electron wavelength

electron wavelength, Total:163 items.

The international standard classification for "electron wavelength" includes: Geology. Meteorology. Hydrology , Fiber optic interconnecting devices , Other standards related to analytical chemistry , Fibre optic systems in general , Navigation and control equipment .

The Chinese standard classification for "electron wavelength" includes: Radio communication equipment , Radar, navigation, remote control, remote measuring and antenna synthesis , Meteorology , Optical communication equipment , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Marine communication equipment , Carrier communication equipment .

Professional Standard - Electron

SJ 20642.7-2000 Semiconductor optoelectronics devices - Detail specification for Type GR1325J light emitting diode module
SJ 20862-2003 General specification for medium/long wave tactic radio
SJ 20839-2002 Computational methods of LW ground-wave transmission channels
SJ 2968-1988 Generic specification for surface acoustic wave (SAW) filters for use in electronic equipment

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 33701-2017 Pyrgeometer
GB/T 29230.1-2012 Opto-electronic-opto bidirectional wavelength converter for plastic optical fiber transmission system—Part 1:Wavelength converter between 650 nm and 1 550 nm(or 1 310 nm or 850 nm)of 100 Mbit/s ethernet
GB/T 34081-2017 Wavelength selective switch
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

National Metrological Verification Regulations of the People's Republic of China

JJG(邮电) 045-1999 Optical Wavelength/Frequency Meter
JJG 963-2202 Optical Wavelength Meter for Communication
JJG 963-2022 Optical Wavelength Meters in Telecommunication

Professional Standard - Energy and Power Planning

DL/T 2223-2021 Guide for long wave-front time impulse voltage test technology

Group Standards of the People's Republic of China

T/CEMIA 013-2018 Short wavelength WDM multimode optical fiber

Professional Standard - Machinery

JB/T 12261-2015 Motor stator wave shape wire winding machine
JB/T 6841-1993 Terminology of Electronic Optical Instrument

Military Standard of the People's Republic of China-General Armament Department

GJB 3312-1998 General specification for microwave tubes
GJB 8917-2017 Long wave timing technical requirements
GJB 3312A-2011 General specification for microwave tubes
GJB/Z 40.3-1993 Military vacuum electronic device series spectrum microwave tubes
GJB 3311A-2011 Microwave tube test method
GJB 5954-2007 General test procedures of communication range Medium and long wave radio
GJB 3311-1998 Microwave tube test method

Professional Standard - Traffic

JT/T 696-2007 Performance requirement for SW SSB station of ships sailing in Changjiang River

Taiwan Provincial Standard of the People's Republic of China

CNS 6434-1980 Power Filter Inductors for Electronic Equipment
CNS 10871-1984 Terminal for Flat-oval Telephone Cord

Professional Standard - Post and Telecommunication

YDJ 5-1985 Specification for Installation Design of Long-Distance Communications Carrier Telephone Equipment

National Metrological Technical Specifications of the People's Republic of China

JJF 1992-2022 Calibration Specification for Pyrgeometers
JJF 2200-2025 Calibration Specification for Long Wave Simulators

British Standards Institution (BSI)

BS EN ISO 7944:2024 Optics and photonics. Reference wavelengths
BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 14594:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 14594:2024 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 17470:2004 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments. Michelson interferometer single wavelength meters
23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS PD ISO/TS 22077-3:2015 Health informatics. Medical waveform format. Long term electrocardiography
BS ISO 22077-3:2023 Health informatics. Medical waveform format - Long-term electrocardiography
PD ISO/TS 22077-3:2015 Health informatics. Medical waveform format. Long term electrocardiography
BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS DD IEC/PAS 62435:2006 Electronic components - Long duration storage of electronic components - Guidance for implementation
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

International Organization for Standardization (ISO)

ISO 7944:2024 Optics and photonics - Reference wavelengths
ISO 14594:2003 Microbeam analysis - Electron microprobe analysis (Castaing Microprobe) - Guidelines for determining experimental parameters for wavelength dispersive spectrometry
ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 14594:2024 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Danish Standards Foundation

