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How to use the oscillator

How to use the oscillator, Total:305 items.

The international standard classification for "How to use the oscillator" includes: Piezoelectric and dielectric devices , Integrated circuits. Microelectronics , Environmental testing , Leather products , Construction equipment .

The Chinese standard classification for "How to use the oscillator" includes: Technical management , Technical management , Hybrid integrated circuit , Technical Management , Quartz crystal and piezoelectric element , Basic laboratory equipment , Medical laboratory equipment , Fur, leather and artificial leather products , Architectural engineering construction machinery , Electromagnetic Measurement .


Professional Standard - Electron

  • SJ 369-1973 Measurement of oscillation frequency of reflex klystrons
  • SJ 1719-1981 Measurement of oscillation frequency of power klystrons
  • SJ 2942-1988 Methods of measurement for level oscillators
  • SJ/T 10638-1995 Measurement methods for quartz crystal oscillators
  • SJ 2941-1988 General specification for level oscillators
  • SJ 1852-1981 Terms for quartz crystal controlled oscillators
  • SJ/T 10104-1991 Level oscillators for Type YX5071
  • SJ/Z 9155.2-1987 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • SJ/T 11457.2-2022 Waveguide Dielectric Resonators Part 2: Usage Guidelines for Oscillators and Filters
  • SJ 20803-2001 Microwave circuits Measuring methods for voltage controlled oscillator

Professional Standard - Post and Telecommunication

Taiwan Provincial Standard of the People's Republic of China

  • CNS 12253-1988 Quartz Crystal Units For Oscillators (For 1 MHz -- 125 MHz)
  • CNS 12254-1988 Quartz Crystal Units for Oscillators (for 200-1000 kHz)

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 32710.13-2016 Safety requirements for environmental testing and conditioning equipment-Part 13:Shakers,shaking water baths and shaking incubators
  • GB 12274-1990 Quartz orystal controlled oscillators-Generic specification
  • GB/T 12275-1990 The rule of type designation for quarz crystal oscillators
  • GB/T 35011-2018 Microwave circuits—Measuring methods for voltage controlled oscillater
  • GB 12275-1990 Quartz Crystal Oscillator Model Nomenclature

Professional Standard - Nuclear Industry

Military Standard of the People's Republic of China-General Armament Department

  • GJB/Z 45.2-1993 Military piezoelectric device series spectrum crystal oscillator
  • GJB 1648-1993 General specifications for crystal oscillators
  • GJB 3480A-2021 Low-speed wind tunnel test method for aircraft model rotation and oscillation motion
  • GJB 3480-1998 Low-speed wind tunnel test method for aircraft model rotation and oscillation motion
  • GJB 3515-1999 General specification for surface acoustic wave oscillators
  • GJB 1648-2-2011 Genenral specification for crystal oscillators
  • GJB 1648A-2011 Genenral specification for crystal oscillators
  • GJB 3160-1998 General specifications for gyromagnetic oscillators

Professional Standard - Medicine

Professional Standard - Light Industry

Professional Standard - Construction Industry

Professional Standard - Machinery

Group Standards of the People's Republic of China

National Metrological Verification Regulations of the People's Republic of China

National Metrological Technical Specifications of the People's Republic of China

Professional Standard - Energy and Power Planning

  • DL/T 1576-2016 6 kV ~ 35 kV Test Method of Partial Discharge of Cable Oscillation Wave

International Electrotechnical Commission (IEC)

  • IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
  • IEC 60122-2:1962 Quartz crystal units for oscillators - Part 2: Guide to the use of quartz oscillator crystals
  • IEC 60122-2:1962/AMD1:1969 Amendment 1 - Quartz crystal units for oscillators - Part 2: Guide to the use of quartz oscillator crystals
  • IEC 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
  • IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
  • IEC 62860-1:2013*IEEE Std 1620.1:2006 IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
  • IEC 62860-1:2013(E) IEEE Std. 1620.1-2006 IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
  • IEC 62860-1:2013 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • IEC 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

