How to analyze by energy spectrometer
How to analyze by energy spectrometer, Total:240 items.
The international standard classification for "How to analyze by energy spectrometer" includes: Measurement of electrical and magnetic quantities , Optics and optical measurements , IT applications in science , Other standards related to analytical chemistry , Electricity. Magnetism. Electrical and magnetic measurements , Chemical analysis , Analytical chemistry in general , Analytical chemistry .
The Chinese standard classification for "How to analyze by energy spectrometer" includes: Technical management , Electronic measurement and equipment in general , Radio Measurement , Optical Measurement , Computer application , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Basic standards and general methods .
Taiwan Provincial Standard of the People's Republic of China
- CNS 14341-1999 Optical spectrum analyzer
Group Standards of the People's Republic of China
- T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
- T/ZPP 017-2023 Mass Cytometry Analyzer
Professional Standard - Electron
- SJ/Z 9076-1987 Expression of properties of logic analyzers
- SJ 20251-1993 Verification reguation of model YH4020/YH4021/YH4022 spectrum analyzers
- SJ 20250-1993 Verification reguation of model HP8590A RF spectrum analyzers
- SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum
- SJ 20249-1993 Verification reguation of model BP28A LF spectrum analyzers
- SJ/T 10606-1994 Generic specification for video spectrum analyzers
- SJ/T 10234-1991 Spectrum analyzer for QF4031
- SJ 20914-2004 General specification for spectrum analyzer
工业和信息化部/国家能源局
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
National Metrological Verification Regulations of the People's Republic of China
- JJG(电子) 07007-1989 141T/8554B/8552B Spectrum Analyzer Verification Regulations
- JJG(航天) 10-1985 2112 Verification Regulations for Spectrum Analyzers
- JJG(航天) 9-1985 2107 Verification Regulations for Spectrum Analyzers
- JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication
- JJG(电子) 07010-1991 Specification for verification of YH4032 model panoramic spectrum analyzers
- JJG 501-2000 Spectrum Analyzer
- JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
- JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 32267-2015 Terminology of performance testing for analytical instrument
- GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
- GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
- GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
- GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
- GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
- GB/T 11461-1989 Generic specification of spectrum analzers
- GB/T 25187-2010 Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
- GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- GB/T 11461-2013 General Specification for Spectrum Analyzer
- GB/T 11462-1989 Test methods of spectrum analyzers
- GB/T 17359-2012 Microbeam analysis - Quantitative analysis using energy dispersive spectrometry
- GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
- GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
- GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
未注明发布机构
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- DIN EN 61207-3 E:2017-07 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- DIN EN 61207-6 E:2015-02 Expression of performance of gas analyzers - Part 6: Photometric analyzers
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
- GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
National Metrological Technical Specifications of the People's Republic of China
- JJF 2022-2023 Calibration Specification for Gas Chromatographs of Liquor Analysis
- JJF 1396-2013 Calibration Specification for Spectrum Analyzer
- JJF 2078-2023 Calibration Specification for Real-time Spectrum Analyzers
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB/J 5859-2006 Verification regulation for broadband spectrum analyzer
工业和信息化部
- HG/T 5831-2021 Chemical online gas mass spectrometer
Military Standard of the People's Republic of China-General Armament Department
- GJB 8805-2015 Calibration procedures for wideband spectrum analyzers
Professional Standard - Agriculture
- JJG(教委) 021-1996 Verification Regulations for Analytical Gas Chromatograph
Professional Standard - Petroleum
- SY/T 5566-1998 The crude oil water-cut analyzer with a low energy source
- SY 5566-2011 Low Energy Crude Water Analyzer
- SY/T 5566-2011 The Crude Oil Water-cut Analyzer with a Low Energy Source
Professional Standard - Post and Telecommunication
- YD/T 966-1998 Technical specification of SDH performance analyser
IN-BIS
- IS 11148-1984 Spectrum Analyzer Performance
- IS 12350-1987 Logic Analyzer Performance Expression
U.S. Air Force
- AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
- AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER
- AIR FORCE A-A-59112 A VALID NOTICE 1-2012 Spectrum Analyzer 100 HZ to 1.8 GHZ
- AIR FORCE A-A-59130 VALID NOTICE 1-2012 Analyzer, Spectrum 10 KHZ to 50 GHZ
- AIR FORCE A-A-59130-1997 ANALYZER, SPECTRUM 10 KHZ TO 50 GHZ
- AIR FORCE A-A-59112 A-2002 SPECTRUM ANALYZER 100 HZ TO 1.8 GHZ
SCC
- BS EN 61290-1-1:1998 Optical spectrum analyzer
- BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- CEI EN 62129:2006 Calibration of optical spectrum analyzers
- DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
- BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
- BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- 11/30199190 DC BS ISO 15632. Microbeam analysis. Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
- CEI EN 61207-6:2016 Expression of performance of gas analyzers Part 6: Photometric analyzers
- UNE-EN 61207-6:2004 Expression of performance of gas analyzers - Part 6: Photometric analyzers
- DANSK DS/EN 61207-6:2015 Expression of performance of gas analyzers - Part 6:Photometric analyzers
- ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
- BS ISO 15471:2004 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
- DANSK DS/EN IEC 61207-3:2019 Gas Analyzers – Expression of performance – Part 3: Paramagnetic oxygen analysers
- BS 6438-1:1984 Electrochemical analyzers-Method for specifying performance common to all analyzers
- AENOR UNE-EN 61207-6:2004 Expression of performance of gas analyzers - Part 6: Photometric analyzers
- CEI EN IEC 61207-3:2020 Gas Analyzers - Expression of performance Part 3: Paramagnetic oxygen analysers
- CEI EN 61207-3:2003 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- AENOR UNE-EN 61207-3:2004 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- BS 6438-2:1984 Electrochemical analyzers-Method for specifying performance of pH value analyzers