DANSK DS/ISO 7944:2024 Optics and photonics – Reference wavelengths
DANSK DS/EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters
DANSK DS/EN 62099:2001 Fibre optic wavelength switches - Generic specification
DS/EN 62099:2001 Fibre optic wavelength switches - Generic specification

Association Francaise de Normalisation

NF EN ISO 7944:2024 Optics and photonics - Reference wavelengths
NF EN 61280-2-10:2006 Test procedures for fiber optic telecommunications subsystems - Part 2-10: digital systems - Measurement of time-resolved wavelength fluctuation and alpha factor of laser transmitters
NF C93-846-2*NF EN 62129-2:2011 Calibration of wavelength/optical frequency measurement insturments - Part 2 : Michelson interferometer single wavelength meters.
NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF C93-918*NF EN 62099:2001 Fibre optic wavelength switches - Generic specification
NF UTE C96-029:2011 Electronic components - Long-term storage of electronic components - Implementation guide
NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
NF EN 62099:2001 Fiber Optic Wavelength Switches – Generic Specification

European Committee for Standardization (CEN)

EN ISO 7944:2024 Optics and photonics - Reference wavelengths (ISO 7944:2024)

Spanish Association for Standardization (UNE)

AENOR UNE-EN ISO 7944:2025 Optics and photonics. Reference wavelengths. (ISO 7944:2024)
UNE-EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters (Endorsed by AENOR in October of 2011.)
UNE-EN 62099:2001 Fibre optic wavelength switches - Generic specification. (Endorsed by AENOR in November of 2001.)
UNE-EN 60495:1996 SINGLE SIDEBAND POWER-LINE CARRIER TERMINALS.

International Telecommunication Union (ITU)

ITU-R V.431-7-2000 Nomenclature of the frequency and wavelength bands used in telecommunications
ITU-T B.15 FRENCH-1996 Nomenclature of the frequency and wavelength bands used in telecommunications
ITU-R V.431-8-2015 Nomenclature of the frequency and wavelengh bands used in telecommunications
ITU-T B.15 SPANISH-1996 Nomenclature of the frequency and wavelength bands used in telecommunications
ITU-T B.15-1984 Nomenclature of the frequency and wavelength bands used in telecommunications
ITU-T G.654-1993 Characteristics of a 1550 nm wavelength loss-minimized single-mode optical fibre cable
ITU-T G.654-1988 Characteristics of a 1550 nm wavelength loss-minimized single-mode optical fibre cable

Institute of Electrical and Electronics Engineers (IEEE)

IEEE 1902.1-2009 Long wavelength wireless network protocol

Magyar Szabványügyi Testület

MSZ 9200/23-1980 Electronic signals. microwave electronic signal

Korean Agency for Technology and Standards (KATS)

KS D ISO 14594:2012 Microbeam analysis－Electron probe microanalysis－Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS C IEC 60495:2014 Single sideband power－line carrier terminals
KS C IEC 60495:2004 Single sideband power-line carrier terminals
KS C IEC 60250-2003(2018) Recommended methods for the determination of the permittivity and dielectric dissipation factor of electrical insulating materials at power, audio and radio frequencies including metre wavelengths

Society of Automotive Engineers (SAE)

SAE GEIA-STD-0003A-2017 Long Term Storage of Electronic Devices
SAE GEIASTD0003-2006 Long Term Storage of Electronic Devices
SAE GEIASTD0003A-2017 Long Term Storage of Electronic Devices
SAE GEIASTD0003 Long Term Storage of Electronic Devices
SAE GEIASTD0003A Long Term Storage of Electronic Devices

Internet Engineering Task Force (IETF)

RFC 7581-2015 Routing and Wavelength Assignment Information Encoding for Wavelength Switched Optical Networks
RFC 7446-2015 Routing and Wavelength Assignment Information Model for Wavelength Switched Optical Networks

