Off-line spectrometer

Off-line spectrometer, Total:88 items.

The international standard classification for "Off-line spectrometer" includes: Other standards related to optics and optical measurements , Analytical chemistry in general , Chemical analysis , IT applications in science , Other standards related to nuclear energy , Iron ores , Aluminium and aluminium alloys , Geology. Meteorology. Hydrology .

The Chinese standard classification for "Off-line spectrometer" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Computer application , General nuclear instrument , Iron ore , Optical Measurement , Ionizating Radiation Measurement , Metallurgy material and auxiliary material in general , Meteorology .

Professional Standard - Machinery

JB/T 5590-1991 Optical Filter of Optical Spectrum Instrument
JB/T 9331-1999 Slits for optical spectrum instruments
JB/T 11145-2011 X-ray fluorescence spectrometer
JB/T 9322-1999 Spectrum projector
JB/T 9320-1999 Plane-gratings spectrographs

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
GB/T 21191-2007 Atomic fluorescence spectrometer
GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/Z 42358-2023 Iron ores—Wavelength dispersive X-ray fluorescence spectrometers—Determination of precision
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers

National Metrological Verification Regulations of the People's Republic of China

JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers
JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
JJG 768-2005 Verification Regulation of Emission Spectrometer

Group Standards of the People's Republic of China

T/ZZB 0673-2018 Emission spectrometer
T/QGCML 1522-2023 FLA Micro Fiber Spectrometer
T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
T/CAIA YQ003-2016 Testing Methods for Optical/Electrical Characteristics of Linear Charge Coupled Imaging Device for Spectrometer

工业和信息化部/国家能源局

JB/T 12962.1-2016 Energy dispersive X-ray fluorescence spectrometer. Part 1: General specification
JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer

未注明发布机构

DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision

National Metrological Technical Specifications of the People's Republic of China

JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
JJF 2024-2023 Calibration Specification for Energy Dispersive X-Ray Fluorescence Spectrometers

Jilin Provincial Standard of the People's Republic of China

DB22/T 2414-2015 Micro fiber optic spectrometer

Taiwan Provincial Standard of the People's Republic of China

CNS 14341-1999 Optical spectrum analyzer

Professional Standard - Agriculture

JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer

Professional Standard - Non-ferrous Metal

YS/T 702-2009 Determination of silicon oxide,Iron oxide,Sodium oxide content of Aluminum Hydroxide by X-ray fluorescence spectrometric method

中国气象局

QX/T 532-2019 Specifications for Brewer spectrophotometer calibration

GSO

GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
OS GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
BH GSO IEC 61976:2016 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO/TR 18231:2021 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
BH GSO ISO/TR 18231:2022 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Japanese Industrial Standards Committee (JISC)

JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS C 6192:2008 Calibration of optical spectrum analyzers

SCC

DIN IEC 61976:2001 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry (IEC 61976:2000)
BS EN 61290-1-1:1998 Optical spectrum analyzer
CEI 45-35:1997 Standardized test methods of semiconductor X-ray spectrometers
AS 2563:1982 Wavelength dispersive X-ray fluorescence spectrometers - Methods of test for determination of precision
CEI EN 62129:2006 Calibration of optical spectrum analyzers
BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers

Standard Association of Australia （SAA）

AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision

RU-GOST R

GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination
GOST 27176-1986 Spectroscopic optical instruments. Terms and definitions

International Electrotechnical Commission (IEC)

IEC 61976:2000 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe nuclear gamma-ray spectrometry
IEC PAS 62129:2004 Calibration of optical spectrum analyzers

U.S. Air Force

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER

Korean Agency for Technology and Standards (KATS)

KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS C 6918-2020 Test methods of fiber-optic spectrum analyzer

International Organization for Standardization (ISO)

ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

IN-BIS

IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer
IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers

British Standards Institution (BSI)

BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
BS IEC 61428:1998(1999) Nuclear instrumentation — Sample containers for gamma - ray spectrometry with Ge - detectors
BS EN 62129:2006 Calibration of optical spectrum analyzers

European Committee for Standardization (CEN)

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers

German Institute for Standardization

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English

Association Francaise de Normalisation

NF C93-845:2006 Calibration of optical spectrum analyzers.

American Society for Testing and Materials (ASTM)

ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM D5381-93(2014) Standard Guide for X-Ray Fluorescence 40;XRF41; Spectroscopy of Pigments and Extenders

PL-PKN

PN Z70073-1989 Radiation protection in underground ining plants etermination of concentrations of atural radioactive nuckides in nderground sediments with use of amma-ray spectrometry

Danish Standards Foundation

DS/EN 62129:2006 Calibration of optical spectrum analyzers

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