German Institute for Standardization

  • DIN 4235-1:1978 Compacting of Concrete by Vibrating; Vibrators and Vibration Mechanics
  • DIN IEC 679-2:1997 Quartz crystal controlled oscillators; Part 2; Guide to the use of quartz crystal controlled oscillators
  • DIN IEC 60679-2:1997 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
  • DIN 4235-5:1978 Compacting of Concrete by Vibrating; Compacting by Surface Vibrators
  • DIN IEC 60679-2:1997-09 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
  • DIN 4235-4:1978 Compacting of Concrete by Vibrating; Compacting of In-situ by Formwork Vibrators
  • DIN EN 60679-6 E:2009-01 Draft Document - Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide (IEC 49/811/CDV:2008); German version FprEN 60679-6:2008
  • DIN EN 60679-6 E:2009 Draft Document - Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide (IEC 49/811/CDV:2008); German version FprEN 60679-6:2008
  • DIN EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011); German version EN 60679-6:2011
  • DIN 4235-3:1978 Compacting of Concrete by Vibrating; Compacting by External Vibrators during the Manufacture of Precast Components
  • DIN EN 60679-6:2011-12 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011); German version EN 60679-6:2011
  • DIN IEC 122-2-1:1992 Schmitt Oscillators for Frequency Stabilization and Selection Part 2: Schmitt Oscillator Application Guide Part 1: Schmitt Oscillators for Microprocessor Clock Supply
  • DIN 4235-2:1978 Compacting of Concrete by Vibrating; Compacting by Internal Vibrators
  • DIN IEC 642:1988 Piezoelectric ceramic oscillators and oscillator components for frequency control and selection standard values and conditions
  • DIN EN 61338-2:2005-02 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004
  • DIN EN 61338-2:2005 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004
  • DIN EN ISO 1797:2017-09 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017); German version EN ISO 1797:2017

Korean Agency for Technology and Standards (KATS)

  • KS C IEC 60679-2-2023 Quartz Crystal Oscillator Part 2: A Guide to Using a Quartz Crystal Oscillator
  • KS C IEC 60679-2:2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-6-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60679-6-2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60679-6-2023 Qualified Quartz Crystal Oscillators Part 6: Application Guidelines for Phase Jitter Measurement Methods for Quartz Crystal Oscillators and Surface Acoustic Wave Oscillators
  • KS C IEC 60679-6:2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60122-2-1-2021 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section one: Quartz crystal units for microprocessor clock supply
  • KS C 6508-2013 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS C 6508-1990 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS M ISO 8780-2-2022 Pigments and extenders — Methods of dispersion for assessment of dispersion characteristics — Part 2: Dispersion using an oscillatory shaking machine
  • KS M ISO 8780-2:2022 Pigments and extenders — Methods of dispersion for assessment of dispersion characteristics — Part 2: Dispersion using an oscillatory shaking machine
  • KS C 6503-1999 Quartz crystal units for oscillators
  • KS C 6503-1984 Quartz crystal units for oscillators
  • KS M 6687-2021 Test method for rubber compound-vulcanizing characteristics using oscillating disk cure meter
  • KS C IEC 62860-1:2018 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • KS C IEC 62860-1-2018 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • KS C 6503-1999(2009) QUARTZ CRYSTAL UNITS FOR OSCILLATORS
  • KS C 6509-1991(2011) General Rules of Quartz Crystal Controlled Oscillators
  • KS C 6508-1990(2010) Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS C IEC 62860-1-2023 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • KS C 6509-1991 General Rules of Quartz Crystal Controlled Oscillators
  • KS C IEC 62860-1-2018(2023) Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • KS C IEC 61338-2-2023 Waveguide Dielectric Resonators Part 2: Oscillator and Filter Application Guide
  • KS C IEC 61338-2-2018 Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications
  • KS C IEC 61338-2:2018 Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications
  • KS C 6504-1987 Ovens for Quartz Crystal Units
  • KS C IEC 61338-2-2018(2023) Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications

British Standards Institution (BSI)

  • BS 2271-3:1965 Specification for quartz oscillator crystal units-Guide to the use of quartz oscillator crystals
  • BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
  • PAS 60679-6-2008 Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide (Edition 1.0)
  • BS DD IEC/PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality-Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
  • 08/30191168 DC BS EN 60679-6. Quartz crystal controlled oscillators of assessed quality. Part 6. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
  • 24/30493194 DC BS EN IEC 60679-2 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 2: Guide to the use of quartz crystal oscillators
  • BS 3483-B5:1974 Methods for testing pigments for paints-Comparison of ease of dispersion (oscillatory shaking method)
  • BS 9620:1975 Specification for quartz crystal oscillators of assessed quality: generic data and methods of test
  • BS EN ISO 8780-2:1995 Pigments and extenders. Methods of dispersion for assessment of dispersion characteristics. Dispersion using an oscillatory shaking machine
  • BS EN ISO 15212-2:2002 Oscillation-type density meters — Part 2: Process instruments for homogenous liquids
  • BS IEC 62860-1:2013 Test methods for the characterization of organic transistor-based ring oscillators
  • BS 2271-1:1964 Specification for quartz oscillator crystal units-General requirements and methods of test
  • BS EN 61338-2:2004 Waveguide type dielectric resonators - Guidelines for oscillator and filter applications

GCC Standardization Organization

  • GSO ISO 8780-2:2014 Pigments and extenders -- Methods of dispersion for assessment of dispersion characteristics -- Part 2: Dispersion using an oscillatory shaking machine
  • GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • GSO ISO 12185:2013 Crude petroleum and petroleum products – Determination of density - Oscillating U-tube method
  • GSO IEC 60679-2:2014 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • GSO ISO 3417:2015 Rubber -- Measurement of vulcanization characteristics with the oscillating disc curemeter
  • GSO IEC 61338-2:2014 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

Japanese Industrial Standards Committee (JISC)

The Directorate General of Specifications and Metrology (DGSM)

  • OS GSO IEC 60679-2:2014 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • OS GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • OS GSO IEC 61338-2:2014 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

Association Francaise de Normalisation

  • NF EN 60679-6:2011 Quality assured crystal driven oscillators - Part 6: Phase jitter measurement method for crystal oscillators and SAW oscillators - Application guidelines
  • NF C93-620-6*NF EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • NF C96-627-2*NF EN 61338-2:2004 Waveguide type dielectric resonators - Part 2 : guidelines for oscillator and filter applications

Kingdom of Bahrain Testing and Metrology Directorate

  • BH GSO IEC 60679-2:2016 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • BH GSO IEC 60679-6:2016 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • BH GSO IEC 61338-2:2016 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

Danish Standards Foundation

  • DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • DANSK DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • DS/EN 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
  • DANSK DS/EN 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

Comitato Elettrotecnico Italiano

  • CEI EN 60679-6:2015 Quartz crystal controlled oscillators of assessed quality Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • CEI EN 61338-2:2006 Waveguide type dielectric resonators Part 2: Guidelines for oscillator and filter applications

European Committee for Electrotechnical Standardization(CENELEC)

  • EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

Lithuanian Standards Office

  • LST EN 60679-6-2011 Quartz crystal controlled oscillators of assessed quality -- Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011)
  • LST EN 169000+A1-2001 Generic Specification: Quartz crystal controlled oscillators

U.S. Military Regulations and Norms

International Organization for Standardization (ISO)

  • ISO 787-20:1975 General methods of test for pigments — Part 20: Comparison of ease of dispersion (Oscillatory shaking method)

Gosstandart of Russia

  • GOST R 71736-2024 Quartz resonators. Methods of measuring temperature-frequency characteristics
  • GOST 16863-1971 Measuring generators for frequency range 0,1-35 MHz. Methods and means of verification
  • GOST 22866-1977 Crystal oscillators. Terms and definitions
  • GOST 19438.19-1978 Low-power electronic tubes. Measurement of microphone effect by method of shock excitation
  • GOST 12152-1966 Frequency characteristics meters and generators of fluctuating freqnency. Control methods