Gosstandart of Russia

GOST R 50314-1992 Optics. Reference wavelengths

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 14594:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BH GSO ISO 11938:2017 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

Military Standards (MIL-STD)

MIL MIL-PRF-1/1405E-2009 Electron Tube, Traveling Wave Type 7640
MIL MIL-F-48616/500-1977 COATING, LONG WAVELENGTH PASS FILTER, ORDINARY REQUIREMENTS FOR
MIL MIL-PRF-1/868G-2018 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 2C40A
MIL MIL-PRF-29580C-1998 SPECTACLES, AVIATOR'S, MULTIPLE WAVE LENGTH LASER PROTECTIVE, EDU-5/P (WITH CASE) (SUPERSEDING MIL-S-29580B)
MIL MIL-PRF-1/1657E-2009 Electron Tube, Negative Grid (Microwave) Type 8727
MIL MIL-PRF-1/484E-2008 Electron Tube, Negative Grid (Microwave) Type 6299
MIL MIL-PRF-1/868F-2008 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 2C40A
MIL MIL-PRF-1/1633C-2015 Electron Tube, Negative Grid (Microwave) Type 7211
MIL MIL-PRF-1/1470E-2009 Electron Tube, Microwave (Negative Grid) Type 7698
MIL MIL-DTL-85/3B-2002 WAVEGUIDES, RIGID, RECTANGULAR (MILLIMETER WAVELENGTH) (SUPERSEDING MIL-W-85/3A)
MIL MIL-PRF-1/1147C-2009 Electron Tube, Microwave Noise Source Type 6782
MIL MIL-PRF-1/1429K-2016 Electron Tube, Negative Grid (Microwave) Type 7815
MIL MIL-PRF-1/1120H-2016 Electron Tube, Negative Grid (Microwave) Type 7289
MIL MIL-PRF-1/1470F-2015 Electron Tube, Microwave (Negative Grid) Type 7698

Defense Logistics Agency

DLA MIL-PRF-1/1405 E-2009 ELECTRON TUBE, TRAVELING WAVE TYPE 7640
DLA MIL-PRF-1/1605 C NOTICE 1-2012 ELECTRON TUBE, TRAVELING WAVE TYPE 8128
DLA MIL-E-1/1692A VALID NOTICE 1-1988 ELECTRON TUBE, TRAVELING WAVE TYPE 8878
DLA MIL-PRF-1/1037E-1998 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 6897
DLA MIL-PRF-1/1037 E NOTICE 2-2008 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 6897
DLA MIL-PRF-1/1055 F NOTICE 1-2008 ELECTRON TUBE, MICROWAVE (NEGATIVE GRID) TYPE 6442
DLA MIL-PRF-1/1712D-2003 ELECTRON TUBE, TRAVELING WAVE TYPE DOD-039
DLA MIL-PRF-1/1712 D NOTICE 1-2008 ELECTRON TUBE, TRAVELING WAVE TYPE DOD-039
DLA MIL-PRF-1/1055F-2002 ELECTRON TUBE, MICROWAVE (NEGATIVE GRID) TYPE 6442
DLA MIL-PRF-1/1470 E-2009 ELECTRON TUBE, MICROWAVE (NEGATIVE GRID) TYPE 7698
DLA MIL-PRF-1/1657 E-2009 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 8727
DLA MIL-PRF-1/1633 B VALID NOTICE 1-2009 Electron Tube, Negative Grid (Microwave) Type 7211
DLA MIL-PRF-1/484 E-2008 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 6299
DLA MIL-PRF-1/1335 H NOTICE 1-2012 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 7462
DLA MIL-PRF-1/1429 J VALID NOTICE 1-2011 Electron Tube, Negative Grid (Microwave) Type 7815
DLA MIL-PRF-1/1147 C-2009 ELECTRON TUBE, MICROWAVE NOISE SOURCE TYPE 6782
DLA MIL-PRF-1/1330 G NOTICE 1-2012 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 7486
DLA MIL-PRF-1/1203 K NOTICE 2-2012 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 7077
DLA MIL-PRF-1/868 F-2008 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 2C40A