- DANSK DS/EN 61207-3:2002 Gas analyzers – Expression of performance – Part 3: Paramagnetic oxygen analyzers
- BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- BS 6438-3:1986 Electrochemical analyzers-Method for specifying performance of electrolytic conductivity analyzers
- BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers
- VDI/VDE/DGQ/DKD 2622 BLATT 11:2003 Calibration of measuring instruments for electrical quantities — spectrum analyzers
- DANSK DS/EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzers
- DIN ISO 15632 E:2015 Draft Document - Microbeam analysis - Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012); Text in German and English
European Committee for Standardization (CEN)
- CEN EN 62129-2006 Calibration of optical spectrum analyzers
- CEN EN 62129-2006_ Calibration of optical spectrum analyzers
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
- IEEE 748-1979 STANDARD FOR SPECTRUM ANALYZERS
Association Francaise de Normalisation
- NF C93-845:2006 Calibration of optical spectrum analyzers.
- NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
- NF C46-251-3*NF EN IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3 : paramagnetic oxygen analysers
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
- NF EN 61207-6:2015 Expression of gas analyzer performance - Part 6: photometric analyzers
- NF EN IEC 61207-3:2019 Gas analyzers - Performance expression - Part 3: paramagnetic oxygen analyzers
- NF C46-251-6*NF EN 61207-6:2015 Expression of performance of gas analyzers - Part 6 : photometric analyzers
- NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
- NF C46-256:1994 Expression of performance of gas analysers. Part 6 : photometric analyzers.
- NF ISO 17974:2009 Chemical Analysis of Surfaces - High Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental and Chemical State Analysis
- NF C46-253*NF EN 61207-3:2002 Gas analysers - Expression of performance - Part 3 : paramagnetic oxygen analysers.
- NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
Korean Agency for Technology and Standards (KATS)
- KS D 1950-1999 Methods for determination of cobalt in nickel materials for electron tubes
- KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS D ISO 17973-2021 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 17973-2011(2016) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
- KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 17974-2021 Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
- KS D ISO 15471-2020 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 19319-2020 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS C IEC 61207-6-2019 Expression of performance of gas analyzers — Part 6: Photometric analyzers
- KS D ISO 17973-2011(2021) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS C 6918-2020 Test methods of fiber-optic spectrum analyzer
- KS D ISO 17974-2011(2016) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
- KS D ISO 21270-2020 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS C IEC 61207-6-2014(2019) Expression of performance of gas analyzers — Part 6: Photometric analyzers
- KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 15471-2005(2020) Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
- KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
- KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
- KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- KS D ISO 17973:2011 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS D ISO 17974-2011(2021) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
International Organization for Standardization (ISO)
- ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
- ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
Danish Standards Foundation
- DS/EN 62129:2006 Calibration of optical spectrum analyzers
- DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
- DS/EN 61207-3/Corr.2:2003 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- DS/EN 61207-3:2002 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- DS/EN 61207-3/Corr.1:2003 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
International Electrotechnical Commission (IEC)
- IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- IEC 62129:2006 Calibration of optical spectrum analyzers
- IEC 60714:1981 Expression of the properties of spectrum analyzers
- IEC 61207-3:2019 RLV Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
- IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
- IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
- IEC 61207-3:1998 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- IEC 61455:1995 Nuclear instrumentation - MCA histogram data interchange format for nuclear spectroscopy
GSO
- BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
- BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
- BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- GSO IEC 61207-3:2014 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- BH GSO IEC 61207-3:2016 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- OS GSO IEC 61207-3:2014 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- OS GSO IEC 61207-6:2014 Expression of performance of gas analyzers - Part 6: Photometric analyzers
- OS GSO OIML R83:2008 Gas chromatograph/mass spectrometer systems for the analysis of organic pollutants in water
- OS GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BH GSO ISO 15632:2017 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- GSO IEC 61207-6:2014 Expression of performance of gas analyzers - Part 6: Photometric analyzers
British Standards Institution (BSI)
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
- BS EN 62129:2006 Calibration of optical spectrum analyzers
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
- BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS 6329:1982 Method of expression of the properties of spectrum analyzers
- BS EN 61207-6:2015 Expression of performance of gas analyzers. Photometric analyzers
- BS EN 61207-6:1994 Expression of performance of gas analyzers - Photometric analyzers
- BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
- 23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
- BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
- BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
Japanese Industrial Standards Committee (JISC)
- JIS C 6192:2008 Calibration of optical spectrum analyzers
- JIS K 0127:1992 General rules for ion chromatographic analysis
- JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
- JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE Std 748-1979 IEEE Standard for Spectrum Analyzers
US-CFR-file
- CFR 33-148.277-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.277:How may Federal agencies and States participate in the application process?