Standard Association of Australia (SAA)

  • AS 1683.22:1983 Methods of test for rubber, Method 22: Rubber - Determination of vulcanization characteristics using the oscillating disc curemeter

Military Standards (MIL-STD)

  • MIL MIL-PRF-55310/20F-2012 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 40.0 KHz through 60.0 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/15G-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.01 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/21F-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/16K-2017 Oscillator, Crystal Controlled, TYPE 1 (Crystal Oscillator (XO)), 0.1 HZ Through 80 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/8J-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 50 Hz Through 50 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/18F-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.01 Hz Through 15.0 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/19E-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 60.0 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/13H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 300 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/9J-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 400 kHz Through 60 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/16J-2008 Oscillator, Crystal Controlled, TYPE 1 (Crystal Oscillator (XO)), 0.1 HZ Through 80 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/12H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.05 MHz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/13J-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 300 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/11G-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.05 MHz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/28D-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/21G-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/29C-2011 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.2 MHz Through 85 MHz, Hermetic Seal, Square Wave, HCMOS
  • MIL MIL-PRF-55310/26D-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 10kHz Through 65 MHz, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/21H-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/10J-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 kHz Through 60 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-O-52374E-2013 Oscillator: High Voltage General Specification for
  • MIL MIL-PRF-55310/14H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.1 Hz Through 25 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/28C-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-O-14850-1969 OSCILLATOR, HIGH VOLTAGE, 10549785
  • MIL MIL-PRF-55310/31A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.75 MHz Through 200 MHz, Hermetic Seal, Square Wave, Advanced CMOS
  • MIL MIL-PRF-55310/32C-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.544 MHz through 125 MHz, Hermetic Seal, Square Wave, Advanced CMOS
  • MIL MIL-PRF-55310/27E-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz through 85 MHz, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/27C-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ through 85 MHZ, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/17F-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), Gated, 250 kHz Through 50 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/32B-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.544 MHz through 125 MHz, Hermetic Seal, Square Wave, Advanced CMOS
  • MIL MIL-PRF-55310/31-2006 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHZ THROUGH 200 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
  • DOD A-A-50891 A-1993 VIBRATOR, DENTAL MOLDING
  • MIL MIL-PRF-55310/27D-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz through 85 MHz, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/32-2006 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.544 MHZ THROUGH 125 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
  • MIL MIL-PRF-55310/33D-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/34-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHZ THROUGH 150 MHZ, HERMETIC SEAL, CMOS
  • MIL MIL-PRF-55310/33-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHZ THROUGH 85 MHZ, HERMETIC SEAL, CMOS
  • MIL MIL-PRF-55310/29B-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.2 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, HCMOS (SUPERSEDING MIL-PRF-55310/29A)
  • MIL MIL-PRF-55310/19D-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 60.0 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/19C)
  • MIL MIL-PRF-55310/13G-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 300 HZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS (SUPERSEDING MIL-PRF-55310/13F)
  • MIL MIL-PRF-55310/16H-2003 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.1 HZ THROUGH 80 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/16G)
  • MIL MIL-PRF-55310/10H-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 KHZ THROUGH 60 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/10G)
  • MIL MIL-PRF-55310/21E-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 60.0 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/21D)
  • MIL MIL-PRF-55310/33B-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHZ THROUGH 85 MHZ, HERMETIC SEAL, CMOS
  • MIL MIL-PRF-55310F-2018 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
  • MIL MIL-PRF-55310/11F-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.05 MHZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS (SUPERSEDING MIL-PRF-55310/11E)
  • MIL MIL-PRF-55310/37C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/28B-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/28A)
  • MIL MIL-PRF-55310/18E-2004 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 HZ THROUGH 15.0 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS (SUPERSEDING MIL-PRF-55310/18D)
  • MIL MIL-PRF-55310/33C-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/15F-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 HZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS (SUPERSEDING MIL-PRF-55310/15E)
  • MIL MIL-PRF-55310/14G-2004 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.1 HZ THROUGH 25 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/14F)
  • MIL MIL-PRF-55310/25D-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 25 MHZ Through 175 MHZ, Hermetic Seal, Square Wave, Emitter Coupled Logic
  • MIL MIL-PRF-55310/9H-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 400 KHZ THROUGH 60 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/9G)
  • MIL MIL-PRF-55310/12G-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.05 MHZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS (SUPERSEDING MIL-PRF-55310/12F)
  • MIL MIL-PRF-55310/30E-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/38B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/38-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHZ THROUGH 150 MHZ, HERMETIC SEAL, LOW VOLTAGE CMOS
  • MIL MIL-PRF-55310/38A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/41-2018 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 125 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
  • MIL MIL-PRF-55310/34D-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/30D-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/17E-2004 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), GATED, 250 KHZ THROUGH 50 MHZ, HERMETIC SEAL, SQUARE WAVE TTL (SUPERSEDING MIL-PRF-55310/17D)
  • MIL MIL-PRF-55310/8H-2004 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 50 HZ THROUGH 50 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/8G)
  • MIL MIL-PRF-55310/34B-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/36A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/38C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/39-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHZ THROUGH 133 MHZ, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
  • MIL MIL-PRF-55310/35A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/30C-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHZ through 100 MHZ, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/34C-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/27B-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, HIGH SPEED CMOS (SUPERSEDING MIL-PRF-55310/27A)
  • MIL MIL-PRF-55310/20E-2005 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 40.0 KHZ THROUGH 60.0 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/20D)
  • MIL MIL-PRF-55310/40C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/26C-2004 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 10 KHZ THROUGH 65 MHZ, HERMETIC SEAL, SQUARE WAVE, HIGH SPEED CMOS(SUPERSEDING MIL-PRF-55310/26B)
  • MIL MIL-PRF-55310/35-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHZ THROUGH 133 MHZ, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
  • MIL MIL-PRF-55310/36B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/39A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/36C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/35C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/39B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/40A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/40B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/36-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHZ THROUGH 100 MHZ, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
  • MIL MIL-PRF-55310/39C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/35B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/28-1998 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (S/S BY MIL-PRF-55310/28A)
  • MIL MIL-PRF-55310/40-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 MHZ THROUGH 100 MHZ, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
  • MIL MIL-PRF-55310/29-1998 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)) 0.2 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, HCMOS (S/S BY MIL-PRF-55310/29A)
  • MIL MIL-O-52374D-2006 OSCILLATOR: HIGH VOLTAGE GENERAL SPECIFICATION FOR(SUPERSEDING MIL-O-52374C)