Electronic Components, Assemblies and Materials Association

ECA 197-A-1973(R1986) Power Filter Inductors for Electronic Equipment
197-A-1973 Power Filter Inductors for Electronic Equipment

GCC Standardization Organization

GSO IEC 62129-2:2014 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters
GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
GSO ISO 14594:2015 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

International Electrotechnical Commission (IEC)

IEC 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters
IEC PAS 62435:2005 Electronic components - Long-duration storage of electronic components - Guidance for implementation

German Institute for Standardization

DIN EN ISO 7944:2025-04 Optics and photonics - Reference wavelengths (ISO 7944:2024); German version EN ISO 7944:2024
DIN EN IEC 62435-4:2019-05*VDE 0884-135-4:2019-05 Electronic components – Long-term storage of electronic semiconductor devices
DIN EN IEC 62435-6:2019-04*VDE 0884-135-6:2019-04 Electronic components – Long-term storage of electronic semiconductor devices
DIN EN IEC 62435-9:2023-09*VDE 0884-135-9:2023-09 Electronic components – Long-term storage of electronic semiconductor devices
DIN EN IEC 62435-8:2022-11*VDE 0884-135-8:2022-11 Electronic components – Long-term storage of electronic semiconductor devices
DIN EN 62435-1:2017-10*VDE 0884-135-1:2017-10 Electronic components – Long-term storage of electronic semiconductor devices
DIN EN 62435-5:2017-10*VDE 0884-135-5:2017-10 Electronic components – Long-term storage of electronic semiconductor devices
DIN EN IEC 62435-7:2022-10*VDE 0884-135-7:2022-10 Electronic components – Long-term storage of electronic semiconductor devices
DIN EN IEC 62435-3:2022-05*VDE 0884-135-3:2022-05 Electronic components – Long-term storage of electronic semiconductor devices
DIN EN 62435-2:2017-10*VDE 0884-135-2:2017-10 Electronic components – Long-term storage of electronic semiconductor devices
DIN EN 62099:2002-03 Fibre optic wavelength switches - Generic specification (IEC 62099:2001); German version EN 62099:2001

American Society for Testing and Materials (ASTM)

ASTM F398-92(1997) Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum
ASTM F398-92(2002) Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum
ASTM DS46-1970 X-ray emission wavelength and keV table

U.S. Air Force

AIR FORCE MIL-E-1/144 E-1968 ELECTRON TUBE, NEGATIVE GRID (MICROWAVE) TYPE 2C43

Government Electronic & Information Technology Association

GEIA-STD-0003-2006 Long Term Storage of Electronic Devices

Japanese Industrial Standards Committee (JISC)

JIS C 5912:2006 General rules of wavelength switches
JIS C 61280-1-3:2010 Fiber optic communication subsystem test procedures -- Central wavelength and spectral width measurement
JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
JIS C 6187:1999 Test methods of optical wavelengthmeters
JIS C 6187-2:2014 Optical wavelength meters -- Part 2: Calibration

BELST

STB 2406-2015 Electronic documents. Policy for long-term preservation of electronic documents in archives

Polski Komitet Normalizacyjny (PKN)

PN T04880-1972 Electronic tubes Oscilloscope and radaroscope tubes Methods of electrical and optical test

Comitato Elettrotecnico Italiano

CEI EN 62129-2:2012 Calibration of wavelength/optical frequency measurement insturments Part 2: Michelson interferometer single wavelength meters

Union Technique de l’Électricité (UTE)

UTE C96-029U*UTE C96-029:2011 Electronic components - Long duration storage of electronic components - Guide for implementation

The Directorate General of Specifications and Metrology (DGSM)

OS GSO IEC/PAS 62435:2014 Electronic components - Long-duration storage of electronic components - Guidance for implementation
OS GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
OS GSO IEC 62099:2014 Fibre optic wavelength switches - Generic specification

Swedish Institute for Standards

SS-EN 62129-2:2012 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters

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