thermal ionization mass spectrometer

thermal ionization mass spectrometer, Total:66 items.

The international standard classification for "thermal ionization mass spectrometer" includes: Chemical analysis , Other standards related to optics and optical measurements , Semiconducting materials , Chemical laboratories. Laboratory equipment , Chemical reagents , Laboratory medicine , Measuring instruments .

The Chinese standard classification for "thermal ionization mass spectrometer" includes: Basic standards and general methods , chromatograph , Hygiene, safety and labor protection , Semimetal and semiconductor material in general , Electrochemical, thermochemistry and optical profile type analyzer , Medical laboratory equipment , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Chemical Measurement , Analysis methods for toxic substances in water .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 36240-2018 Ion chromatographs
GB/T 31197-2014 Inorganic chemicals for industrial use-Determination of impurity anions - Ion chromatography method
GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GB/T 36244-2018 Inductively coupled plasma atomic emission spectrometer
GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials
GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry
GB/T 35925-2018 Determination of impurity fluorine ion in water soluble chemicals—Ion chromatography method
GB/T 34826-2017 Method of performance testing for quadrupole inductively coupled plasma mass spectrometer
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Professional Standard - Medicine

YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry
YY/T 1740.2-2021 Clinical mass spectrometer—Part 2:Matrix-assisted laser desorption ionization-time of flight mass spectrometer

Group Standards of the People's Republic of China

T/CAIA YQ006-2018 Performance testing method of Ion chromatography
T/CIMA 0023-2020 Technical requirements for vehicle-mounted inductively coupled plasma quadrupole mass spectrometer
T/CIS 17004-2020 Ambient ionization device
T/CIMA 0019-2019 Proton transfer reaction mass spectrometers
T/ZJATA 0023-2024 Determination of perchlorate in water Ion chromatography-mass spectrometry/mass spectrometry

Professional Standard - Agriculture

JJG(教委) 020-1996 Verification Regulations for Ion Chromatography
JJG(教委) 004-1996 Verification rules for surface thermoionization isotope mass spectrometer

National Metrological Verification Regulations of the People's Republic of China

JJG 823-1993 Verification Regulation of Ion Chromatograph
JJG 823-2014 Verification regulation for ion chromatograph
JJG(地质) 1008-1990 Verification Regulations for Ion Chromatography

National Metrological Technical Specifications of the People's Republic of China

JJF 1159-2006 Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers
JJF 1715-2018 Program of Pattern Evaluation of Ion Chromatographs
JJF(建材) 174-2020 Calibration Specifications for Portable Gas Chromatographs (Photoionization Detector)
JJF 2115-2024 Liquid chromatography-inductively coupled plasma mass spectrometry instrument calibration specification

Professional Standard - Environmental Protection

HJ 778-2015 Water quality - Determination of iodide - Ion chromatiography
HJ/T 84-2001 Water quality -- Determination of inorangic anions -- Ion chromatography method

Professional Standard - Non-ferrous Metal

YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography

Professional Standard - Electron

SJ/T 11637-2016 General principles of inductively coupled plasma mass spectrometry for electronic chemicals

Jiangxi Provincial Standard of the People's Republic of China

DB36/T 1839-2023 Determination of iodide in water quality by inductively coupled plasma mass spectrometry

American Society for Testing and Materials (ASTM)

ASTM C1413-05(2011) Standard Test Method for Isotopic Analysis of Hydrolyzed Uranium Hexafluoride and Uranyl Nitrate Solutions by Thermal Ionization Mass Spectrometry
ASTM E1770-95(2006) Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
ASTM E1770-95 Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment

International Organization for Standardization (ISO)

ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

GCC Standardization Organization

GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
GSO ISO 26062:2013 Nuclear technology -- Nuclear fuels -- Procedures for the measurement of elemental impurities in uranium- and plutonium-based materials by inductively coupled plasma mass spectrometry
GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

British Standards Institution (BSI)

BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
25/30500395 DC BS ISO 13084 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS EN 17813:2023 Environmental solid matrices. Determination of halogens and sulfur by oxidative pyrohydrolytic combustion followed by ion chromatography

Japanese Industrial Standards Committee (JISC)

JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
JIS K 0127:1992 General rules for ion chromatographic analysis
JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

Swedish Institute for Standards

SS-EN ISO 22818:2021 Textiles - Determination of short-chain chlorinated paraffins (SCCP) and middle-chain chlorinated paraffins (MCCP) in textile products out of different matrices by use of gas chromatography negative ion chemical ionization mass spectrometry (GC-NCI-MS)...

Korean Agency for Technology and Standards (KATS)

KS D ISO 18114-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
KS D ISO 18114-2005(2020) Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials

Association Francaise de Normalisation

NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions

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