mass spectrometer ionization

mass spectrometer ionization, Total:32 items.

The international standard classification for "mass spectrometer ionization" includes: Measuring instruments , Chemical analysis , Other standards related to optics and optical measurements .

The Chinese standard classification for "mass spectrometer ionization" includes: Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Basic standards and general methods , chromatograph .

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Group Standards of the People's Republic of China

• T/CIMA 0019-2019 Proton transfer reaction mass spectrometers
• T/SZTIC 002-2021 Rapid detection of illegal additives in health food by direct ionization miniature mass spectrometry
• T/CIS 17004-2020 Ambient ionization device

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 31197-2014 Inorganic chemicals for industrial use-Determination of impurity anions - Ion chromatography method
• GB/T 36240-2018 Ion chromatographs
• GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Professional Standard - Medicine

• YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry

National Metrological Verification Regulations of the People's Republic of China

• JJG 823-1993 Verification Regulation of Ion Chromatograph
• JJG(地质) 1008-1990 Verification Regulations for Ion Chromatography
• JJG 823-2014 Verification regulation for ion chromatograph

Professional Standard - Agriculture

• JJG(教委) 020-1996 Verification Regulations for Ion Chromatography

Professional Standard - Environmental Protection

• HJ 778-2015 Water quality - Determination of iodide - Ion chromatiography

National Metrological Technical Specifications of the People's Republic of China

• JJF 2115-2024 Liquid chromatography-inductively coupled plasma mass spectrometry instrument calibration specification

International Organization for Standardization (ISO)

• ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
• ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS

The Directorate General of Specifications and Metrology (DGSM)

• OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

Kingdom of Bahrain Testing and Metrology Directorate

• BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

GCC Standardization Organization

• GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

British Standards Institution (BSI)

• BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• 25/30500395 DC BS ISO 13084 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
• BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
• BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

Japanese Industrial Standards Committee (JISC)

• JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
• JIS K 0127:1992 General rules for ion chromatographic analysis

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