SEM pair
SEM pair, Total:16 items.
The international standard classification for "SEM pair" includes: Optical equipment , Physicochemical methods of analysis .
The Chinese standard classification for "SEM pair" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Crime judging technology .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18735-2002 General specification of nanometer thin STANDARD specimen for analytical transmission electron microscopy (AEM/EDS)
- GB/T 18735-2014 Microbeam analysis-General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope(AEM/EDS)
- GB 7667-1996 The dose of X-rays leakage from electron microscope
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms
American Society for Testing and Materials (ASTM)
- ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
International Electrotechnical Commission (IEC)
- ISO TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
- ISO TS 22292:2021 Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
British Standards Institution (BSI)
- 24/30497406 DC BS ISO 5490 Steel - Rating and classifying nonmetallic inclusions using the scanning electron microscope
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ANSI - American National Standards Institute
- Z80.1-2010 For Ophthalmics – Prescription Spectacle Lenses (VC)
Danish Standards Foundation
- DS/ISO/TS 22292:2021 Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
International Organization for Standardization (ISO)
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
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