- CFR 33-148.213-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.213:How do I withdraw my application?
- CFR 50-23.75-2014 Wildlife and fisheries. Part23:Convention on international trade in endangered species of wild fauna and flora (cites). Section23.75:How can I trade internationally in vicun? a (Vicugna vicugna)?
- CFR 33-148.221-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.221:How do I claim, or object to a claim, that required information is privileged?
BSI
- BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
Standard Association of Australia (SAA)
- ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ZA-SANS
- SANS 62129:2008 Calibration of optical spectrum analyzers
American Society for Testing and Materials (ASTM)
- ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
- ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
- ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
- ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
German Institute for Standardization
- DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN EN 61207-6:1995 Expression of performance of gas analyzers - Part 6: Photometric analyzers (IEC 61207-6:1994); German version EN 61207-6:1994
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN EN IEC 61207-3:2020-12 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers (IEC 61207-3:2019); German version EN IEC 61207-3:2019 / Note: DIN EN 61207-3 (2002-11) and DIN EN 61207-3 Berichtigung 1 (2003-05) remain valid alongside this standard u...
- DIN EN 61207-6:2016-03 Expression of performance of gas analyzers - Part 6: Photometric analyzers (IEC 61207-6:2014); German version EN 61207-6:2015 / Note: DIN EN 61207-6 (1995-02) remains valid alongside this standard until 2017-12-30.
- DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
KR-KS
- KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
- KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
CENELEC - European Committee for Electrotechnical Standardization
- EN 61207-6:1994 Expression of Performance of Gas Analyzers Part 6: Photometric Analyzers
RU-GOST R
- GOST 4.361-1985 Product-quality index system. Mass-spectrometric analysers. Index nomenclature
Lithuanian Standards Office
- LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
- LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
- LST EN 61207-6-2001 Expression of performance of gas analyzers. Part 6: Photometric analyzers (IEC 61207-6:1994)
ES-UNE
- UNE-EN 61207-6:2015 Expression of performance of gas analyzers - Part 6:Photometric analyzers (Endorsed by AENOR in February of 2015.)
- UNE-EN IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers (Endorsed by Asociación Española de Normalización in October of 2019.)
- UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
European Committee for Electrotechnical Standardization(CENELEC)
- EN 61207-6:2015 Expression of performance of gas analyzers - Part 6:Photometric analyzers
- EN IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
- EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
AENOR
- UNE-EN 61207-3:2004 Gas analyzers - Expression of performance -- Part 3: Paramagnetic oxygen analyzers
IEC - International Electrotechnical Commission
- PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)
AT-OVE/ON
- OVE EN IEC 61207-3:2021 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers (german version)
CZ-CSN
- CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
Indonesia Standards
- SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers
SAE - SAE International
- SAE AIR1255-1971 Spectrum Analyzers for Electromagnetic Interference Measurements
Society of Automotive Engineers (SAE)
- SAE AIR1255-2009 Spectrum Analyzers for Electromagnetic Interference Measurements
Association of German Mechanical Engineers
- VDI/VDE/DGQ/DKD 2622 Blatt 11-2003 Calibration of measurement equipments for electrical quantities - Spectrum analyzers
DIN
- DIN ISO 15632:2022 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
VDI - Verein Deutscher Ingenieure
- VDI/VDE/DGQ/DKD 2622 Blatt 11-1999 Kalibrieren von Messmitteln fuer elektrische Groessen - Spektrumanalysatoren
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