What does transmission electron microscopy analyze
What does transmission electron microscopy analyze, Total:39 items.
The international standard classification for "What does transmission electron microscopy analyze" includes: Physicochemical methods of analysis , Other standards related to analytical chemistry , Optical measuring instruments , Chemical analysis .
The Chinese standard classification for "What does transmission electron microscopy analyze" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer .
Professional Standard - Education
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 011-1996 General rules for transmission electron microscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
工业和信息化部
- YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method
Professional Standard - Non-ferrous Metal
- YS/T 1623-2023 Inspection of ageing precipitates for aluminium alloys ——Transmission electron microscopy method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
Professional Standard - Machinery
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 5383-1991 Specification for Transmission Electron Microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
GSO
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
International Organization for Standardization (ISO)
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- ISO 20263:2017 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
US-CFR-file
- CFR 13-126.601-2013 Business Credit and Assistance. Part126:HUBZone program. Section126.601:What additional requirements must a qualified HUBZone SBC meet to bid on a contract?
- CFR 13-126.900-2013 Business Credit and Assistance. Part126:HUBZone program. Section126.900:What are the requirements for representing HUBZone status, and what are the penalties for misrepresentation?
SCC
- AWWA JAW6742 Journal AWWA — Analyzing Asbestos Fibers in Water by Means of Transmission Electron Microscopy
- AWWA WQTC64193 What Does Total Coliform Monitoring Tell Us and the Effects of Sample Volume on Analytical Sensitivity
Defense Logistics Agency
- DLA A-A-52040 VALID NOTICE 2-2007 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)
- DLA A-A-52040 VALID NOTICE 1-2001 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)
- DLA A-A-52040-1992 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)
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