Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)

How to analyze by energy spectrometer

How to analyze by energy spectrometer, Total:240 items.

The international standard classification for "How to analyze by energy spectrometer" includes: Measurement of electrical and magnetic quantities , Optics and optical measurements , IT applications in science , Other standards related to analytical chemistry , Electricity. Magnetism. Electrical and magnetic measurements , Chemical analysis , Analytical chemistry in general , Analytical chemistry .

The Chinese standard classification for "How to analyze by energy spectrometer" includes: Technical management , Electronic measurement and equipment in general , Radio Measurement , Optical Measurement , Computer application , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Basic standards and general methods .


Taiwan Provincial Standard of the People's Republic of China

Group Standards of the People's Republic of China

Professional Standard - Electron

工业和信息化部/国家能源局

  • JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
  • JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer

National Metrological Verification Regulations of the People's Republic of China

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 32267-2015 Terminology of performance testing for analytical instrument
  • GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
  • GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
  • GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
  • GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
  • GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
  • GB/T 11461-1989 Generic specification of spectrum analzers
  • GB/T 25187-2010 Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
  • GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • GB/T 11461-2013 General Specification for Spectrum Analyzer
  • GB/T 11462-1989 Test methods of spectrum analyzers
  • GB/T 17359-2012 Microbeam analysis - Quantitative analysis using energy dispersive spectrometry
  • GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
  • GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
  • GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis

未注明发布机构

  • DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • DIN EN 61207-3 E:2017-07 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
  • DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • DIN EN 61207-6 E:2015-02 Expression of performance of gas analyzers - Part 6: Photometric analyzers

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
  • GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis

National Metrological Technical Specifications of the People's Republic of China

  • JJF 2022-2023 Calibration Specification for Gas Chromatographs of Liquor Analysis
  • JJF 1396-2013 Calibration Specification for Spectrum Analyzer
  • JJF 2078-2023 Calibration Specification for Real-time Spectrum Analyzers

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

工业和信息化部

Military Standard of the People's Republic of China-General Armament Department

  • GJB 8805-2015 Calibration procedures for wideband spectrum analyzers

Professional Standard - Agriculture

Professional Standard - Petroleum

Professional Standard - Post and Telecommunication

  • YD/T 966-1998 Technical specification of SDH performance analyser

IN-BIS

U.S. Air Force

SCC

  • BS EN 61290-1-1:1998 Optical spectrum analyzer
  • BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
  • CEI EN 62129:2006 Calibration of optical spectrum analyzers
  • DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
  • BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • 11/30199190 DC BS ISO 15632. Microbeam analysis. Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
  • CEI EN 61207-6:2016 Expression of performance of gas analyzers Part 6: Photometric analyzers
  • UNE-EN 61207-6:2004 Expression of performance of gas analyzers - Part 6: Photometric analyzers
  • DANSK DS/EN 61207-6:2015 Expression of performance of gas analyzers - Part 6:Photometric analyzers
  • ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
  • BS ISO 15471:2004 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
  • DANSK DS/EN IEC 61207-3:2019 Gas Analyzers – Expression of performance – Part 3: Paramagnetic oxygen analysers
  • BS 6438-1:1984 Electrochemical analyzers-Method for specifying performance common to all analyzers
  • AENOR UNE-EN 61207-6:2004 Expression of performance of gas analyzers - Part 6: Photometric analyzers
  • CEI EN IEC 61207-3:2020 Gas Analyzers - Expression of performance Part 3: Paramagnetic oxygen analysers
  • CEI EN 61207-3:2003 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
  • AENOR UNE-EN 61207-3:2004 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
  • BS 6438-2:1984 Electrochemical analyzers-Method for specifying performance of pH value analyzers
  • DANSK DS/EN 61207-3:2002 Gas analyzers – Expression of performance – Part 3: Paramagnetic oxygen analyzers
  • BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
  • BS 6438-3:1986 Electrochemical analyzers-Method for specifying performance of electrolytic conductivity analyzers
  • BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
  • 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers
  • VDI/VDE/DGQ/DKD 2622 BLATT 11:2003 Calibration of measuring instruments for electrical quantities — spectrum analyzers
  • DANSK DS/EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzers
  • DIN ISO 15632 E:2015 Draft Document - Microbeam analysis - Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012); Text in German and English

European Committee for Standardization (CEN)

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

Association Francaise de Normalisation

  • NF C93-845:2006 Calibration of optical spectrum analyzers.
  • NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
  • NF C46-251-3*NF EN IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3 : paramagnetic oxygen analysers
  • NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
  • NF EN 61207-6:2015 Expression of gas analyzer performance - Part 6: photometric analyzers
  • NF EN IEC 61207-3:2019 Gas analyzers - Performance expression - Part 3: paramagnetic oxygen analyzers
  • NF C46-251-6*NF EN 61207-6:2015 Expression of performance of gas analyzers - Part 6 : photometric analyzers
  • NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
  • NF C46-256:1994 Expression of performance of gas analysers. Part 6 : photometric analyzers.
  • NF ISO 17974:2009 Chemical Analysis of Surfaces - High Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental and Chemical State Analysis
  • NF C46-253*NF EN 61207-3:2002 Gas analysers - Expression of performance - Part 3 : paramagnetic oxygen analysers.
  • NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers

Korean Agency for Technology and Standards (KATS)

