Standard Scanning Electron Microscope

Standard Scanning Electron Microscope, Total:36 items.

The international standard classification for "Standard Scanning Electron Microscope" includes: Chemical analysis , Protection against crime .

The Chinese standard classification for "Standard Scanning Electron Microscope" includes: Electron optics and other physical optics instrument , Oil shale , Optical Measurement , Basic standards and general methods , Crime judging technology .

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Professional Standard - Machinery

• JB/T 6842-1993 Test Method of Scanning Electron Microscope
• JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

Professional Standard - Petroleum

• SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
• SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
• GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effects on topography induced by nanoparticles

National Metrological Technical Specifications of the People's Republic of China

• JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Jiangsu Provincial Standard of the People's Republic of China

• DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

• GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

National Metrological Verification Regulations of the People's Republic of China

• JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Shanghai Provincial Standard of the People's Republic of China

• DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Professional Standard - Public Safety Standards

• GA/T 909-2010 Collecting and packaging method for trace evidence—Gunshot residue(SEM/EDS examination)

International Organization for Standardization (ISO)

• ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

Japanese Industrial Standards Committee (JISC)

• JIS K 0132:1997 General rules for scanning electron microscopy

British Standards Institution (BSI)

• 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

American Society for Testing and Materials (ASTM)

• ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
• ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
• ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
• ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
• ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
• ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

SCC

• BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
• 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy

GSO

• BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
• GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

KR-KS

• KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

Korean Agency for Technology and Standards (KATS)

• KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
• KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
• KS I 0051-2019 General rules for scanning electron microscopy
• KS M 0044-1999 General rules for scanning electron microscopy
• KS I 0051-1999(2019) General rules for scanning electron microscopy
• KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary

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