spectral diffraction peak

spectral diffraction peak, Total:86 items.

The international standard classification for "spectral diffraction peak" includes: Particle size analysis. sieving , Radiation protection , Optical measuring instruments , Chemical analysis .

The Chinese standard classification for "spectral diffraction peak" includes: Sieving, Sieve Plate and Sieve Screen , Powder metallurgy analysis method , Radiological sanitation protection , Electron optics and other physical optics instrument , Basic standards and general methods , Semiconductor emitting device , Office supplies and office implements .

Professional Standard - Agriculture

784兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0451 X-ray Diffraction

Professional Standard - Commodity Inspection

SN/T 3131-2012 Determination of asbestos in bicycle brake rubbers-Polarized light microscope and X-ray diffraction method
SN/T 3231-2012 Determination of asbestos in talcum―Polarized light microscope and X-ray diffraction method

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 19077-2016 Particle size analysis―Laser diffraction methods
GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment

National Metrological Technical Specifications of the People's Republic of China

JJF 1967-2022 Calibration Specification for Reflection Gratings by Laser Diffraction

Professional Standard - Machinery

JB/T 8239.2-1999 Specification for diffraction grating
JB/T 8239.1-1999 Basic parameters for diffraction grating

未注明发布机构

DIN ISO 13320 E:2022-05 Particle size analysis - Laser diffraction methods
DIN EN ISO 15902 E:2019-10 Optics and Photonics Diffractive Optics Glossary (Draft)

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

Professional Standard - Electron

SJ 2658.12-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Peak Emission Wavelength and Spectral Half Width
SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth

Professional Standard - Electricity

DL/T 1151.22-2012 Analytical Methods of Scale and Corrosion Products in Power Plants - Part 22: Standard Test Methods of X-ray Fluorescence Spectrometry and X-ray Diffraction

Professional Standard - Education

JY 141-1982 Demonstration Instrument for Interference, Diffraction and Polarization of Light

海关总署

HS/T 49-2016 Talc powder particle size determination laser diffraction method

Association of German Mechanical Engineers

VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter

SCC

VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
DANSK DS/ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary
BS ISO 15902:2004 Optics and photonics. Diffractive optics. Vocabulary
DANSK DS/ISO 13320:2020 Particle size analysis – Laser diffraction methods
DANSK DS/EN ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary (ISO 15902:2019)
NS-EN ISO 15902:2020 Optics and photonics — Diffractive optics — Vocabulary (ISO 15902:2019)
NS-EN ISO 15902:2005 Optics and optical instruments — Diffractive optics — Vocabulary (ISO 15902:2004)
07/30168945 DC BS ISO 13320. Particle size analysis. Laser diffraction methods
CIE 250:2022 Spectroradiometric measurement of optical radiation sources

German Institute for Standardization

DIN EN ISO 15902:2020-05 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019); German version EN ISO 15902:2020
DIN EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2004); German version EN ISO 15902:2005
DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
DIN EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019)
DIN ISO 13320:2022 Particle size analysis - Laser diffraction methods (ISO 13320:2020)

Korean Agency for Technology and Standards (KATS)

KS B ISO 15902:2008 Optics and photonics-Diffractive optics-Vocabulary
KS B ISO 15902:2018 Optics and photonics — Diffractive optics — Vocabulary
KS B ISO 15902:2013 Optics and optical instruments ― DiffrN optics ― Vocabulary
KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods
KS A ISO 13320-2014(2019) Particle size analysis — Laser diffraction methods
KS A ISO 13320:2014 Particle size analysis — Laser diffraction methods

ES-UNE

UNE-EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019) (Endorsed by Asociación Española de Normalización in February of 2020.)

GSO

BH GSO ISO 15902:2016 Optics and photonics -- Diffractive optics -- Vocabulary
OS GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
OS GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
ISO/TS 5973:2024 Laser diffraction measurements — Good practice
DL/T 1151.22-2023 Analysis methods for scale and corrosion products in thermal power plants Part 22: Wavelength dispersive X-ray fluorescence spectrometry and X-ray diffraction

Danish Standards Foundation

DS/EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods

Association Francaise de Normalisation

NF EN ISO 15902:2020 Optique et photonique - Optique diffractive - Vocabulaire
NF S10-133*NF EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary
NF S10-133:2005 Optics and optical instruments - Diffractive optics - Vocabulary.

British Standards Institution (BSI)

BS EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
BS EN ISO 15902:2020 Optics and photonics. Diffractive optics. Vocabulary
BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 13320:2009 Particle size analysis - Laser diffraction methods
BS ISO 13320:2010 Particle size analysis. Laser diffraction methods
BS EN ISO/IEC 15408-4:2023 Information security, cybersecurity and privacy protection. Evaluation criteria for IT security - Framework for the specification of evaluation methods and activities
19/30333249 DC BS ISO 13320. Particle size analysis. Laser diffraction methods
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

European Committee for Standardization (CEN)

EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019)

International Organization for Standardization (ISO)

ISO 15902:2004 Optics and photonics - Diffractive optics - Vocabulary
ISO 15902:2019 Optics and photonics — Diffractive optics — Vocabulary
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO 13320:2020 Particle size analysis — Laser diffraction methods
ISO/CD TS 5973.2:2023 Good practice for laser diffraction measurements
ISO 13320:2009 Particle size analysis - Laser diffraction methods
ISO/CD TS 5973 Good practice for laser diffraction measurements
ISO 15902:2004/cor 1:2005 Optics and photonics - Diffractive optics - Vocabulary; Technical Corrigendum 1
ISO 20903:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results

CEN - European Committee for Standardization

EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary

KR-KS

KS B ISO 15902-2018 Optics and photonics — Diffractive optics — Vocabulary
KS B ISO 15902-2023 Optics and photonics — Diffractive optics — Vocabulary
KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods

Japanese Industrial Standards Committee (JISC)

JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
JIS Z 8825:2013 Particle size analysis.Laser diffraction methods

American National Standards Institute （ANSI)

ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment

AENOR

UNE-EN ISO 15902:2007 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2004)

GOSTR

GOST R 58565-2019 Optics and photonics. Diffractive optics. Terms and definitions

Lithuanian Standards Office

LST EN ISO 15902:2005 Optics and optical instruments - Diffractive optics - Vocabulary (ISO 15902:2004)