  • KS D 1950-1999 Methods for determination of cobalt in nickel materials for electron tubes
  • KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 17973-2021 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 17973-2011(2016) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
  • KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 17974-2021 Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS D ISO 15471-2020 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 19319-2020 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS C IEC 61207-6-2019 Expression of performance of gas analyzers — Part 6: Photometric analyzers
  • KS D ISO 17973-2011(2021) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS C 6918-2020 Test methods of fiber-optic spectrum analyzer
  • KS D ISO 17974-2011(2016) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS D ISO 21270-2020 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS C IEC 61207-6-2014(2019) Expression of performance of gas analyzers — Part 6: Photometric analyzers
  • KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 15471-2005(2020) Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
  • KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
  • KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
  • KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS D ISO 17973:2011 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
  • KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
  • KS D ISO 17974-2011(2021) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis

International Organization for Standardization (ISO)

  • ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
  • ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
  • ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
  • ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis

Danish Standards Foundation

International Electrotechnical Commission (IEC)

  • IEC PAS 62129:2004 Calibration of optical spectrum analyzers
  • IEC 62129:2006 Calibration of optical spectrum analyzers
  • IEC 60714:1981 Expression of the properties of spectrum analyzers
  • IEC 61207-3:2019 RLV Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
  • IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
  • IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
  • IEC 61207-3:1998 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
  • IEC 61455:1995 Nuclear instrumentation - MCA histogram data interchange format for nuclear spectroscopy

GSO

  • BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
  • OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
  • BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
  • OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
  • BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
  • BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
  • OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • GSO IEC 61207-3:2014 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
  • BH GSO IEC 61207-3:2016 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
  • OS GSO IEC 61207-3:2014 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
  • OS GSO IEC 61207-6:2014 Expression of performance of gas analyzers - Part 6: Photometric analyzers
  • OS GSO OIML R83:2008 Gas chromatograph/mass spectrometer systems for the analysis of organic pollutants in water
  • OS GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • BH GSO ISO 15632:2017 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • GSO IEC 61207-6:2014 Expression of performance of gas analyzers - Part 6: Photometric analyzers

British Standards Institution (BSI)

  • BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
  • BS EN 62129:2006 Calibration of optical spectrum analyzers
  • BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
  • BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • BS 6329:1982 Method of expression of the properties of spectrum analyzers
  • BS EN 61207-6:2015 Expression of performance of gas analyzers. Photometric analyzers
  • BS EN 61207-6:1994 Expression of performance of gas analyzers - Photometric analyzers
  • BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
  • 23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
  • BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
  • BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
  • BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis

Japanese Industrial Standards Committee (JISC)

  • JIS C 6192:2008 Calibration of optical spectrum analyzers
  • JIS K 0127:1992 General rules for ion chromatographic analysis
  • JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
  • JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
  • JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer

Institute of Electrical and Electronics Engineers (IEEE)

US-CFR-file

  • CFR 33-148.277-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.277:How may Federal agencies and States participate in the application process?
  • CFR 33-148.213-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.213:How do I withdraw my application?
  • CFR 50-23.75-2014 Wildlife and fisheries. Part23:Convention on international trade in endangered species of wild fauna and flora (cites). Section23.75:How can I trade internationally in vicun? a (Vicugna vicugna)?
  • CFR 33-148.221-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.221:How do I claim, or object to a claim, that required information is privileged?

BSI

  • BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis

Standard Association of Australia (SAA)

  • ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis

ZA-SANS

American Society for Testing and Materials (ASTM)

  • ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
  • ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems

German Institute for Standardization

  • DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
  • DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN EN 61207-6:1995 Expression of performance of gas analyzers - Part 6: Photometric analyzers (IEC 61207-6:1994); German version EN 61207-6:1994
  • DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
  • DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN EN IEC 61207-3:2020-12 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers (IEC 61207-3:2019); German version EN IEC 61207-3:2019 / Note: DIN EN 61207-3 (2002-11) and DIN EN 61207-3 Berichtigung 1 (2003-05) remain valid alongside this standard u...
  • DIN EN 61207-6:2016-03 Expression of performance of gas analyzers - Part 6: Photometric analyzers (IEC 61207-6:2014); German version EN 61207-6:2015 / Note: DIN EN 61207-6 (1995-02) remains valid alongside this standard until 2017-12-30.
  • DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English

KR-KS

  • KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
  • KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

CENELEC - European Committee for Electrotechnical Standardization

  • EN 61207-6:1994 Expression of Performance of Gas Analyzers Part 6: Photometric Analyzers

RU-GOST R

  • GOST 4.361-1985 Product-quality index system. Mass-spectrometric analysers. Index nomenclature

Lithuanian Standards Office

ES-UNE

  • UNE-EN 61207-6:2015 Expression of performance of gas analyzers - Part 6:Photometric analyzers (Endorsed by AENOR in February of 2015.)
  • UNE-EN IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers (Endorsed by Asociación Española de Normalización in October of 2019.)
  • UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)

European Committee for Electrotechnical Standardization(CENELEC)

  • EN 61207-6:2015 Expression of performance of gas analyzers - Part 6:Photometric analyzers
  • EN IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
  • EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers

AENOR

  • UNE-EN 61207-3:2004 Gas analyzers - Expression of performance -- Part 3: Paramagnetic oxygen analyzers

IEC - International Electrotechnical Commission

  • PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)

AT-OVE/ON

  • OVE EN IEC 61207-3:2021 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers (german version)

CZ-CSN

  • CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters

Indonesia Standards

  • SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers

SAE - SAE International

  • SAE AIR1255-1971 Spectrum Analyzers for Electromagnetic Interference Measurements

Society of Automotive Engineers (SAE)

  • SAE AIR1255-2009 Spectrum Analyzers for Electromagnetic Interference Measurements

Association of German Mechanical Engineers

DIN

  • DIN ISO 15632:2022 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...

VDI - Verein Deutscher Ingenieure