Ente Nazionale Italiano di Unificazione

Defense Logistics Agency

Bureau of Indian Standards

  • IS 6134 Pt.2-1973 Measurement methods for microwave tubes Part Ⅱ Oscillator tubes
  • IS 2916-7-1975 Quartz crystal units used in oscillators: Part 7 Type AA-06
  • IS 2916-5-1972 Quartz crystal units used in oscillators: Part 5 Type AA-04
  • IS 2916-10-1977 Quartz crystal units used in oscillators: Part 10 Type AA-09
  • IS 6134-2-1973 Methods of measurement of electrical characteristics of microwave tubes: Part 2 Oscillator tubes
  • IS 2916-9-1976 Quartz crystal units used in oscillators: Part 9 Type AA-08
  • IS 2916-3-1972 Quartz crystal units used in oscillators: Part 3 Type AA-02
  • IS 2916-8-1976 Quartz crystal units used in oscillators: Part 8 Type AA-07
  • IS 2916-4-1972 Quartz crystal units used in oscillators: Part 4 Type AA-03
  • IS 2916-6-1972 Quartz crystal units used in oscillators: Part 6 Type AA-05
  • IS 2916-2-1972 Quartz crystal units used in oscillators: Part 2 Type AA-01
  • IS 2916 Pt.8-1976 Specification for quartz crystal units used in oscillators Part VIII Type AA-07
  • IS 2916 Pt.9-1976 Specification for quartz crystal devices used in oscillators Part IX Type AA-08
  • IS 2916 Pt.10-1977 Specification for quartz crystal units used in oscillators Part X Type AA-09

