Spectrometer parameters
Spectrometer parameters, Total:253 items.
The international standard classification for "Spectrometer parameters" includes: Optical measuring instruments , Other standards related to optics and optical measurements , Analytical chemistry in general , Chemical analysis , Aluminium and aluminium alloys , Buildings and installations for processing and storage of agricultural produce .
The Chinese standard classification for "Spectrometer parameters" includes: Electron optics and other physical optics instrument , Optical metrological instrument , Optical instrument in general , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Optical Measurement , Light metals and their alloys analysis method , Agricultural products and feed processing machinery .
Professional Standard - Machinery
- JB/T 10574-2013 Optical Length Measuring Instruments - Basic Parameters
- JB/T 10574-2006 Optical length measuring instruments -- Basic parameters
- JB/T 6176-1992 Basic Parameter of Photographic Plate Cassette and Cassette Frame for Spectrograph
- JB/T 9330-1999 The basic parameter for diaphragm plate of optical instrument
- JB/T 8231-1999 The basic parameters of the plane-gratings spectrographs
- JB/T 9346-1999 Basic parameters for spectrophotometer
- JB/T 9322-1999 Spectrum projector
- JB/T 6266-1992 Optical Comparator for Angle Measurement - Basic Parameter
- JB/T 5590-1991 Optical Filter of Optical Spectrum Instrument
- JB/T 11145-2011 X-ray fluorescence spectrometer
Group Standards of the People's Republic of China
- T/SZFAA 01-2018 Specification of Spectral Parameters of Artificial Radiation Sources for Plants
- T/CBJ 2203-2019 Determination of the aged Baijiu by fluorescence spectrometry
- T/ZZB 0673-2018 Emission spectrometer
- T/QGCML 1522-2023 FLA Micro Fiber Spectrometer
Jilin Provincial Standard of the People's Republic of China
- DB22/T 2414-2015 Micro fiber optic spectrometer
- DB22/T 1812-2013 Non-destructive and rapid determination of ginseng polysaccharides in ginseng by near-infrared spectroscopy
Military Standard of the People's Republic of China-General Armament Department
- GJB 2740-1996 Pulse laser rangefinder parameter series
Professional Standard - Military and Civilian Products
- WJ 2098-1992 Pulse laser range finder parameter series
Qinghai Provincial Standard of the People's Republic of China
- DB63/T 1826-2020 Determination of Available Boron in Soil Boiling Water Extraction Inductively Coupled Plasma Emission Spectrometry
- DB63/T 1823-2020 Determination of Available Silicon in Soil by Citric Acid Extraction Inductively Coupled Plasma Emission Spectrometry
- DB63/T 1824-2020 Determination of Available Sulfur in Soil by Inductively Coupled Plasma Emission Spectrometry
- DB63/T 1820-2020 Determination of available potassium and slow-acting potassium in soil by inductively coupled plasma emission spectrometry
- DB63/T 1821-2020 Determination of magnetism in iron ore by inductively coupled plasma emission spectrometry
- DB63/T 1822-2020 Determination of Available Phosphorus in Soil by Inductively Coupled Plasma Emission Spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 3720-1988 Optical length measuring instruments--Basic parameters
- GB/T 21191-2007 Atomic fluorescence spectrometer
- GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
- GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
Taiwan Provincial Standard of the People's Republic of China
- CNS 14341-1999 Optical spectrum analyzer
National Metrological Verification Regulations of the People's Republic of China
- JJG 768-2005 Verification Regulation of Emission Spectrometer
Professional Standard - Non-ferrous Metal
- YS/T 1036-2015 Test method of optical emission spectrometric analysis of magnesium rare earth alloys
Shanxi Provincial Standard of the People's Republic of China
- DB14/T 1435-2017 Data preprocessing of ground laser raindrop spectrometer detection
Professional Standard - Supply and Marketing Cooperative
- GH/T 1337-2021 Rapid determination of impurity content of seed cotton. Near infrared spectroscopy
Czech Standards Institute (UNMZ)
- CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
British Standards Institution (BSI)
- BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
- BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-2-1:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Optical spectrum analyzer
- BS DD IEC/PAS 61290-3-1:2002 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters-Optical spectrum analyzer
- BS EN 61290-5-1:2000 Optical fibre amplifiers. Basic specification. Test methods for reflectance parameters-Optical spectrum analyser
- BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
- BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
- BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
- BS EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Electrical spectrum analyzer
- BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
- BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
- BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- BS EN 61290-1-2:1998 Optical fibre amplifiers. Basic specification-Test methods for gain parameters. Electrical spectrum analyzer
- BS EN 61290-3-2:2003 Optical fibre amplifiers - Basic specification - Test methods for noise figure parameters - Electrical spectrum analyzer method
- BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- BS EN 61290-5-2:2004 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Electrical spectrum analyser method
- BS EN 61290-1-1:2007 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
- BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS EN 61290-1-1:1998 Optical spectrum analyzer
- 19/30398879 DC BS EN 61290-1-1. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
