

NACE Paper 02417-2013 In-situ Analyses to Characterize the Properties and Metallurgical Attributes of In-Service Piping

South African Bureau of Standard

SANS 367:2005 Plain bearings - Metallic thin-walled half bearings - Determination of the sigma 0,01*-limit

ASD-STAN - Aerospace and Defence Industries Association of Europe - Standardization

PREN 4000-1997 Aerospace Series Metallic Materials Rules for the Drafting and Presentation of Dimensional Standards for Metallic Semi-Finished Products (Edition P 2)

European Association of Aerospace Industries

AECMA PREN 4500-6-1996 Aerospace Series Metallic Materials Rules for Drafting and Presentation of Material Standards Part 6 : Specific Rules for Filler Metals For Brazing Edition P 1

ECIA - Electronic Components Industry Association

377-1970 Metallized Dielectric Capacitors in Metallic and Non-Metallic Cases for Direct Current Application (ANSI C83.62-71)

United States Navy

NAVY MIL-E-16663 A NOTICE 2-2002 ENAMEL, SEMIGLOSS, (FOR METAL SURFACES OF AMMUNITION AND AMMUNITION CONTAINERS)
NAVY MIL-E-16663 A (1)-1976 ENAMEL, SEMIGLOSS, (FOR METAL SURFACES OF AMMUNITION AND AMMUNITION CONTAINERS)

Canadian Standards Association (CSA)

CSA W48-2023 Filler metals and allied materials for metal arc welding

Others: Critical pitting temperature under potentiostatic control for corrosion of metals and alloys,Definition of Half Peak Potential,Standard test method for nonmetallic semiconductive and electrically insulating rubber tapes,What is the general corrosion potential of metals?,metal half potential,Corrosion Potential of Metal,How to Measure the Corrosion Potential of Metals,Corrosion of metals and alloys - critical pitting temperature under electrostatic potential control,Potential of Metallic Materials,half reaction potential,Self-corrosion potential of various metals,self-corrosion potential of metal,Test methods for semi-metals,Potential of metal in solution