Time-of-flight mass spectrometry analysis

Time-of-flight mass spectrometry analysis, Total:26 items.

The international standard classification for "Time-of-flight mass spectrometry analysis" includes: Biology. Botany. Zoology , Laboratory medicine , Chemical analysis , Chemical reagents .

The Chinese standard classification for "Time-of-flight mass spectrometry analysis" includes: Basic Subject in general , Medical laboratory equipment , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer .

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中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

• GB/T 33682-2017 General microganism identification method with matrix-assisted laser desorption/ionization time of flight mass spectrometry

National Metrological Technical Specifications of the People's Republic of China

• JJF 1528-2015 Calibration Specification for Time-of-Flight Mass Spectrometers

国家药监局

• YY/T 1740.2-2021 Clinical mass spectrometer—Part 2:Matrix-assisted laser desorption ionization-time of flight mass spectrometer

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 37849-2019 Method of performance testing for liquid chromatography tandem time of flight mass spectrometry
• GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Group Standards of the People's Republic of China

• T/CRHA 059-2024 General rules for matrix-assisted laser desorption ionization time of flight mass spectrometry for detecting somatic mutations
• T/CITS RM0007-2024 Series CRMs of Oligonucleotide Molecular Mass for Time-of-Flight Mass Spectrometer

Agricultural Standard of the People's Republic of China

• 农业部1782号公告-12-2012 Food safety detection of genetically modified organisms and derived products.Methods for analysis of amino acid sequence of protein by MALDI-TOF-MS

British Standards Institution (BSI)

• BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
• BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
• 20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers

International Organization for Standardization (ISO)

• ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers

GSO

• OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

SCC

• 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer

Association Francaise de Normalisation

• NF T30-711:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).

American Society for Testing and Materials (ASTM)

• ASTM E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy

Japanese Industrial Standards Committee (JISC)

• JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers

Others: Matrix Assisted Laser Desorption Ionization Time-of-Flight Mass Spectrometry,General principles of matrix-assisted laser desorption ionization time-of-flight mass spectrometry for the identification of microorganisms,Laser Desorption Ionization Time-of-Flight Mass Spectrometry,Time-of-flight mass spectrometry analysis,Time-of-flight mass spectrometry analysis,General principles of matrix-assisted laser desorption ionization time-of-flight mass spectrometry,Laser Desorption Time-of-Flight Mass Spectrometry,Laser Assisted Matrix Desorption Time-of-Flight Mass Spectrometry,Matrix Assisted Laser Desorption Time-of-Flight Mass Spectrometry,Analysis of time-of-flight mass spectrometry,Matrix Assisted Laser Desorption-Time-of-Flight Mass Spectrometry