- PD ISO/TR 18486:2016 Plastics comparison of spectral irradiance parameters of laboratory light sources for weathering applications with reference solar spectral irradiance
- BS EN 61290-2-3:1998 Optical fibre amplifiers - Basic specification - Test methods for optical power parameters - Optical power meter
- BS EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser
GCC Standardization Organization
- GSO ISO 10260:2013 Water quality -- Measurement of parameters -- Spectrometric determination of the chlorophyll-a concentration
- GSO IEC 61290-5-1:2014 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
- GSO IEC 61290-3-2:2014 Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- GSO IEC 61290-5-2:2014 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
- GSO IEC 61290-10-1:2014 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- GSO IEC 61290-10-4:2014 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- GSO IEC 61290-1-2:2014 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
Danish Standards Foundation
- DANSK DS/EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DANSK DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DANSK DS/EN 61290-1-1:2015 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DANSK DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DANSK DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- DANSK DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- DANSK DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- DS/EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- DANSK DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- DANSK DS/EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
International Electrotechnical Commission (IEC)
- IEC 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
- IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
- IEC PAS 61290-3-1:2002 Optical fibre amplifiers - Basic specification - Part 3-1: Test methods for noise figure parameters - Optical spectrum analyzer
- IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-3-2:2003 Optical amplifiers - Part 3-2: Test methods for noise figure parameters; Electrical spectrum analyzer method
- IEC 61290-10-2:2003 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters; Pulse method using a gated optical spectrum analyzer
- IEC 61290-5-2:2003 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters; Electrical spectrum analyser method
- IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
- IEC 61290-3-2:2008 Amplificateurs optiques – Méthodes d’essais - Partie 3-2: Paramètres du facteur de bruit – Méthode de l’analyseur spectral électrique (Edition 2.0)
- IEC 61290-5-1:2000 Optical fibre amplifiers - Basic specification - Part 5-1: Test methods for reflectance parameters - Optical spectrum analyser
- IEC 61290-10-1:2003 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters; Pulse method using an optical switch and optical spectrum analyzer
- IEC 61290-1-1:1998 Optical fibre amplifiers - Basic specification - Part 1-1: Test methods for gain parameters - Optical spectrum analyzer
- IEC 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- IEC 61290-2-2:1998 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
Korean Agency for Technology and Standards (KATS)
- KS C IEC 61290-3-1-2005(2020) Optical amplifiers - Test methods - Part 3 - 1: Noise figure parameters - Optical spectrum analyzer method
- KS C IEC 61290-5-1-2007(2022) Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-3-1-2020 Optical amplifiers - Test methods - Part 3 - 1: Noise figure parameters - Optical spectrum analyzer method
- KS C IEC 61290-5-1-2007(2017) Optical amplifiers - Test methods - Part 5 - 1: Reflectance parameters - Optical spectrum analyzer method
- KS C IEC 61290-3-1:2005 Optical amplifiers - Test methods - Part 3 - 1: Noise figure parameters - Optical spectrum analyzer method
- KS C IEC 61290-5-1-2022 Optical amplifiers - Test methods - Part 5 - 1: Reflectance parameters - Optical spectrum analyzer method
- KS C IEC 61290-3-2-2020 Optical amplifiers - Part 3 - 2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- KS D ISO 15470:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61290-3-2-2005(2020) Optical amplifiers - Part 3 - 2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61290-10-1-2005(2020) Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS C IEC 61290-10-2-2005(2020) Optical amplifiers - Test methods - Part 10 - 2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 15471:2005 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
- KS C IEC 61290-10-1-2020 Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS C IEC 61290-10-2-2020 Optical amplifiers-Test methods-Part 10-2:Multichannel parameters-Pulse method using a gated optical spectrum analyzer
- KS C IEC 61290-10-1:2005 Optical amplifiers - Test methods - Part 10 - 1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- KS C IEC 61290-10-2:2005 Optical amplifiers - Test methods - Part 10 - 2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
Swedish Institute for Standards
- SS-EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- SS-EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- SS-EN IEC 61290-1-1:2021 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- SS-EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- SS-EN 61290-5-2:2004 Optical fibre amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- SS-EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- SS-EN 61290-2-2:2002 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
- SS-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- SS-EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- SS-EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
Association Francaise de Normalisation
- NF C93-805-1-2*NF EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2 : power and gain parameters - Electrical spectrum analyzer method.
- NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
- NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: noise figure parameters - Optical spectrum analyzer method
- NF EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: reflectance parameters - Optical spectrum analyzer method
- NF EN 61290-3-2:2009 Optical amplifiers - Test methods - Part 3-2: noise figure parameters - Electrical spectral analyzer method
- NF EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: power and gain parameters - Optical spectrum analyzer method
- NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
- NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
- NF C93-805-2-1:1998 Optical fibre amplifiers. Basic specification. Part 2-1 : test methods for optical power parameters. Optical spectrum analyzer.
- NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
- NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
- NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
- NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: reflectance parameters - Electrical spectrum analyzer method
- NF C93-805-5-2*NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2 : reflectance parameters - Electrical spectrum analyser method
- NF C93-805-1-1:1998 Optical fibre amplifiers. Basic specification. Part 1-1 : test methods for gain parameters. Optical spectrum analyzer.
- NF EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: multiple channel parameters - Pulse method using a stroboscopic optical spectrum analyzer
- NF EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: multiple channel parameters - Pulse method using optical switch and optical spectrum analyzer
- NF C93-805-10-4*NF EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4 : multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- NF EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: multiple channel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- NF C93-845:2006 Calibration of optical spectrum analyzers.
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- OS GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- OS GSO IEC 61290-5-2:2014 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
- OS GSO IEC 61290-10-1:2014 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- OS GSO IEC 61290-10-2:2014 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- OS GSO IEC 61290-10-4:2014 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- OS GSO IEC 61290-1-2:2014 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
German Institute for Standardization
- DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
- DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
- DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
- DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
- DIN EN 61290-3-2:2009-06 Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008 / Note: DIN EN 61290-3-2 (2003-08) remains valid alongside this standard until 2011-10-01....
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
- DIN EN 61290-1-1 E:2013-10 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DIN EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
- DIN EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007
- DIN EN 61290-10-1:2010-01 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009 / Note: DIN EN 61290-10-1 (2004-02) remains valid along...
- DIN ISO 15632:2015-10 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
- DIN EN 61290-10-2:2008-07 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008 / Note: DIN EN 61290-10-2 (2004-02) remains valid alongside this stan...
- DIN EN IEC 61290-1-1:2022-07 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020); German version EN IEC 61290-1-1:2020 / Note: DIN EN 61290-1-1 (2016-03) remains valid alongside this standard until 2023-10...
- DIN EN 61290-10-4:2008-02 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007 / Note: Applies in conjunction with DIN EN 61291...
- DIN EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008
- DIN EN IEC 61290-1-1:2019 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 86C/1563/CD:2018); Text in German and English
Spanish Association for Standardization (UNE)
- UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
- UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)
- UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
- UNE-EN 61290-3-2:2008 Optical amplifier test methods -- Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (Endorsed by AENOR in February of 2009.)
- UNE-EN 61290-5-1:2006 Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006). (Endorsed by AENOR in October of 2006.)
- UNE-EN 61290-5-2:2004 Optical amplifiers - Test methods -- Part 5-2: Reflectance parameters - Electrical spectrum analyser method (Endorsed by AENOR in September of 2004.)
- UNE-EN 61290-10-1:2009 Optical amplifiers - Test methods -- Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (Endorsed by AENOR in July of 2009.)
- UNE-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (Endorsed by AENOR in May of 2008.)
- UNE-EN 61290-1-2:2005 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (Endorsed by AENOR in March of 2006.)