American Society for Testing and Materials (ASTM)

  • ASTM F735-17 Standard Test Method for Abrasion Resistance of Transparent Plastics and Coatings Using the Oscillating Sand Method
  • ASTM F735-94(2001) Standard Test Method for Abrasion Resistance of Transparent Plastics and Coatings Using the Oscillating Sand Method
  • ASTM F735-94 Standard Test Method for Abrasion Resistance of Transparent Plastics and Coatings Using the Oscillating Sand Method
  • ASTM D7271-06(2020) Standard Test Method for Viscoelastic Properties of Paste Ink Vehicle Using an Oscillatory Rheometer
  • ASTM D7271-06 Standard Test Method for Viscoelastic Properties of Paste Ink Vehicle Using an Oscillatory Rheometer
  • ASTM RR-D02-1616 2007 D5706-Test Method for Determining Extreme Pressure Properties of Lubricating Greases Using a High-Frequency, Linear-Oscillation (SRV) Test Machine
  • ASTM RR-D02-1410 1997 D5706-Test Method for Determining Extreme Pressure Properties of Lubricating Greases Using a High-Frequency, Linear-Oscillation (SRV) Test Machine
  • ASTM RR-D02-1565 2004 D5706-Test Method for Determining Extreme Pressure Properties of Lubricating Greases Using a High-Frequency, Linear-Oscillation (SRV) Test Machine
  • ASTM D5706-16 Standard Test Method for Determining Extreme Pressure Properties of Lubricating Greases Using A High-Frequency, Linear-Oscillation (SRV) Test Machine
  • ASTM D7421-16 Standard Test Method for Determining Extreme Pressure Properties of Lubricating Oils Using High-Frequency, Linear-Oscillation (SRV) Test Machine
  • ASTM D7271-06(2012) Standard Test Method for Viscoelastic Properties of Paste Ink Vehicle Using an Oscillatory Rheometer
  • ASTM D7421-19 Standard Test Method for Determining Extreme Pressure Properties of Lubricating Oils Using High-Frequency, Linear-Oscillation (SRV) Test Machine
  • ASTM D3987-06 Standard Test Method for Shake Extraction of Solid Waste with Water
  • ASTM D5706-05 Standard Test Method for Determining Extreme Pressure Properties of Lubricating Greases Using A High-Frequency, Linear-Oscillation (SRV) Test Machine

Swedish Institute for Standards

Society of Automotive Engineers (SAE)

  • SAE ARP1278 Oscilloscopic Method of Measuring Spark Energy

Türk Standardları Enstitüsü

United States Navy

Institute of Electrical and Electronics Engineers (IEEE)

  • IEEE/IEC 62860-1-2013 IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators

Association of German Mechanical Engineers

  • VDI 2727 Blatt 4-1998 Catalogues for machine design - Mechanisms for motion transfer - Converting unidirectional rotation into oscillating motion

American National Standards Institute (ANSI)

Spanish Association for Standardization (UNE)

  • UNE 53629:1989 RUBBER. MEASUREMENT OF VULCANIZATION CHARACTERISTICS WITH THE OSCILLATING DISC CUREMETER
  • UNE-EN 61338-2:2004 Waveguide type dielectric resonators -- Part 2: Guidelines for oscillator and filter applications (Endorsed by AENOR in November of 2004.)
  • UNE-EN ISO 8780-2:1996 PIGMENTS AND EXTENDERS. METHODS OF DISPERSION FOR ASSESSMENT OF DISPERSION CHARACTERISTICS. PART 2: DISPERSION USING A OSCILLATORY SHAKING MACHINE. (ISO 8780-2:1990).

American Water Works Association (AWWA)