Transmission Electron Microscopy Parameters
Transmission Electron Microscopy Parameters, Total:42 items.
The international standard classification for "Transmission Electron Microscopy Parameters" includes: Chemical analysis , Physicochemical methods of analysis , Optical equipment .
The Chinese standard classification for "Transmission Electron Microscopy Parameters" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Magnifier and microscope .
Professional Standard - Machinery
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5383-1991 Specification for Transmission Electron Microscope
Professional Standard - Education
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 011-1996 General rules for transmission electron microscopy
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
- T/BSPT 6-2024 Particulate technology—Analysis of sub-micron and nanometer heterostructure—Transmission electron microscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
Professional Standard - Ferrous Metallurgy
- YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
International Organization for Standardization (ISO)
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2025 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance
British Standards Institution (BSI)
- BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
- BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- 25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GCC Standardization Organization
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
Korean Agency for Technology and Standards (KATS)
- KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
- KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
- KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
- KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
Japanese Industrial Standards Committee (JISC)
- JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
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