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO IEC 61290-3-1:2016 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- BH GSO IEC 61290-1-1:2016 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- BH GSO IEC 61290-3-2:2016 Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- BH GSO IEC 61290-5-2:2016 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
- BH GSO IEC 61290-10-1:2016 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- BH GSO IEC 61290-10-4:2016 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- BH GSO IEC 61290-1-2:2016 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
Gosstandart of Russia
- GOST 17173-1981 Spectral slits and attachments to them. Types, basic parameters and dimensions. Technical requirements
- GOST 26874-1986 Ionizing radiation power spectrometers. Methods of basic parameters measurement
- GOST R 52205-2004 Hard coals. Method for the spectrometric determination of genetic and technological parameters
- GOST 9847-1979 Optical instruments for surface roughness parameters measuring. Basis parameters and types
South African Bureau of Standard
- SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
Comitato Elettrotecnico Italiano
- CEI EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- CEI EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1: Power and gain parameters - Optical spectrum analyzer method
- CEI EN IEC 61290-1-1:2021 Optical amplifiers - Test methods Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- CEI EN 61290-3-2:2010 Optical amplifier test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- CEI EN 61290-2-2:1999 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
- CEI EN 61290-10-1:2010 Optical amplifiers- Test methods Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- CEI EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
Japanese Industrial Standards Committee (JISC)
- JIS C 6122-1-1:2024 Optical amplifiers-Test methods-Part 1-1: Power and gain parameters-Optical spectrum analyzer method
- JIS C 6122-3-1:2011 Optical amplifiers -- Test methods -- Part 3-1: Noise figure parameters -- Optical spectrum analyzer method
- JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
- JIS C 6122-3-2:2006 Optical amplifiers -- Test methods -- Part 3-2: Noise figure parameters -- Electrical spectrum analyzer method
- JIS C 6122-1-1:2011 Optical amplifiers -- Test methods -- Part 1-1: Power and gain parameters -- Optical spectrum analyzer method
- JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
- JIS C 6122-5-1:2001 Optical fiber amplifiers -- Test methods -- Part 5-1: Test methods for reflectance parameters -- Optical spectrum analyzer test method
- JIS C 6122-10-1:2007 Optical amplifiers -- Test methods -- Part 10-1: Multichannel parameters -- Pulse method using an optical switch and optical spectrum analyzer
- JIS C 6122-10-2:2010 Optical amplifiers -- Test methods -- Part 10-2: Multichannel parameters -- Pulse method using a gated optical spectrum analyzer
Standard Association of Australia (SAA)
- AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
International Organization for Standardization (ISO)
- ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
European Committee for Electrotechnical Standardization(CENELEC)
- EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
- EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
- EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
- EN 61290-3-2:2003 Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method
- EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- EN 61290-2-2:1998 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters Electrical SPectrum Analyzer
- EN 61290-3-1:2003 Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method
- EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- EN 61290-10-1:2003 Optical amplifiers Test methods Part 10-1: Multichannel parameters Pulse method using an optical switch and optical spectrum analyzer
- EN 61290-5-1:2006 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- EN 61290-10-2:2003 Optical amplifiers - Test methods Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
American National Standards Institute (ANSI)
- ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
- ANSI/TIA/EIA 455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
- ANSI/TIA-455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
Lithuanian Standards Office
- LST EN 61290-3-1-2004 Optical amplifiers. Test methods. Part 3-1: Noise figure parameters. Optical spectrum analyzer method (IEC 61290-3-1:2003)
- LST EN 61290-5-1-2006 Optical amplifiers -Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006)
- LST EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)
- LST EN 61290-1-1-2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006)
American Society for Testing and Materials (ASTM)
- ASTM STP 517-1972 Optical Emission Spectrometer
- ASTM E3029-15(2023) Standard Practice for Determining Relative Spectral Correction Factors for Emission Signal of Fluorescence Spectrometers
U.S. Air Force
- AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
- AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER
Polski Komitet Normalizacyjny (PKN)
- PN-EN IEC 61290-1-1-2021-06 E Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)
(U.S.) Telecommunications Industries Association
- TIA/EIA-455-209-2000 FOTP-209 IEC 61290-2-1 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
European Committee for Standardization (CEN)
- CEN EN 62129-2006 Calibration of optical spectrum analyzers
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